Test

EBIRST 50-pin D-type Coaxial Adapter - 23 SMBs

93-005-202A - Pickering Interfaces Ltd.

The 93-005-202A 50-pin D-type to 23xSMB Coaxial Adapter is part of our range of eBIRST USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.

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High-Density PXI Large Matrix Modules up to 1 Amp

BRIC - Pickering Interfaces Ltd.

Pickering's high-density PXI large matrix BRICs offer current handling up to 1 Amp and select models are supported by our Diagnostic Test Tools, Built-In-Relay-Self-Test (BIRST) and eBIRST Switching System Test Tools, these tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.

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Vibration/Shock Testing

Quest Engineering Solutions

Quest Engineering Solutions provides a broad range of vibration testing and shock testing services. We have a variety of vibration test systems of different sizes and broad test capabilities. Vibration and shock testing and vibration analysis are important to achieving product quality. Our experience can help you choose the tests which will optimize your product's design and reliability.

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LED Tester For Chip And Wafer

WeiMin Industrial Co., Ltd.

Electrical Testing: Forward：VF,DVF,VFDReverse：VZ,IROptical Testing: can test LOP in cd/mcd/W/mW/lm... from different optical componentsWavelength λp,λd,λc,hw,purity,(x,y),CCT,CRIFour-wire measurement and contact resistance in case of deviation.Auto polarity identification and preheat function.Compatible mechanical interface.Optional ESD static test system or polycrystalline test system

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CMT - Tester

UNITES Systems a.s.

VPC G12 interface - interchangeable fixturesQuick exchange of test applicationMinimum of equipment in the fixture - fixture only as contacting interfaceManual fixtures ATXFixture identification - automatic test program loadingConnection to external meas. instrumentsControled by SCADUS / LabViewSelftest of internal cards and connected instrumentsCentral test program, configuration and datalog files location possibility (server)Uninterruptible power supply for PC

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High-Density PXI Large Matrix Modules up to 1 Amp - BRIC

Pickering Interfaces Ltd.

Pickering's high-density PXI large matrix BRICs offer current handling up to 1 Amp and select models are supported by our Diagnostic Test Tools, Built-In-Relay-Self-Test (BIRST) and eBIRST Switching System Test Tools, these tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.

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Climatic Testing

Environment Associates Inc.

Environmental Test Chamber. Environment Associates' complete Climatic test facilities offer precise simulation of Temperature, Humidity, Altitude, Thermal Vacuum, Salt Fog, Sand and Dust, and Rain as well as many other specialized environments. Microprocessor Control along with calibrated recorded measurements and outstanding attention to detail by our technical staff make for a perfect test everytime.

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Fatigue Testing And Certification

Hill Engineering, LLC

Fatigue engineering is subject to uncertainty, and data from well executed tests are used to validate conclusions made by analysis and to provide a basis for structural certification. Our staff have extensive experience in testing materials and components under slowly varying, static loads, and under rapidly varying cyclic loads. Tests under static loads are used to assess material properties or to assess the load-deformation behavior of structural components. Tests under cyclic loads provide time to crack initiation, time to failure, or measurements of crack growth over time. We have extensive experience in measuring fatigue crack growth behavior in metallic materials. Past programs have measured crack growth with microscopy and photogrammetry at the surface, cracked area with direct current potential drop, and through-thickness crack profiles with quantitative fractography. By assessing crack growth with a variety of experimental methods, we enable robust analysis validation for cases of complex cracking. Our capabilities in fatigue engineering allow for careful design of a fatigue test program. Whether the tests use constant amplitude loading or an irregular loading spectrum, we specialize in engineering the test that meet your needs. Much of our experience is in non-standard test programs, which require engineering to optimize the test setup. Few others match our capability and experience in fatigue test engineering.

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Centor First, digital gauge

CNR FT - Com-Ten Industries

The force gauge Centor First is a simple and yet complete digital force gauge which uses efficient technology to simplify force measurements, in tension and compression. A big display shows the force measured in tension or compression in the unit selected by the operator: newtons, kilograms or pounds. The bar graph completes the measurement. It can be used on a test stand (manual or motorized) or as a manual force gauge.

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CompactFlash Card Interface Board

CF extend 180CIB - Sycard Technology

For those applications that require access to a CompactFlash™ card that can't use a standard extender card, Sycard provides the CF extend 180CIB (Card Interface Board) which allows full access to all 50-signal and power pins on the CompactFlash™ peripheral. Standard 0.1" headers allow the user to connect standard 26-pin ribbon cables to test or prototype hardware.

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Competitive Analysis

National Technical Systems

As a manufacturer of computer hardware and/or software, its import to know how well you stack up to your competitors. That’s going to be the first question that your customer are going to want to know about your product – Is it easier to use? Is it faster? Is it better? Do you know? NTS can develop a detailed competitive analysis test plan to help you find out.

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Decade Capacitance Box

1412-BC - IET Labs

The wide capacitance range and high resolution of the GenRad 1412-BC decade capacitance box make it exceptionally useful in both laboratory and test shop. Owing to its fine adjustment of capacitance, it is a convenient variable capacitor to use with an Impedance Comparator. The polystyrene dielectric used in the decade steps is necessary for applications requiring low dielectric absorption and constancy of both capacitance and dissipation factor with frequency.

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Digital I/O Adapter Module For FlexRIO

NI

Digital I/O Adapter Modules for FlexRIO offer up to 54 channels of configurable digital I/O that can interface with single‐ended, differential, and serial signals at a variety of voltage levels. When combined with a large, user‐programmable FPGA, you can use these modules to solve a variety of challenges, from high‐speed communication with a device under test to emulating custom protocols in real time.

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Digital Multimeter

KU-2600 - Kaise Corporation

4000 count LCD 2 times / secAuto / Manual Ranging1.5V R6P or AA Batteries (x2)CATⅡ600V, CATⅢ 300V compliant155(H) x 75(W) x 29(D) mm,Approx. 180gHolster, 100-50 Test Leads, 1.5V R6P Batteries (x2 & spare),Spare Fuses F14 (0.5A/250V) (x1), Spare Fuses F17 (10A/250V) (x1),

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Digital Multimeters

Fluke Corporation

Fluke Digital Multimeters (DMM's) are on more tool belts, finding more problems, than any other comparable test tools. Each design is tested to the extreme: drop, shock, humidity, you name it. Every Fluke Digital Multimeter gives you what you need: accurate measurements; consistent, reliable performance; attention to safety; and the strongest warranty available.

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EBIRST 50-pin D-type Coaxial Adapter - 23 SMBs

High-Density PXI Large Matrix Modules up to 1 Amp

Vibration/Shock Testing

LED Tester For Chip And Wafer

CMT - Tester

High-Density PXI Large Matrix Modules up to 1 Amp - BRIC

Climatic Testing

Fatigue Testing And Certification

Centor First, digital gauge

CompactFlash Card Interface Board

Competitive Analysis

Decade Capacitance Box

Digital I/O Adapter Module For FlexRIO

Digital Multimeter

Digital Multimeters