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Showing results: 9106 - 9120 of 14433 items found.

  • PXIe-2748, 3 GHz, 16x1 PXI RF Multiplexer Switch Module

    780587-48 - NI

    PXIe, 3 GHz, 16x1 PXI RF Multiplexer Switch Module—The PXIe‑2748 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 3 GHz in production test applications. The high channel count of the PXIe‑2748 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.

  • PXIe-2746, 2.7 GHz, Quad 4x1 PXI RF Multiplexer Switch Module

    780587-46 - NI

    PXIe, 2.7 GHz, Quad 4x1 PXI RF Multiplexer Switch Module—The PXIe‑2746 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 2.7 GHz in production test applications. The high channel count of the PXIe‑2746 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.

  • PXIe-2747, 2.7 GHz, Dual 8x1 PXI RF Multiplexer Switch Module

    780587-47 - NI

    PXIe, 2.7 GHz, Dual 8x1 PXI RF Multiplexer Switch Module—The PXIe‑2747 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 2.7 GHz in production test applications. The high channel count of the PXIe‑2747 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.

  • Digital ELCB Testers

    6221 EL-M - Standard Electric Works Co., Ltd

    ● High contrast OLED display.● Designed for viewing in the dark, for mining industry.● Microprocessor-controlled.● Indicates phase rotation● Indicates phase presence● TEST for disconnection sensitivity● Battery status indicator● Measures Voltage Phase to Earth● Select one of 3 Phase to test ELCB.● Color-coded test leads.● Phase presence indication from as low as 100Vac.● Fused earth leakage tester.● ELCB works 50Vac to 330Vac 50Hz / 60Hz.● Phase rotation and presence does not require battery to indicate.

  • Dynamic Electric Motor Analyzers

    Megger Group Ltd.

    Baker's dynamic motor test and monitoring instruments are built to conduct condition monitoring tests of motors and generators from a Motor Control Centre (MCC), or through a Baker EP1000 connection unit. The Baker EXP4000 dynamic motor analyser is a low-voltage, AC- and battery-operated instrument that test motors and generators while they are in operation. The EXP4000 provides health and performance data on the motor, the motor's load, and incoming power to assess motor performance and suitability in context of the entire machine system it supports.

  • ATE System Power Supplies

    Keysight Technologies

    For more than 50 years, Keysight's automated test equipment (ATE) power supplies have changed the way engineers prove their designs, understand issues, and ensure product quality. Our programmable ATE system power supplies' compact design makes it easy to integrate them into any system. Keysight power supplies make it easy to update a test program with modern interfaces, LXI-core capability, and SCPI language. Accelerate test time with fast command processing and quick settling times.

  • ATE

    QT 200 NXG - Qmax Test Technologies Pvt. Ltd.

    QT 200 Nxg a Highly sophisticated ATE, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software.

  • Turns Ratio Testers

    TRT Advanced Series - IBEKO Power AB

    TRT Advanced series is the newest DV Power solution for transformer turns ratio measurement. Besides its main application, each turns ratio tester from this series also measures transformer excitation current and phase shift. Furthermore, all models perform automatic vector group detection and magnetic balance on three-phase transformers and three-phase autotransformers. They have a built-in true three-phase power source. For that reason, they can test transformers with special configurations, such as phase-shifting, rectifier, arc-furnace, traction transformers, etc.The instruments can output test voltages from 1 V AC to 500 V AC, depending on the model. With the highest test voltage 500 V AC, TRT500 provides the most accurate turns ratio testing of power transformers used in power generation and transmission. The output test voltage of TRT500 can be boosted to 5 kV AC using the external CVT20 extension transformer. This application is specially designed for testing turns ratio of capacitive voltage transformers. The other three models, TRT400, TRT250, and TRT100 can output up to 400 V, 250 V, and 170 V respectively. The low test voltage of 1 V AC enables turns ratio verification of current transformers.TRT500 is equipped with a large 10.1” graphical touch screen display. Other models, (TRT400, TRT250, TRT100) have 7” graphical touch screen display. Besides making the interface much more user-friendly compared to older turns ratio testers, it also brings certain options that were previously available only with DV-Win software. The most important are test templates and automatic test mode. Users can simply create test templates, store them in the instrument’s memory, and load when in the field with just a few clicks.This turns ratio test set, as well as all other DV Power turns ratio testers, has a built-in tap changer control unit. It enables remote control of an on-load tap changer (OLTC) directly from the instrument. In order to make the most out of this feature, the instrument can be programmed to do everything automatically – running turns ratio tests, changing OLTC tap positions, and saving results. This option, especially in combination with test templates, significantly facilitates and shortens the turns ratio testing time. Automatic test mode minimizes human errors, which makes the measurement more reliable.

  • USAF Targets

    Applied Image, Inc.

    These targets conform to MIL-STD-150A. Frequencies change by the 6th root of 2. This target is also available in custom sizes and contrasts. This test target meets requirements as specified in MIL-STD-150A for resolving power tests. The target consists of a series of Elements having two sets of lines at right angles. Each set of lines consists of three lines separated by spaces equal to the line width. Each bar has a length to width ratio of 5:1. (Line width is equal to one half of line pitch, which is the inverse of line frequency.) Elements are arranged in groups of six each and Groups are arranged in pairs. Even numbered Groups occupy the left side and bottom right corner and contain a square feature having and edge length equal to the line length of Element 2 in that group. Odd numbered Groups occupy the top right corner and side. Groups and Elements are labeled and differentiated by numbering adjacent to their features. Frequencies in cycles/mm (c/mm) increase between each Element by the sixth root of two (approximately 12.25% per step). The general formula for the line frequency of any target Element can be expressed as 2Group+(Element-1)/6.

  • Leakage Current Tester

    TOS3200 - Kikusui Electronics Corp.

    The Leakage Current Tester TOS3200 is designed to perform leakage current (touch current and protective conductor current) tests on general electrical equipment but not medical electrical equipment.It enables you to conduct tests that conform to the requirements of the applicable IEC, UL, JIS, and other standards, as well as the Electrical Appliance and Material Safety Law. The memory in the main unit stores the 51 types of test conditions laid down in the IEC/JIS standards for information technology equipment, household electrical appliances, audio, video electronic apparatus, luminaires, motor-operated electric tools, and electrical equipment for measurement and control and in the Electrical Appliance and Material Safety Law, thereby enabling you to conduct standard tests with simple panel operation.

  • Electromagnetic Resonance High Frequency Fatigue Testing Machine

    PLG Series - Jinan Testing Equipment IE Corporation

    The series of electromagnetic resonance fatigue testing machines are used for fatigue tests of metal materials and components under tension, compression or reversal loads. If relevant grips are provided, three-point bending test, four-point and circle test, gear wheat, bolt, connecting rod, roller chain, crackle expanding test can be available. The series of electromagnetic resonance fatigue testing machines feature an optimized design and a rational structure. The automatic controlled system adopts an advanced and wide-pulse-control system and a new-type of power amplifier to improve the reliability of the electric system. The electromagnetic resonance fatigue testing system is with high efficiency, easy and non-stop shake, low energy consuming, accurate control, and small fluctuation.

  • RSE Wireless EMC Spurious Emission

    TS8996 - Rohde & Schwarz GmbH & Co. KG

    The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope

    780319-02 - NI

    1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope

    780319-03 - NI

    1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope

    780319-01 - NI

    1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

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