Showing results: 271 - 285 of 8487 items found.
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DRIVETORK ST -
Com-Ten Industries
Besides having all the functions of the Drivetork Easy, the Star version can also carry out the rupture test when the cap has a security ring. It measures both the break (first peak) and the opening torque (max torque), and it displays the test curve.
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Shanghai Linpin Instrument
Single-wing Drop Test Machine Simulate the drop conditions of packaged products when different faces, edges and corners fall to the ground from different heights, thus to understand the damage of the product and evaluate the drop height and impact resistance that the packaging materials can endure while falling down, so as to improve and optimize package design according to actual conditions of the product and national standard range.
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Labtone Test Equipment Co., LTD
Packaging drop test is used to determine the effect of impact on the package during use, transportation, loading and unloading. Thestrictly designed LABTONE "1G+” ensures its accuracy. Apart from accurate plane fall test, it can also perform edge frop and corner drop test to make a complete evaluation on the performance of packaging and product.
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CT Viewer™ -
MOHR Test and Measurement llc
CT Viewer™ is a full-featured TDR waveform analysis software package for Microsoft® Windows® XP / Vista PCs that lets you archive, manipulate, analyze, and compare TDR data acquired with CT100 Series Automated Metallic TDRs or any other TDR instrument, now with live internet streaming and remote control of CT100 Series TDRs. CT Viewer™ is included with CT100 Series TDRs. Read on to discover how CT Viewer™ will change the way you test cables.
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DSE Test Solutions A/S
DSE Test Solutions your gateway to a world of wire technology.We supply high-quality test equipment for the wire and cable industry. Our extensive range of intelligent test equipment is used for quality control and production optimisation of enamelled wire and cable.
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EXFO Inc.
Preconfigure bit-error-rate thresholds prior to running the test, and get a simple pass/fail verdict at the end of the test — leaving no room for misinterpreted test results.
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LS-45-DB -
Lumistar Inc.
The Lumistar LS-45-DB Dual Channel Bit Synchronizer Daughterboard provides optimal reconstruction of a serial PCM data stream that has been corrupted by noise, phase jitter, amplitude modulation, or base line variations. The all-digitaldesign assures a high performance, consistent product, with excellent reliability and long-term stability. Dual channel design can feed each channel of the LS-55-DD dual decom. The LS-45-DB also has a post D combiner that allows for optimal ratiocombining of the two input signals A unique Built-in-Test feature allows performance verification for the Bit Synchronizer to ensure the highest level of operation. Auto-test BIT is performed for a short duration on the application of power and tests more than 90% of the Bit Synchronizer components. This test verifies that power is properly applied, verifies that there are no internal bit errors, and performs other tests to ensure that the bit synchronizer is fully operational with status indication of results. Command-test BIT performs the same functions and can be initiated by the user at any time through the Lumistar software when used on Lumistar PC products. The user has the ability to generate internal pseudo-random patterns and calculate internal bit error rates with or without the injection of forced errors.Various status indicators are also available through the software. The Bit Synchronizer also contains a BER reader as well as frame sync pattern indicator.
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UC8202 -
UC Instruments, Corp.
The UC8202 Dual channel optical power meter offer superior performance for the test of DWDM components, AWG , WSS, OPM, PLC components, optical amplifiers, transceiver/receiver and other general purpose of fiber optical test and measurement applications
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FOD 3105 -
Fiber Optic Devices Ltd.
The FOD Dual LED modules are designed specifically for test instruments application. They allow to have one output for two wavelengths in compact handheld device without couplers. The Module have an original ceramic ferrule that allows to incorporate the module on the front panel of a device and keep the access to the front face of the ferrule for cleaning and polishing.
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FOD 3106 -
Fiber Optic Devices Ltd.
The FOD Dual LED modules are designed specifically for test instruments application. They allow to have one output for two wavelengths in compact handheld device without couplers. The Module have an original ceramic ferrule that allows to incorporate the module on the front panel of a device and keep the access to the front face of the ferrule for cleaning and polishing.
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DCOAX -
Andeen-Hagerling, Inc.
Very high precision, three-terminal capacitance measurements can be affected by the self-inductance of the test cables, mainly at higher capacitance values. Magnetically induced noise can also reduce the quality of measurements. The cable now offered by Andeen-Hagerling both minimizes these problems and provides a way to standardize the residual self-inductance.
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Walts Co., Ltd
Advanced Dummy Test Wafers/Chips available with over 35 different chip designs and choices of 11 different material configurations as well as kits complete with test vehicles. Custom-make test production of TEG wafer/glass (TEG=Test Element Group). Design and provide custom-make test kit.
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DVB-T and DVB-T2 -
EDB GmbH
DVB-T and DVB-T2 Coverage Measurement and Drive Test solutionb by using of common RF- and GPS- receiver hardware. The solution turns a laptop into a powerful coverage measurement and drive test device.