Showing results: 301 - 315 of 8631 items found.
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DSE Test Solutions A/S
DSE Test Solutions your gateway to a world of wire technology.We supply high-quality test equipment for the wire and cable industry. Our extensive range of intelligent test equipment is used for quality control and production optimisation of enamelled wire and cable.
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EXFO Inc.
Preconfigure bit-error-rate thresholds prior to running the test, and get a simple pass/fail verdict at the end of the test — leaving no room for misinterpreted test results.
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LS-45-DB -
Lumistar Inc.
The Lumistar LS-45-DB Dual Channel Bit Synchronizer Daughterboard provides optimal reconstruction of a serial PCM data stream that has been corrupted by noise, phase jitter, amplitude modulation, or base line variations. The all-digitaldesign assures a high performance, consistent product, with excellent reliability and long-term stability. Dual channel design can feed each channel of the LS-55-DD dual decom. The LS-45-DB also has a post D combiner that allows for optimal ratiocombining of the two input signals A unique Built-in-Test feature allows performance verification for the Bit Synchronizer to ensure the highest level of operation. Auto-test BIT is performed for a short duration on the application of power and tests more than 90% of the Bit Synchronizer components. This test verifies that power is properly applied, verifies that there are no internal bit errors, and performs other tests to ensure that the bit synchronizer is fully operational with status indication of results. Command-test BIT performs the same functions and can be initiated by the user at any time through the Lumistar software when used on Lumistar PC products. The user has the ability to generate internal pseudo-random patterns and calculate internal bit error rates with or without the injection of forced errors.Various status indicators are also available through the software. The Bit Synchronizer also contains a BER reader as well as frame sync pattern indicator.
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JW8103 -
Shanghai Joinwit optoelectronic Tech,co.,Ltd
JW8103 Bentch top Dual-channel High Speed Power Meter is according to the newest optical power test requirements ,combined with the technology characteristics of the power meter in domestic and overseas; the dual channel high speed power meter with very fast sampling rate(can achieve 51200 sampling point per second) and fast stable time, greatly improve the test efficiency;provide large InGaAs detector and adaptors,make it suitable for bare fiber environment and dynamic range test;provide more comprehensive menu settings function,for many test situations to use.
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UC8202 -
UC Instruments, Corp.
The UC8202 Dual channel optical power meter offer superior performance for the test of DWDM components, AWG , WSS, OPM, PLC components, optical amplifiers, transceiver/receiver and other general purpose of fiber optical test and measurement applications
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FOD 3105 -
Fiber Optic Devices Ltd.
The FOD Dual LED modules are designed specifically for test instruments application. They allow to have one output for two wavelengths in compact handheld device without couplers. The Module have an original ceramic ferrule that allows to incorporate the module on the front panel of a device and keep the access to the front face of the ferrule for cleaning and polishing.
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FOD 3106 -
Fiber Optic Devices Ltd.
The FOD Dual LED modules are designed specifically for test instruments application. They allow to have one output for two wavelengths in compact handheld device without couplers. The Module have an original ceramic ferrule that allows to incorporate the module on the front panel of a device and keep the access to the front face of the ferrule for cleaning and polishing.
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DCOAX -
Andeen-Hagerling, Inc.
Very high precision, three-terminal capacitance measurements can be affected by the self-inductance of the test cables, mainly at higher capacitance values. Magnetically induced noise can also reduce the quality of measurements. The cable now offered by Andeen-Hagerling both minimizes these problems and provides a way to standardize the residual self-inductance.
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Walts Co., Ltd
Advanced Dummy Test Wafers/Chips available with over 35 different chip designs and choices of 11 different material configurations as well as kits complete with test vehicles. Custom-make test production of TEG wafer/glass (TEG=Test Element Group). Design and provide custom-make test kit.
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DVB-T and DVB-T2 -
EDB GmbH
DVB-T and DVB-T2 Coverage Measurement and Drive Test solutionb by using of common RF- and GPS- receiver hardware. The solution turns a laptop into a powerful coverage measurement and drive test device.
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2527 Series -
Instron
Dynacell is the world's first truly dynamic load cell, designed from the outset for measuring dynamic loads. Dynacell introduces the following advantages: *Reduces dynamic load errors which can be a significant percentage of reading*Increases productivity by allowing higher frequency operation while maintaining test validity *Improvements such as doubling the frequency are common
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UI-FT11 -
Unuo Instruments
Dynamic Footwear Water Penetration Tester is used to test all kinds of finished shoe water resistance ability in flexing condition.
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ObserVIEW -
Vibration Research Corporation
View, edit, and analyze waveforms from recorded or live data. This powerful and efficient vibration analysis software package includes specialized modules for waveform recording and test generation.