Showing results: 5626 - 5640 of 8631 items found.
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W.L. Gore & Associates
Gore offers a rugged, lightweight 110 GHz test assembly that optimizes the performance of test systems while reducing the total cost of test and ownership over time. Our assemblies provide reliable electrical performance with flexure and temperature in demanding environments.
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Flynn Systems Corp.
Whether plugging into a test executive, or running as a plug-in to your own interface, onTAP’s DLL can be linked to and run from third party test executives such as, National Instruments’ LabVIEW™. Flynn Systems provides GUI demo programs written in C++ and C# showing you how to link the onTAP DLL to your test executive
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MPD 500 -
OMICRON electronics
The MPD 500 simplifies routine factory partial discharge measurements for electrical insulation systems. Engineered with OMICRON's long time experience, the MPD 500 is optimized for routine tests in high throughput environments.
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Yokogawa Test & Measurement Corp.
A modular test platform with a wide selection of modules allows optimal configuration of test solutions for optical component and network systems manufacturing.
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966R -
Sage Instruments
Analog Devices develops components for safety systems, such as stability control systems and driver assistance systems, infotainment and interior applications.Powertrain systems in hybrid and electric vehicles use high-precision data conversion products in battery monitoring and control systems.
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T5851/T5851ES -
Advantest Corp.
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Polaris Networks
The LTE MME Functional Tester provides a wrap-around test solution for the Mobile Management Entity by emulating all the LTE network elements surrounding the MME (System Under Test). The MME Functional Tester emulates an LTE eNodeB and other Core Network entities such as the S-GW and SGSN. It tests the S1-MME, S11, S10, S3, S6a, S13 and SBc interfaces of the MME.
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Circuit Check, Inc.
Circuit Check’s bi-level and multi-stage fixtures combine multiple test levels in a single fixture using controlled actuation and selected probe travels for powered and unpowered tests.
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BK8600 -
BaKo Co., Ltd
Rotation can produce noise and extraneous vibration for any number of reasons and could cause wear, discomfort, or other problems. The BK8600 series of testers are specially designed to test for these.
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NEOSEM TECHNOLOGY INC
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies. Up to 64 Blades populated in one test head can test over 2000 DUTs in parallel. Neosem Technology’s high parallel DUT count architecture, combined with low capital cost, provides the absolute lowest HVM cost of test.
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G-2 Series -
Shinken Co. LTD.
The G-2 Series Miniature Vibration Test System, though compact & handy, consists of a sweep oscillator, sine controller, power amplifier and vibration generator, thus suited to a variety of applications; calibration of sensors, standardized vibration tests for small parts, school teaching materials and modal analysis. The G-2002 is handy, with all the composed units being incorporated in a portable case.
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Tektronix, Inc.
Signaling has migrated from simple on-off keying to complex modulation formats such as DP-QPSK and PM-16QAM. Advanced test tools are required to test the latest communication systems for 100G, 400G, 1Tb/s and beyond. Tektronix is the only test and measurement vendor that can offer a complete coherent optical test system from signal generation, to modulation, acquisition, and analysis.
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nm-Wave AARTS System -
Accel-RF Corporation
AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
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D&V Electronics LTD
The production solenoid test systems are designed to check a high volume of parts each shift, verifying all important parameters of the solenoid.
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Skydel Wavefront -
Spectratime
Controlled Reception Pattern Antennas (CRPAs) are becoming increasingly common, particularly in the Defense sector.