Showing results: 6016 - 6030 of 8631 items found.
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19056/19057 -
Chroma Systems Solutions, Inc.
Chroma’s Guardian 19056/19057 Hipot Analyzer is specially designed for testing and analyzing ultra-high withstand voltage. The series of models include 10kVac / 12kVdc / 20kVdc with maximum AC20mA / DC10mA output that can perform AC / DC withstand voltage and insulation resistance tests with contact check during production line test.
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12061 -
Chroma Systems Solutions, Inc.
The 12061 6½ Digital Multimeter has assorted settings for resolution, integration time and ranges that allow users to optimize the configuration of measurement speed, resolution and accuracy when in individual measurement test modes. The 12061 has built-in a high speed, low interference A/D converter with a maximum speed of 2000 rdgs/s, making it the best solution for high speed measurement.
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C8000 -
Chroma Systems Solutions, Inc.
Power conversion testing is our core competency. Chroma’s engineering delivers cost-effective automated test system and software platforms to fit your Design Validation Testing (DVT) requirements in the lab or High Speed Functional Testing in the production line. Built into each system are Chroma’s years of expertise, precision instrumentation, pre-written test libraries, and local program management with global support. From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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Chroma Systems Solutions, Inc.
The Chroma 16502 Milliohm Meter is Chroma’s newest digital Milliohm Meter. 0.001mΩ~1.9999MΩ wide measurement range. DC, Pulsed, and Dry-circuit test current driving modes, enable the Chroma 16502 can be properly used in DC resistance measurement for various inductive components (coil, choke, and transformer winding etc.), cable, metallic contact (connector, relay switch etc.) and conduction materials.
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Chroma 16502 -
Chroma Systems Solutions, Inc.
With a basic accuracy of 0.05%, Chroma 16502 offers a 0.001mΩ ~1.9999MΩ wide measurement range. It provides measurement range with 4 1/2 digits resolution. The fast measurement time is 65 ms. It suits component evaluation on production line. Pulsed test current output mode is used to reduce thermal EMFs affection on milliohm measurement. DC test current output mode is used to fasten measurement speed for inductive DUT. Dry-circuit test current output mode is used to measure such contact resistances where the maximum open-circuit voltage must be limited to 20mV.
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Chroma Systems Solutions, Inc.
This auto test system uses the unique test command optimization technology to prevent the repeating control commands from sending to the system hardware devices. This improves the system test speed dramatically and makes Chroma 8000, which uses open software architecture, highly efficient as a close or optimized auto test system.
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19020 -
Chroma Systems Solutions, Inc.
The Guardian 19020 enables users to save space on the production line since there is no need to purchase multiple Hipot testers. Its one time multi-channel test can increase the efficiency of electrical regulatory testing. It improves productivity and reduces the risks of testing for products that require only hipot testing.
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Chroma 11021/11021-L -
Chroma Systems Solutions, Inc.
The Chroma 11021/11021-L are the most cost-effective digital LCR Meters, providing 100Hz, 120Hz, 1kHz, and 10kHz test frequencies for the 11021 and 1kHz, 10kHz, 40kHz, 50kHz test frequencies for the 11021-L. Standard RS232 interface, optional GPIB & Handler interface, high speed and stable measurement capabilities enable the Chroma 11021/11021-L can be used for both component evaluation on the production line and fundamental impedance testing for bench-top applications.
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11022/11025 -
Chroma Systems Solutions, Inc.
0.1% basic accuracyTransformer test parameters (11025), Turns Ratio, DCR, Mutual Inductance0Hz, 60Hz, 100Hz, 120Hz, 1kHz, 10kHz, 20kHz, 40kHz, 50kHz, 100kHz test frequencies21ms measurement time (≥100Hz)Agilent 4263B LCR Meter commands compatible4 different output resistance modes selectable for non-linear inductor and capacitor measuringHigh resolution in low impedance(0.01mΩ) and high accuracy 0.3% till 100mΩ rangeAdjustable DC bias current up to 200mA (constant 25Ω) (11025)1320 Bias Current Source directly control capability0.01mΩ ~ 99.99MΩ wide measurement range (4 1/2 digits)Dual frequency function (11022 option) for automatic productionBIAS comparator functionComparator function and 8/99 bin-sorting functionPass/fail judge result for automatic productionHandler interface trigger edge (rising/falling) programmableTest signal level monitor functionStandard RS-232, GPIB, and Handler I/FOpen/short zeroing, load correctionLabView® Driver
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Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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Chroma Systems Solutions, Inc.
High precision, integrated battery charge / discharge cycle test systems designed for lithium ion and other chemistries and applications including EV batteries and energy storage systems. Chroma’s battery test equipment provides advanced features including regenerative discharge systems that recycles energy from the battery back into the channels in the system or to the grid. Systems are configurable and flexible with multiple channel capabilities that can be upgraded as testing requirements change.
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ScanExpress Runner Gang -
Corelis, Inc.
Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.
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ScanExpress DFT Analyzer -
Corelis, Inc.
Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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ScanExpress Runner -
Corelis, Inc.
Efficiency in engineering means managing your most precious resources: time and effort. Automated testing is essential and boundary-scan is a critical component; no other structural test system provides the same value.When down to the wire, your boundary-scan test system needs to be built both for ease-of-use and reliability; a robust and powerful mechanism to ensure that no matter the state of production, all boundary-scan tests can be quickly and faithfully executed to maintain forward momentum.
