Showing results: 7261 - 7275 of 8631 items found.
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UltraFLEX -
Teradyne, Inc.
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Teradyne, Inc.
HSSub is a software-defined family of PXIe Instrumentation that can be integrated and scaled to support digital test applications throughout the product life cycle from design verification to production and sustainment.
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Di-Series™ -
Teradyne, Inc.
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
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Ai-762 -
Teradyne, Inc.
Ai-762—the newest member of the Ai-760 Series in the Core Systems Instruments (CSi) family—is a standards-based integrated test and measurement tool that consolidates traditional instruments into a single-slot VXI package.
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Teradyne, Inc.
TestStation Multi-Site Inline is the most productive, lowest cost in-circuit test solution. This "zero-footprint" inline test system provides true 2x-4x parallel test, delivering 200% to 400% greater productivity, and 40% to 50% lower total cost of test.
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Teradyne, Inc.
Automated versions of Teradyne’s TestStation systems are designed for short takt time automated lines. The TestStation Automated Inline Handler, coupled with a TestStation Test Insert forms a combined integrated solution for any mix, any volume PCBA manufacturing.
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TestStation Duo -
Teradyne, Inc.
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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ResTest -
Jandel Engineering Limited
The new Jandel ResTest Test Unit is a constant current source and digital voltmeter with large colour screen, supplying constant currents between 1uA and 10mA, and measuring voltages from 0.04mV to 4000mV.
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HM21 -
Jandel Engineering Limited
The Jandel HM21 Test Unit has six constant current settings between 100nA and 10mA, and can be used to measure voltages from 0.01mV to 1250mV.
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NI
PXI MultiComputing Remote Control Modules enable PXI systems to transfer data at multigigabytes per second with only a few microseconds of latency. You can use these models in applications such as real-time tests, hardware-in-the-loop (HIL) tests, and structural tests that need a large number of distributed PXI systems to share data with low latency.
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8 Series -
Tektronix, Inc.
The 8 Series Sampling Oscilloscope enables efficient and affordable optical component testing with an innovative disaggregated architecture. With a reconfigurable and compact design, an innovative user interface, and reliable high-end performance, this oscilloscope is an ideal test solution for manufacturing applications. The 8 Series is designed to adapt to a continuous increase in demand for higher bandwidths and baud rates addressing current and future test parameters.
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ZT-Series -
Teradyne, Inc.
Teradyne develops and supports Modular Digitizers, Digital Storage Oscilloscopes, and Waveform Generators under the ZT-Series brand. Teradyne’s ZT-Series works to solve the test and measurement challenges of various end markets such as Defense and Aerospace, Semiconductor Test, High Energy Physics Applications, Industrial Control and Automotive Test.
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Teradyne, Inc.
Teradyne and AIT instruments test legacy and newer digital buses.The enormous variety of digital buses used in defense and aerospace applications requires comprehensive, yet efficient testing.Teradyne and AIT COTS instruments meet these challenging bus test requirements for legacy and standardized buses, as well as evolving digital buses that have faster speeds, larger data volumes, and increasingly complex protocols requiring real-time test and emulation.
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Bi4-Series -
Teradyne, Inc.
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
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J750Ex-HD Family -
Teradyne, Inc.
Microcontroller Units (MCUs) are used in automobiles, mobile electronics and robotics. As you go through your day, dozens of MCUs are in your electronic devices working to provide unique features and Teradyne’s J750 family most likely tested them. With a growing installed base of over 6,000 test systems and widely available at more than 50 Outsourced Assembly and Test (OSAT) locations, Teradyne’s J750 is the industry standard for high volume test of low-cost devices.