Showing results: 8566 - 8580 of 8631 items found.
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APS-FC-2 -
AIM GmbH
2 Port 4GFC Fibre Channel Test, Simulator and Monitor module for PCIe (functional replacement for APE-FC-2)
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AXC-FDX-2/B -
AIM GmbH
AFDX®/ARINC664P7 Test and Simulation module for XMC with 2 full duplex ports programmable for 10/100/1000 Mbit/s. Versions available for both Airbus and Boeing variants of ARINC664P7.
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ATS-3100 VRS -
Astronics Corporation
The ATS-3100 VRS, the newest member of the ATS-3100 PXI Integration Platform product family and fifth-generation radio test solution, is a single, consolidated platform for testing legacy, modern, and next-gen, software-defined radios for military, civil, and commercial users. Integrating the PXI Vector Signal Transceiver (VST) from National Instruments (NI), the platform enables faster test time with wider bandwidth (up to 1GHz) than any other radio test solution available today.
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Astronics Corporation
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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TRD Software -
Astronics Corporation
The Test Requirements Document (TRD) System helps users develop and document the strategy and structure of test programs.
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VME-3125A -
Abaco Systems Inc
Isolated Scanning 12-bit 32-Channel Analog-to-Digital Converter Board (6U) with Built-in-Test (BIT)
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VME-1128 -
Abaco Systems Inc
VME-1128 is a 128-bit High-Voltage Digital Input Board with Built-in-Test. This product complies with the VMEbus specification (ANSI/IEEE STD 1014-1987, IEC 821 and 297) with the following mnemonics: A24:A16:D32/D16/D08 (EO): Slave: 39/3D:29/2D Form factor: 6U
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VME-2128A -
Abaco Systems Inc
VME-2128A 128-bit High-Voltage Digital Output Board with Built-in-Test
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VME-2232A -
Abaco Systems Inc
VME-2232A is a 32-Channel Relay Output Board with Built-in-Test (BIT). Software compatible with the VMIVME-2232 and the VMIVME-2533.
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Chroma ATE Inc.
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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3380P -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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3380D -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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3380 -
Chroma ATE Inc.
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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17020 -
Chroma ATE Inc.
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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58131 -
Chroma ATE Inc.
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.