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Showing results: 8971 - 8985 of 14402 items found.

  • Scratch Tester

    CSR1000 - Rhesca Co., Ltd.

    This tester is highly effective in measuring the adhesion strength (adhesion strength) of hard coatings (Ti, TiN, SiC, DLC, etc.) formed by PVD and CVD on metal surfaces such as cemented carbide. Adopting a scratch test method that allows quantitative measurement with simple operations, the film surface is scratched while increasing the load on the sample surface, detecting film breakage with high sensitivity, and providing the load at which film breakage occurs (critical load). tools and mold tools that require

  • Fuel Flow Measurement Systems

    FQ Series - HORIBA, Ltd.

    Measuring a vehicle’s fuel flow requires a precise system which can run stationary and transient tests. It must also be able to offer high reproducibility and run cycle measurements under real operational conditions, including WLTP. Our FQ Series of fuel flow measurement systems offers a highly precise method of measuring various fuel types, and covers the full range from small engines (incl. single-cylinder research engines) up to heavy-duty engines with up to 5000 kW.

  • Switch Analyser

    SA10A - Elcon International AB

    It has a built-in micro Ohm meter/Ductor for measuring of static and dynamic resistance of the breaker poles. It only weighs 11,6 kg. The versatility and precision that this unit offers is, without question unchallenged, ​ and it will indeed be your best partner when testing circuit breakers. Tests in areas with high induction at known problematic substations has proven the SA10A to be the only circuit breaker timer that could withstand these extreme conditions. It's rugged, it's small and highly appreciated by our customers.

  • Virtual Universal Testing Platform

    vUTP - NET Research Corp.

    The NetResearch virtual Universal Testing Platform (vUTP) is an intuitive and user-friendly platform that enables you to run and schedule a wide range of tests operating on different layers. vUTP utilizes hybrid cloud infrastructure so you can monitor assets from global and local perspectives without any additional effort or investment. The scalable design ensures cost-effectiveness for our clients while the vUTP dashboard provides a great user experience and immediate information about the status of your infrastructure.

  • Compact 6-Position Dissolution Tester

    Vision G2 Classic 6 - Teledyne LABS

    The Vision G2 Classic 6 dissolution tester is the compact, rugged workhorse sibling to the Vision G2 Elite 8. Named in honor of the world’s first dissolution tester, a six-position test station introduced by Hanson Research in 1969, the G2 Classic 6 is precision engineered to ease the rigors of manual dissolution testing. The G2 Classic 6 meets and exceeds worldwide standards including compliance with USP, FDA, ASTM, EP, JP, CE, CSA, RoHS, and 21 CFR Part 11.

  • PSG Vector Signal Generator, 100 kHz to 44 GHz

    E8267D - Keysight Technologies

    Test advanced receivers with realistic wideband radar, EW and Satcom waveforms with metrology-grade performance and versatile capabilitiesSimulate complex electromagnetic environments with up to 4 GHz of bandwidthReduce the time you spend creating complex signals with Signal Studio software: pulse building, noise power ratio (NPR), multi-tone signals, wireless & moreMaster your most complex signal requirements with the industry's best SSB phase noise: 143 dBc/Hz at 1 GHz (10 kHz offset)

  • Noise Source, 1 GHz up to 40 GHz

    346CK40 - Keysight Technologies

    The Keysight 346CK40 is the ideal companion to Keysight´s noise figure solutions when working on high frequency applications. Since it is broadband (1 GHz to 40 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source greatly reduces measurement uncertainty, which are commonly reflections of the test signals. This is a coaxial noise source with a 2.4 mm coaxial connector. ENR typically 14 dB at 1 GHz, decreasing to 5 dB at 40 GHz (typical).

  • Noise Source, 1 GHz up to 50 GHz

    346CK01 - Keysight Technologies

    The Keysight 346CK01 is the ideal companion to Keysight´s noise figure solutions when working on high frequency applications. Since it is broadband (1 GHz to 50 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty, which are reflections of the test signals. This is a coaxial noise source with a 2.4 mm coaxial connector. ENR typically 20 dB at 1 GHz, decreasing to typically 7 dB at 50 GHz.

  • VXI Instruments

    North Atlantic Industries

    NAI offers a wide range of COTS and custom VXI-based Instruments. These boards are specifically designed for defense, commercial aerospace, and industrial applications. Our DSP-based designs offer very high function density, high resolution and accuracy, and low power consumption. Standard features include extensive diagnostics, Background Built-In-Test (BIT), auto-ranging of signal inputs, self-calibration, galvanic isolation, and field programmable parameters. A VISA PNP Software Support Kit (SSK) is provided to facilitate application development.

  • Leakage Current Tester

    TOS3200 - Kikusui Electronics Corp.

    The Leakage Current Tester TOS3200 is designed to perform leakage current (touch current and protective conductor current) tests on general electrical equipment but not medical electrical equipment.It enables you to conduct tests that conform to the requirements of the applicable IEC, UL, JIS, and other standards, as well as the Electrical Appliance and Material Safety Law. The memory in the main unit stores the 51 types of test conditions laid down in the IEC/JIS standards for information technology equipment, household electrical appliances, audio, video electronic apparatus, luminaires, motor-operated electric tools, and electrical equipment for measurement and control and in the Electrical Appliance and Material Safety Law, thereby enabling you to conduct standard tests with simple panel operation.

  • Electromagnetic Resonance High Frequency Fatigue Testing Machine

    PLG Series - Jinan Testing Equipment IE Corporation

    The series of electromagnetic resonance fatigue testing machines are used for fatigue tests of metal materials and components under tension, compression or reversal loads. If relevant grips are provided, three-point bending test, four-point and circle test, gear wheat, bolt, connecting rod, roller chain, crackle expanding test can be available. The series of electromagnetic resonance fatigue testing machines feature an optimized design and a rational structure. The automatic controlled system adopts an advanced and wide-pulse-control system and a new-type of power amplifier to improve the reliability of the electric system. The electromagnetic resonance fatigue testing system is with high efficiency, easy and non-stop shake, low energy consuming, accurate control, and small fluctuation.

  • RSE Wireless EMC Spurious Emission

    TS8996 - Rohde & Schwarz GmbH & Co. KG

    The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope

    780319-02 - NI

    1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope

    780319-01 - NI

    1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope

    780319-03 - NI

    1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

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