Showing results: 136 - 150 of 1406 items found.
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Keysight Technologies
For more than 50 years, Keysight's automated test equipment (ATE) power supplies have changed the way engineers prove their designs, understand issues, and ensure product quality. Our programmable ATE system power supplies' compact design makes it easy to integrate them into any system. Keysight power supplies make it easy to update a test program with modern interfaces, LXI-core capability, and SCPI language. Accelerate test time with fast command processing and quick settling times.
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HotShot e64 -
nac Image Technology Inc.
Is perfect for a multitude of high speed applications including: manufacturing, research, design & test, production and human / veterinary biomechanics analysis, to name a few.
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Wirepro Tech
Is used to assist wiring fixtures and then test the fixtures for wiring errors. We also can manufacture and/or design custom machinery to your specifications.
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EL & Associates, Inc.
EL & Associates, Inc. specializes in integrated solutions for design (RTL to GDSII), Design-For-Test (DFT) and Design-For-Manufacturing (DFM) services for ASIC, ASSP, COT, and FPGA. We engage with customers from RTL phase to silicon prototype. The ELA methodology is optimized to manage risk in design, manufacture and product deployment. ELA has successfully completed over 750 designs to date.
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Mentor Graphics Corp.
As designs move to smaller and more complex process technologies, ensuring devices are thoroughly tested becomes a bigger challenge. Mentor Graphics provides whole-chip test solutions that can help improve test -- and, therefore, device -- quality as well as control, or even reduce, the cost of test.
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Cuming-Lehman Chambers
In today’s environment a small specific test box may be needed to test a component, perform R&D or simply tweak your product. Cuming Lehman Chambers has the ability to custom design and construct a precise test box to meet your specific needs.
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IEC60884 FIG11 -
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 FIG11 Wire damage test device for pull testingThe wire damage test device is a special test instrument designed and manufactured according to the requirements of IEC884 Figure 11, , etc. It is mainly used to judge whether the screw-clamp type terminal is in design and structure.
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Test Head Engineering, LLC
Test Head Engineering designs and builds high‐quality In‐Circuit Test (ICT) Fixtures for HP / Agilent / KeySight Technologies 3070 board testers. We partner with In Circuit Test Engineering, Inc. to provide turn-key 3070 ICT solutions - both fixture and programming.
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N1081PLCA -
Keysight Technologies
Keysight N1081PLCA PCI Express PLL Test Application designed to measure transmitter PLL bandwidth and peaking based on the PCI Express 5.0 TX PLL Specifications. Use N1081PLCA PCIe PLL test software to test, debug and characterize your PCIe designs.
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Intellitech Corp.
ntellitech has a very experienced consulting and test development organization that is dedicated to provide our customers with high-quality design and test services. Choosing Intellitech Test Services can help you lower the risk of adopting a new Design-for-Test methodology or speed your product to market when you need to deploy a test solution quickly.
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Keysight Technologies
GoldenGate RFIC Simulation and Analysis Software is an advanced simulation and analysis solution for integrated mixed signal RFIC designs that is fully integrated into the Cadence Analog Design Environment (ADE). GoldenGate is part of Keysight's RFIC simulation, analysis and verification solution that also includes Momentum for 3-D planar electromagnetic simulation, SystemVue & Ptolemy wireless test benches for system-level verification, and the Advanced Design System (ADS) Data Display for advanced data analysis. This suite links the RF system, subsystem, and component-level design and analysis as part of a unique and comprehensive RFIC design flow.
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TestKompress -
Mentor Graphics Corp.
TestKompress is an automatic test pattern generation (ATPG) tool that provides the highest quality scan test with the absolute lowest test cost. TestKompress has an industry-proven ATPG engine that applies effective fault models to your entire logic design. Manufacturing test costs are held in check by an award-winning test pattern compression technique called Embedded Deterministic Test (EDT).
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InCarrier -
Cohu, Inc.
The InCarrier process is based on a strip-like device carrier for single devices that combines the advantages of the singulated device test with the advantages of high parallel strip test. Leveraging the strip like design the InCarrier ensures robust test-handling for even smallest devices and supports high parallel test.
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Freese Enterprises Inc.
What can FEI do for you? FEI designs, integrates, delivers, and supports custom measurement and test equipment, both hardware and software, for your tough measurement problems. Custom test and measurement equipment is our primary focus.
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N9048B -
Keysight Technologies
Keysight's N9048B PXE is a standards-compliant EMI test receiver equipped with an RF pre-selector and LNA designs. Shorten your overall test time and easily perform gapless signal capture and analysis with real-time scan (RTS) capabilities.