Showing results: 1 - 12 of 12 items found.
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S6 JAGUAR -
Bruker AXS GmbH
The S6 JAGUAR offers more analytical power with typically more than 50% reduced measurement times than any other compact WDXRF instrument, featuring its new compact WDXRF goniometer, closely coupled optics, and 400 W direct excitation power. Based on the brand new HighSense XE detector with its ultimate linear range of more than two Million cps, it delivers excellent accuracy and precision for quality control in industrial labs.
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S6 JAGUAR -
Bruker Optics
The S6 JAGUAR offers more analytical power with typically more than 50% reduced measurement times than any other compact WDXRF instrument, featuring its new compact WDXRF goniometer, closely coupled optics, and 400 W direct excitation power. Based on the brand new HighSense XE detector with its ultimate linear range of more than two Million cps, it delivers excellent accuracy and precision for quality control in industrial labs.
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S8 TIGER Series 2 -
Bruker Optics
Thanks to HighSense technology the S8 TIGER Series 2 WDXRF spectrometer delivers for all elements accuracy and precision for industrial quality and process control. With high resolving WDXRF technology and optimal detection of light, medium and heavy elements based on the new HighSense beam path, the XRF2 mapping tool of the S8 TIGER Series delivers best sensitivity, smallest spot size, and highest resolution for small spot applications. Ergonomic and failsafe operation are vital for efficiency and best analytical data. Simple, intuitive start of samples are guaranteed with the multilingual TouchControl interface.
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Axios FAST -
Malvern Panalytical Ltd
Do you need non-destructive analysis of chemical composition in seconds because of time-critical process control or running sample high-throughputs? With up to 28 elements measured simultaneously in concentration ranges from ppm to 100%, the Malvern Panalytical Axios FAST simultaneous WDXRF spectrometer is the ideal solution. Accurate and robust analysis, ease of operation by less-experienced staff and high uptime go hand in hand with a low cost of ownership.
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Zetium -
Malvern Panalytical Ltd
X-ray fluorescence spectrometry (XRF) is capable of elemental analysis of a wide range of materials, including solids, liquids and loose powders. Designed to meet the most demanding process control and R&D applications, the Zetium XRF spectrometer leads the market in high-quality design and innovative features for sub-ppm to percentage analysis of Be to Am.
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2830 ZT -
Malvern Panalytical Ltd
The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
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Supermini200 -
Rigaku Corp.
Elemental analysis of solids, liquids, powders, alloys and thin films. The new Supermini200 has improved software capabilities as well as a better footprint. As the world''s only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku Supermini200 uniquely delivers low cost-of-ownership (COO) with high resolution and lower limits-of-detection (LLD)..
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Simultix 15 -
Rigaku Corp.
Multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system, the Simultix 15 high-throughput WDXRF spectrometer. Analyze beryllium (Be) through uranium (U) in almost any sample matrix. The most important metrics for automated process control are precision, accuracy and sample throughput. With up to 30 (and optionally 40) discrete and optimized elemental channels and 4 kW (or optionally 3 kW) of X-ray tube power, Simultix 15 delivers unparalleled analytical speed and sensitivity.
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Evans Analytical Group®
Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
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FACTORY LAB MXF-2400 -
Shimadzu Corp.
Wavelength Dispersive X-Ray Fluorescence Spectrometer The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-ray fluorescence spectrometer, which has been rated highly in the overseas market as well as in the Japanese market. The latest hardware designed to fully utilize the principle of X-ray fluorescence spectrometry and the data processing unit that uses various software programs to permit automatic management of analysis data combine to provide high analytical productivity both in R&D and production control. Up to 36 elements can be simultaneously determined by the fixed monochrometer and up to 48 elements can be determined sequentially by the optional scanning monochrometer. High analytical precision is provided even in high sensitivity analysis of a few ppm quantity level.
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ZSX Primus IV -
Rigaku Corp.
As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Guidance supports you in all aspects of measurement and data analysis. Can accurate analysis only be performed by experts ? No — that is in the past. ZSX Guidance software, with the built-in XRF expertise and know-how of skilled experts, takes care of sophisticated settings. Operators simply input basic information about samples, analysis components and standard composition. Measured lines with the least overlap, optimum backgrounds and correction parameters (including line overlaps) are automatically set with aid of qualitative spectra.
