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Semi
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: E84
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Film Frame Test Handler
4170-IH
High throughput ・High withstand load, and high thrust table ・Expansion of the strip attachment area ：260(L) X 300(W) [Withinφ300mm for WLCSP]・LOT control by barcode/2D code reader ・Easy device type exchange only test socket and display screen setting・Auto-cleaning function unit is installed to clean the socket at any desired timing.・8/12 inches ring conversion ・S2/S8 regulation compliance・SEMI G85 compliance・SECS/GEM compliance
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Machine Vision Camera - 1.3 MP, 60 FPS, e2v EV76C560, Color
Flea3 USB3
The Flea®3 line of USB3 Vision, GigE Vision and FireWire cameras offers a variety of CMOS and CCD image sensors in a compact package. The Flea3 leverages a variety of Sony, ON Semi, and e2v sensors ranging from 0.3 MP to 5.0 MP and from 8 FPS to 120 FPS. For FLIR GigE and USB3 cameras with the latest sensors and most advanced feature sets, please refer to our Blackfly S and Oryx camera families.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Create Topographic Profiles from SPM Images
TopoStitch
topoStitch™ offers the easiest and most accurate way to stitch topographic or greyscale images from Scanning Probe Microscopes (SPM’s), profilers, interferometers, confocal microscopes or any other instrument type. All images are placed automatically according to stage position coordinates when stored in the image files. Otherwise, the Grid Layout Wizard helps to lay out images in seconds. topoStitch™ even offers advanced snapping and semi transparent rendering, which makes it easy to place and adjust images manually.
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Genmark Integration Framework and Technology Development Kit
GIFT Server
The Genmark Integration Framework and Technology (GIFT) development kit is a set of software components, tools and techniques used for rapid development of equipment automation applications. It offers off-the-shelf factory host-computer interface, which are compliant with all related SEMI standards. The product features advanced user interface, broad range of supported automation hardware and presets for many 300mm semiconductor factories.
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Easy E23 / E84
Objective Solutions' Easy E23/E84 product line is designed to simplify the integration of SEMI E84 and E23 into Process Equipment and Factory Vehicle systems. The models provide a standard E23/E84 infrared interface to AGV/OHV and process equipment, utilizing Hokuyo transceivers. The Easy E23/E84 units have been developed to work as-is with Hokuyo IR transceivers and as an option, with opti-isolation as required by direct-connect applications. They enable simple integration to process equipment or AGV application programs.
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Hand-Held, Battery-Operated Multi-Frequency Eddy Current Instrument
US-454A
United Western Technologies Corp
The US-454A is a portable, hand-held, battery-operated multi-frequency eddy current instrument that can be connected to a laptop, PC and motion controllers for use in semi- or fully automatic data collection applications. Two encoder inputs enable position stamping of data. Pulse-on position input is ideal for motion control applications. Ethernet and USB capabilities allow instrument control along with time- and position-stamped data transfer to the client computer. Built from the rugged US-454 architecture, the US-454A offers single- and multi-frequency inspection, frequency mixing capabilities, enhanced signal-to-noise ratio, USB, Ethernet and data storage capability, and unprecedented digital strip chart data collection.
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Mobii Media Encoder
The Smart Encoder is designed for semi and permanent based on-site installation. Deployed into sport stadiums/arena’s, Broadcast production sites, Data Centers and Outside Broadcast vehicles, the Smart Encoder will ingest a variety of input video sources such as SDI, NDI, SRT, MPEG-TS. The encoder will ingest, synchronize, encode and upload Microblock streams to the nearest cloud regional edge cluster for global distribution via the Co-Ordinator, or output a variety of streaming formats to local network for on-site usage.
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Electrical Testing Services
Integra provides extensive experience with complex test development: Digital & Mixed Signal Devices: Microprocessor, Microcontrollers DSP, ASIC. Linear: DAC, ADC, Operational Amplifier, Comparator, Multiplexer, Interface, Discrete. Memory: SDRAM, DDR, SRAM, SSRAM, Flash, EEPROM, EPROM. Logic: 74xxx, 16/32-bit, ECL. RF, 8GHz typical and experience to 50GHz: PA, LNA, Filter, Mixer. Expertise in developing test plans (semi mfgr production & device characterization)
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Semi-Automatic Contactless Wafer Detector
NCS-200SA
Semi-Automatically, non-contact measurement of wafer thickness, TTV ,bow,Point and flatness.Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.the powerful software can test all the data above within several seconds,all the design according to SEMI standard and the ASTM,make sure the data can be easily unify. the system can used for several sample size,like 75 mm, 100 mm, 125 mm, 150 mm, 200 mm
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Semiconductor Package Wind Tunnel
WT-100
Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
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Host emulator
E84
Precision Development Consulting Inc
A USB controlled and self-powered emulator for functional testing SEMI E84 implementations. (E84-1000) This was developed because there was nothing like it in the marketplace, and it was clearly needed. This product enables a factory automation engineer to perform E84 functional testing anywhere in the world. Weighing less than 5oz, it is neither a burden, nor a power hog. You will never need to look for an additional power receptacle in the fab. The emulator gives the user full control over the sequence so that any test can be performed. Existing products were large and unwieldy, and provided canned tests that could not be modified to meet the requirements that Fab managers impose on their suppliers.
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Computerized Automatic Relay Tester
CVRT-S16
CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.
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Brake Test Systems
Giant 8000 Series
Customer perception of vehicle quality is closely related to the NVH behaviour of the vehicle. With the HORIBA ATS Brake testing system, NVH relevant design features are analyzed and various metrics stored in the database of the automation system. For friction borne vehicle NVH problems coming from the brake and its components the GIANT 8000 Series is the ideal tool to resolve it. The GIANT 8000 Series is superior NVH test system providing you with the best testing conditions for all types of vehicles. Test brake fixtures could be tested with a complete wheel suspension system. In a semi acoustic chamber NVH tests could be realized and drum brakes and disc brakes including the vehicle axle could be tested.
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Hydraulic Universal Testing Machines
UH-X/FX Series
Environmentally and operator friendly state-of-the-art universal testing machine The operability and visibility of the computer-controlled hydraulic servo type universal testing machine (UH-X) and the high-performance universal testing machine (UH-FX), equipped with front opening type hydraulic grips, have been greatly improved by the adoption of a large color touch panel. Equipped with a semi autotuning function that automatically adjusts the control parameters, stress control and strain control (ISO 6892 compliant) can be easily carried out without the need for a preliminary test. The UH-Xh and UH-FXh models feature a new hybrid hydraulic oil source that reduces the required quantity of hydraulic oil, thereby achieving a major reduction in electrical power (about 50 %).
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Battery Pack ATS
8700
Chroma transfers its successful experience in 8000 ATS which is quite well-known in the power electronics industry to the battery application field by developing the Test Items specifically for the battery industry. It can perform automatic tests on the Battery Management System (BMS), semi products and finished products tests on the production line as well as provide long term maintenance and service to the battery module. 8000 (8700) ATS has flexible hardware architecture that can select a variety of hardware devices, such as DC Power Supply, Electronic Load, LCR Meter and 6 1/2 digits Meter, etc. to comply with different automatic testing requirements for various applications. In addition new hardware and test items can be expanded to meet the demands for inspecting the highly customized battery products with diversified tests. The capabilities supported are:
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Flexible Current Sensor Probe
CTA
The CTA current sensors convert ac current to an isolated 0-5A current with available ranges from 100A to 10,000A. Because the current sensors are flexible split core, installation is possible without shutting down the LV electrical supply, avoiding expensive down-time costs. Typical applications are retrospective energy monitoring in factories, offices buildings, process control data logging systems, where power, energy and current monitoring is important. Typical applications are factories, offices buildings, ac/dc VFD drives, welding, power conversion and power distribution. For all CTA current sensor models, a NIST/NPL (UKAS) traceable calibration certificate and certificate of conformance is supplied. All CTA sensors use UL94V0 or CSA approved materials. The CTA flexible current sensors are suited to permanent or semi permanent installation. The coil sensor is durable, lightweight, flexible and will easily clip-around a power cable. The 5A output from the CTA current sensor connects direct to installed metering, rotary metering or current transducers.
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Metrology Solutions for Semiconductors
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
