Showing results: 166 - 180 of 216 items found.
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bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
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ITC57300 -
Integrated Technology Corp.
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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CHY002 -
Rinch Industrial Co.,Limited
Using import semiconductor laser tube and import semiconductor photosensitive tube, assure sensitivity and response speed.Using import micropump，assure sampling volume steady，reduce noise.The key component-light scattering sensor obviously eliminate intracorporal stray light, improve SNR, test result more precise and reliable.The light scattering sensor got Chinese patent.Confidence measurement of this instrument，According to GB/T6167-2007 Standard，realize auto estimate clean class, creatively to auto estimate ≤9 location points clean class.1000 records stored, free to check previous data.User can optional PC data analysis software, realize data management.User can choose humidity sensor (optional accessories).Sampling volume display as digit, more intuitive and precise.“Measurement Number”function，realize multipoint management.Lithium battery，more safety，continuous working 6 hours.
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Robson Technologies, Inc.
RTI designs and manufactures DUT boards for many types of special purpose test equipment including: ESD test systems, special purpose functional testers, automated curve trace equipment, as well as standard semiconductor test equipment. All designs are performed in-house using PCB design software (Mentor PADS, CAM350) and 3D mechanical design software (Solid Edge) if required. PCB fabrication is sub-contracted to one of our long-time fabrication partners.
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ETS-88RF -
Teradyne, Inc.
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Hangzhou Hopoo Optoelectronics Technology Co., Ltd
This system uses the method of fixing the detector and rotating the lamp under test to measure the light intensity distribution of the light source or lamp under test in all directions in the space. The main shaft and the lamp shaft adopt the conductive slip ring with precious metal fiber point brush structure, which can run 360 degrees continuously without backlash for measurement. There is no need to rotate back and forth to prevent winding and never winding. According to the requirements of the measuring lamps, the system can be configured as a double-column B-β test scheme or a single-column C-γ test scheme. Used for LED lamps (semiconductor lighting), road lamps, floodlights, indoor lamps, outdoor lamps, etc. and LED, energy-saving lamps, fluorescent lamps, incandescent lamps, HID lamps and other light sources of spatial luminosity distribution
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NI
The PXI Digital Pattern Instrument is designed for semiconductor characterization and production test. It provides 32 channels, a voltage range of -2 V to 6 V, a PPMU force voltage range of -2 V to 7 V, up to a 200 Mb/s data rate, and a clock generation rate up to 160 MHz. The module includes Digital Pattern Editor software as well as debugging tools like shmoo, digital scope, viewers for history RAM, pin states, and system status.
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784483-01 -
NI
PXIe, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit—The PXIe-4163 is a high-density source measure unit (SMU). It features 4-quadrant operation with a current resolution of 100 pA and the ability to sample up to 100 kS/s. The module also offers the ability to maximize stability and measurement accuracy with SourceAdapt, which allows you to custom-tune the transient response to match the characteristics of any load. The PXI-4163 is ideal for a broad range of mixed-signal integrated circuits (ICs) in semiconductor production test.
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Time Electronics
Each model in our portable test equipment range is designed for accuracy and reliability, providing high performance and ease of use for applications. Products are used in various lab and field applications across industries such as research and development, semiconductor, and process control. For higher range electrical source and measure we have a series of bench multifunction calibrators and multimeters.
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ESDEMC Technology LLC
Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
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LabXplorer -
DesignSoft, Inc.
LabXplorer turns your desktop, laptop, tablet or smart phone into a powerful, multifunction test and measurement instrument for a wide range of applications. Instruments, whatever you need, are at your fingertips. LabXplorer provides multimeter, oscilloscope, spectrum analyzer, logic analyzer, programmable analog and digital signal generator, impedance analyzer and also measures characteristics of passive electronic components and semiconductor devices.
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778572-36 -
NI
544-Crosspoint, 1-Wire PXI Matrix Switch Module—The PXI‑2536 is a high-density 8x68 PXI matrix switch module that is ideal for routing low-power DC signals in validation test systems of mass produced devices such as semiconductor chips and printed circuit boards (PCBs). Featuring FET relays, the PXI‑2536 offers unlimited mechanical lifetime and switching speeds up to 50,000 crosspoints/s. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
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WT-100 -
Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
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QST4416-FC -
Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST4416-FC is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features facilitates it to test linear & mixed signal IC components which covers a wide range of products like linear, Power management, Opto electronics, digital and mixed signal devices etc.
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SEMulator3D -
Coventor
SEMulator3D® is a powerful 3D semiconductor and MEMS process modeling platform that offers wide ranging technology development capabilities. Based on highly efficient physics-driven voxel modeling technology, SEMulator3D has a unique ability to model complete process flows. Starting from input design data, SEMulator3D follows an integrated process flow description to create the virtual equivalent of the complex 3D structures created in the fab. Because the full integrated process sequence is modeled, SEMulator3D has the ability to predict downstream ramifications of process changes that would otherwise require build-and-test cycles in the fab.
