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kSA Scanning Pyro
For use on Veeco K465i and EPIK700 MOCVD reactors, the kSA Scanning Pyro performs automated temperature mapping in order to measure temperature variations across wafer carriers and wafers. Use it to tune heater zones and optimize process and hardware to achieve higher yields, wafer uniformity and device performance.
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Scanning Electro-chemical Microscope
920D
The scanning electrochemical microscope (SECM) was introduced in 19891 as an instrument that could examine chemistry at high resolution near interfaces. By detecting reactions that occur at a small electrode (the tip) as it is scanned in close proximity to a surface, the SECM can be employed to obtain chemical reactivity images of surfaces and quantitative measurements of reaction rates.
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Scanning Probe Microscopes
attoMICROSCOPY
The mission to create scientific impact has kept attocube at the frontier of cutting edge research instrumentation. Decades of combined experience in all relevant fields, an excellent team, and close cooperations with some of the world’s leading research institutes have evolved into a broad portfolio of high-end cryogenic scanning probe microscopes.
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Universal Scanning Head
CF106
Calmet Smart Calibration Devices
Universal miniature scanning head for detecting (counting) impulses from inductive, LED and LCD energy meters. Additionally it enables counting of manually triggered impulses (Start/Stop push button function). Sometimes (when access is difficult) it is the only way to count pulses from inductive, LED and LCD meters.
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Active Scanning Technology
ZEISS invented scanning in response to the drawbacks of single-point measurement nearly 50 years ago. This game-changing development enables the capture of thousands of data points within just a few seconds for truly reliable tactile quality assurance. It also saves time and money by delivering the high throughput and accurate results that are vital for manufacturing.
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Scanning Acoustic Microscope
Pulse2
This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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3D Scanning Software
Software is a comprehensive component to any advanced metrology system. Combined with laptops and portable equipment, 3D scanning and measurement is now possible virtually anywhere. 3D scanner software plays a critical role in every stage from the creation of a concept design to the manufacturing and inspection of prototypes. Below is a look at some of the Laser Scanner Software and 3D Scanner Software providers and platforms we represent and handle.
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Differential Scanning Calorimeters
Differential Scanning Calorimeters (DSC) measure temperatures and heat flows associated with thermal transitions in a material. Common usage includes investigation, selection, comparison and end-use performance evaluation of materials in research, quality control and production applications. Properties measured by TA Instruments’ DSC techniques include glass transitions, “cold” crystallization, phase changes, melting, crystallization, product stability, cure / cure kinetics, and oxidative stability.
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Imaging Scanning Monochromator
H1034
HORIBA Scientific OEM has developed a high-throughput imaging scanning monochromator based on an aberration-corrected concave holographic grating with low stray light and high efficiency. This proprietary layout with single optics design is ideal for imaging for low-light applications. It features a 3-position external filter wheel, TTL drive electronics, 4-phase stepper motor and associated worm/gear 90:1 ratio mechanism, encoded, aligned and focused at factory.
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Differential Scanning Calorimetry
Nano DSC
The Nano DSC differential scanning calorimeter is designed to characterize the molecular stability of dilute in-solution biomolecules. The Nano DSC obtains data using less sample than competitive designs. Solid-state thermoelectric elements are used to precisely control temperature and a built-in precision linear actuator maintains constant or controlled variable pressure in the cell. Automated, unattended continuous operation with increased sample throughput is achieved with the optional Nano DSC Autosampler.
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Scanning Auger Nanoprobe
PHI 710
The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.
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Scanning XPS/HAXPES Microprobe
PHI Quantes
The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
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3D Scanning System
CyberGage360
Unprecedented combination of speed, accuracy and one-button simplicity for non-contact automated 3D scanning inspection.CyberGage360 dramatically Speeds Up Quality Assurance of Incoming Parts Inspection & In-Process Inspection of components on the manufacturing floor; Lowers Cost of Quality & Speeds Up Product Time-to-Market. Designed for use in general purpose metrology, the CyberGage360 has a range of potential industrial applications from automotive to aerospace to consumer electronics, where high accuracy and high speed throughput are important.
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Scanning XPS Microprobe
PHI VersaProbe III
The PHI VersaProbe III is a highly versatile, multi-technique instrument with PHI’s patented, monochromatic, micro-focused, scanning X-ray source. The instrument offers a true SEM-like ease of operation with superior micro area spectroscopy and excellent large area capabilities. The fully integrated multi-technique platform of the PHI VersaProbe III offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.
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Scanning Electrochemical Systems
The VersaSCAN is a single platform capable of providing spatial resolution to both electrochemical and materials-based measurements. Each VersaSCAN is based on a common high-resolution, long-travel, closed-loop positioning system mounted to a vibration-resistant optical base. Different auxiliary pieces are mounted to the positioning system. These ancillary pieces (e.g., an electrometer, piezo vibration unit, or a laser sensor) provide functionality to the positioning system for different scanning probe experiments. VersaSTAT potentiostats and Signal Recovery Lock-in Amplifiers are integrated via ethernet control to make accurate measurements of these small signals.
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Differential Scanning Calorimeter
DSC-L600
The Differential Scanning Calorimeter (DSC-L600) is a powerful thermal analysis instrument that measures the heat flow of a sample as a function of time or temperature. The DSC-L600 has been designed to be a cost-effective instrument that is well suited for research or QC applications. The instrument communicates with the PC via a RS232/USB connection. The specially designed heat flux plate has demonstrated more than twice the sensitivity than other heat flow type DSC’s on the market. The reproducibility is excellent, and the noise level is virtually unnoticeable due to a precision high gain, low noise differential amplifier
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Scanning XPS Microprobe
PHI Quantera II
The core technology of the PHI Quantera II is PHI’s patented, monochromatic, micro-focused, scanning x-ray source which provides excellent large area and superior micro-area spectroscopy performance. Spectroscopy, depth profiling, and imaging can all be performed over the full range of x-ray beam sizes including the minimum x-ray beam size of less than 7.5 µm. In addition to superior XPS performance characteristics the PHI Quantera II provides two in situ sample parking stations which enables the automated analysis of all three sample platens in a single user defined analysis queue.
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Laser Scanning Microscopes
The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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RAPID SCANNING AUTOCORRELATOR/CROSSCORRELATOR
FR-103HP
The FR-103HP is a compact NL crystal autocorrelator, suitable for moderate and high power lasers (Pav>5mW). It is available with a scan range >60ps (suitable for pulsewidths within 10fs-15ps) and covers a wide range of wavelengths with easily interchangeable plug-in detector modules. The standard FR-103HP provides ‘real-time’ pulsewidth monitoring capability for rep rates down to 1kHz.
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Scanning Electron Microscopy
SEM
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Scanning Magnetic Microscope
Circuit ScanTM 1000
Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Scanning Probe Workstations
M470.
A modular, state-of-the-art instrument allowing users to exploit 9 local electrochemistry techniques.
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Scanning Probe Workstation
Scan range : X&Y = 200 μm; Z = 100 μm• Practical minimum step size : 50 nm with <10 nm resolution• Max scan speed : 200 μm/s• Max discrete data acquisition for line or area scan : 20 points/s• Micrometer macro positioning : 13 mm range – the smallest graduation is 10 μm• Max area scan point density : >4,000,000
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Differential Scanning Calorimeter
SKZ1052B
DSC is designed to determine the inner heat transition relating to temperature and heat flow, it is widely used in the field of polymer development, performance testing & quality control. DSC research and development includes the following field: glass transition temperature, melting point, cold crystallization, crystallization, phase transition, oxidation induction time (OIT).
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Differential Scanning Calorimeter
SKZ1052C-1L
DSC is designed to determine the inner heat transition relating to temperature and heat flow, it is widely used in the field of polymer development, performance testing & quality control. DSC research and development includes the following field: glass transition temperature, melting point, cold crystallization, crystallization, phase transition, oxidation induction time (OIT).
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Differential Scanning Calorimeter
SKZ1052D
DSC is designed to determine the inner heat transition relating to temperature and heat flow, it is widely used in the field of polymer development, performance testing & quality control. DSC research and development includes the following field: glass transition temperature, melting point, cold crystallization, crystallization, phase transition, oxidation induction time (OIT).
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Differential Scanning Calorimeter
SKZ1052C
DSC is designed to determine the inner heat transition relating to temperature and heat flow, it is widely used in the field of polymer development, performance testing & quality control. DSC research and development includes the following field: glass transition temperature, melting point, cold crystallization, crystallization, phase transition, oxidation induction time (OIT).
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Scanning Electron Microscope
SEM
Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Scanning Electrochemical Microscope
VS-SECM (DC And AC)
The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.