Showing results: 826 - 840 of 1161 items found.
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Extech RH550 -
Extech Instruments Corporation
Simultaneously datalog and monitor relative humidity, temperature, and calculated dew point on the Extech RH550. It features live or user-scheduled recording time and programmable Min/Max alarm set points. A built-in stand is included for desktop use, as well as a bracket for wall-mounting. The RH550 also features a field-replaceable probe that can be attached to the monitor or on a 6.5 ft (2 m) cable. This recorder is useful in office buildings, conference rooms, labs, hospitals, cleanrooms, greenhouses, food storage facilities, and more.
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Extech 382097 -
Extech Instruments Corporation
Extech's 382097 is a set of 100A Current Clamp Probes for Models 382095 and 382096 Power Analyzers. This clamp probe set features three probes with a 30 mm (1.2 in) clamp jaw. The 382097 comes with a two year warranty.
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Extech PQ34-12 -
Extech Instruments Corporation
The Extech PQ34-12 is a set of 1200 Amp Current Clamp Probes. For use with the PQ3450 and PQ3470 analyzers. Featuring a 50 mm (2 in) jaw size, this product comes with three current clamp probes and a year warranty.
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Extech PQ3210 -
Extech Instruments Corporation
The Extech PQ3210 is a set of three flexible 1200 Amp flex clamps for the Extech PQ3350 3-Phase Power and Harmonics Analyzer. These probes are 304 mm (12 in) long for wrapping around busbars.
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Extech PQ34-2 -
Extech Instruments Corporation
The Extech PQ34-2 is a set of 200 Amp Current Clamp Probes. Use with the PQ3450 and PQ3470 analyzers. Featuring a 19 mm (0.8 in) jaw size, this product comes with three current clamp probes and a year warranty.
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Extech PQ3120 -
Extech Instruments Corporation
The Extech PQ3120 is a set of 1000 Amp clamp probes (set of 3) for the PQ3350 analyzer. These clamp probes have a 56 mm (2.2 in) jaw size.
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SURFTENS WH 300 -
Optik Elektronik Gerätetechnik GmbH
The leading equipment for professional use in 200 and 300 mm wafer processing in semiconductor technology. SURFTENS WH 300 is equipped with a 3 axis wafer robot, wafer scanner, loadport for 200 and/or 300 mm wafers, fan filter unit, notching system. Suitable for any cleanroom class it features the automatic mapping of contact angles on wafers for up to 25 wafers.New: with SECS/GEM Interface!
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SURFTENS AUTOMATIC -
Optik Elektronik Gerätetechnik GmbH
Automatic measuring instrument for contact angle and free surface energy with motorized pump, automatic drop placement and motorized specimen table (200 x 200) mm.
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72-7715 -
Tenma
Compact handheld thermometer is ideal for a variety of industrial, residential, HVAC and equipment testing applications. It accepts a wide variety of industry standard thermocouple probes and features internal data logging of up to 100 records. Dual inputs allow simultaneous measurement of two separate zones with independent readout or differential (T1-T2) display
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VLSI Standards, Inc.
The Solar Reference Cells consist of a 20 mm x 20 mm monocrystalline silicon Photovoltaic Cell encased in a 92 mm x 70 mm x 16 mm metal enclosure with a protective quartz window and a temperature sensor. Designed for calibrating the irradiance of solar simulators used for testing solar cells and modules.
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Vu-Con System -
James Instruments Inc.
The Vu-Con Analyzer provides the engineer with the sturdiest, most reliable system for impact echo analysis. No moving parts and implementation of the latest microcomputer technology has created a system that is both sophisticated and reliable. The unit comes with a 90 mm (3.5?) by 115 mm (4.5?) graphic display screen that is easily viewed in daylight
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INSPECTOR® ZRK70 -
Camtronics bv
The Inspector® ZRK70 is a multifunctional camera; endlessly rotatable and swerveable. The ZRK70 is thus ultimately suitable for the inspection of inlets and walls of drains and pipelines. The working range is from 110 mm to at least 500 mm!!!
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Cryogenic Ltd.
Adapted MCK model DR inserted into 50 mm 1.6 K300 K VTI VTI cooling power used for condensing stage of DR Versatile solution as the magnet system can also be used with other inserts and measurement probes including He3, heated probes, rotator, VSM etc. Bottom loading DR with options of sample in liquid or sample in vacuum Suitable for use with systems up to 18 T and neutron-scattering split-pair systems
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CIP-1000 -
Advanced Thermal Solutions, Inc.
The CIP-1000, Controllable Isothermal Plate, is a system for providing an isothermal surface that can be precisely temperature-controlled from 10 to 170C with an accuracy of +/- 0.1C. The CIP-1000 features a 75 mm diameter isothermal copper plate whose constant temperature can be raised or lowered both automatically and manually. A three wire RTD sensor and integral PID controller ensure specific, uniform temperature across the entire plate.
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EVG®20 -
EV Group
The EVG 20 offers a fast inspection method, especially for fusion bonded wafers. A live imageof the entire wafer via IR transmission supports void detection down to a radius of 0.5 mm. The infrared inspection system is a perfect match for fusion bonding processes either as the stand-alone EVG 20 tool or as a station in EVG''s integrated bonding systems.