Showing results: 1006 - 1020 of 1903 items found.
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MSOV084A -
Keysight Technologies
8 GHz analog bandwidth (upgradable)4 analog plus 16 digital channels Capture a longer signal trace with up to 80 GSa/s sample rate and 2 Gpts of acquisition memory Get the best signal integrity with the low noise floor (1.04 mVrms at 50 mV/div) and lowest jitter measurement floor (100 fs)See better measurement accuracy with ENOB values in excess of 5.5 and a SFDR exceeding 50 dBC Access the broadest range of jitter, trigger, analysis and protocol tools (featuring Precision Probe)
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MSOV204A -
Keysight Technologies
20 GHz analog bandwidth (upgradable)4 analog plus 16 digital channels Capture a longer signal trace with up to 80 GSa/s sample rate and 2 Gpts of acquisition memory Get the best signal integrity with the low noise floor (1.54 mVrms at 50 mV/div) and lowest jitter measurement floor (100 fs)See better measurement accuracy with ENOB values in excess of 5.5 and a SFDR exceeding 50 dBC Access the broadest range of jitter, trigger, analysis and protocol tools (featuring Precision Probe)
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MSOV254A -
Keysight Technologies
25 GHz analog bandwidth (upgradable)4 analog plus 16 digital channels Capture a longer signal trace with up to 80 GSa/s sample rate and 2 Gpts of acquisition memory Get the best signal integrity with the low noise floor (1.73 mVrms at 50 mV/div) and lowest jitter measurement floor (100 fs)See better measurement accuracy with ENOB values in excess of 5.5 and a SFDR exceeding 50 dBC Access the broadest range of jitter, trigger, analysis and protocol tools (featuring Precision Probe)
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MSOV164A -
Keysight Technologies
16 GHz analog bandwidth (upgradable)4 analog plus 16 digital channels Capture a longer signal trace with up to 80 GSa/s sample rate and 2 Gpts of acquisition memory Get the best signal integrity with the low noise floor (1.32 mVrms at 50 mV/div) and lowest jitter measurement floor (100 fs)See better measurement accuracy with ENOB values in excess of 5.5 and a SFDR exceeding 50 dBC Access the broadest range of jitter, trigger, analysis and protocol tools (featuring Precision Probe)
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MSOV134A -
Keysight Technologies
13 GHz analog bandwidth (upgradable)4 analog plus 16 digital channels Capture a longer signal trace with up to 80 GSa/s sample rate and 2 Gpts of acquisition memory Get the best signal integrity with the low noise floor (1.09 mVrms at 50 mV/div) and lowest jitter measurement floor (100 fs)See better measurement accuracy with ENOB values in excess of 5.5 and a SFDR exceeding 50 dBC Access the broadest range of jitter, trigger, analysis and protocol tools (featuring Precision Probe)
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PXD731x/PXD70xx -
VX Instruments GmbH
The PXD731x High Voltage Waveform Digitizer family features up to two 100MS/s simultaneously sampled input channels with 16Bit resolution, input voltages up to ±250V and a bandwidth up to 50MHz. Every digitizer channel has its own 2MB memory which allows up to 1 million samples. Data can be acquired before and after the trigger event with a programmable sample counter, that controls the number of data points. All PXD731x High Voltage Waveform Digitizer family devices have a high common mode rejection ratio (CMRR).
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EV Group
Increased demand for applications based on thin wafers and thin microelectronic-substrates result in the need for processing and handling of thin- and ultra-thin substrates during the manufacturing step. Thin substrates in the area of IC manufacturing (like memory, CMOS, 3D-TSV integration or ChipCard applications), power devices (e.g. IGBTs), compound semiconductors (e.g. for high brightness LEDs or RF-power amplifiers), as well as emerging technologies that also involve thin or flexible substrates (MEMS; RFID-tags, flexible displays, etc.) require reliable handling and support techniques in order to ensure safe processing.
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STO1000C/E -
Shenzhen Micsig Instruments Co., Ltd.
*Up to 70Mpts memory depth, Zoom into a selected part of the captured waveforms to get more details. *Support serial triggering and decode (I2C, SPI, RS232/UART,CAN, LIN) and Aerospace and defence (MIL-STD 1553, ARINC 429). Two formats to display decoding, text and graphic.
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CloudTesting™ -
Cloud Testing Service, Inc.
All-in-one platform for semiconductor test and measurement Extensive test and measurement library Microcontroller, Memory, Analog and more. CloudTesting™ Service is the test and measurement system that you can build your own environment by selecting and combining Testing IPs. Fees for Testing IPs are paid monthly.
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PK3564 -
Summit Technology, Inc.
PK3564 complete Power Analysis System includes PS3550 Power Analyzer, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, CAS3 hard-shell carrying case, PSM-A Software, and 1-year deluxe warranty.
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I-FullWaver -
IRIS Instruments
The I-FullWaver systems were specifically developed for precise full waveform time domain induced polarisation, Resistivity and self-potential measurements. Each system is fully independent; incorporating its own power source, GPS module and digital memory for up to 3 months continuous recording.
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V-FullWaver -
IRIS Instruments
The V-FullWaver systems were specifically developed for precise full waveform time domain Induced Polarisation, Resistivity and SP measurements. Each system is fully independent; incorporating its own power source, GPS module and digital memory for up to 3 months continuous recording.
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Shenzhen Chuangxin Instruments Co., Ltd.
*Small volume, light weight *Easy to operate, has keyboard lock function *Provide 5 groups memory setting, each group has four kinds of work mode LCD display Voltage gradient rise by time, real-time analysis and look for breakdown point
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CT6904 -
HIOKI E.E. Corp
Hioki pull-through AC/DC current sensors are best-in-class devices for use with power analyzers,, Memory HiCorders and high performance oscilloscopes. The CT6904 is a DC to 4 MHz/500A sensor, ideal for capturing current signals from switching power supplies, inverters, power conditioners, etc.
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QT-8000 Series -
PowerTECH Co,Ltd.
Tester is applicable to regularDC/AC parameter testing and IC device performance testing. Main application: Power Management; Digital Consumer Products; Communication& Interface; Automotive; Energy Conservation electronics; Standard Linear Circuit; Memory; CPU Chips; Special Customized IC and Wafer Test.