Showing results: 5326 - 5340 of 5363 items found.
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Prexa MS -
Tokyo Electron Ltd.
The latest fully automated 300mm wafer prober for memory devices. Featuring high rigidity and exceptional thermal control, the system enables full-wafer contact testing.
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NTS3700 Series -
Novtek Test Systems
FLASH memory endurance cycling systems are used to characterize and qualify the write/erase cycling endurance of FLASH memory devices, and to conduct functional testing of memory devices at extreme temperatures. A typical system consists of an environmental chamber, algorithmic pattern generator, programmable power supplies and system controller.Novtek’s systems can accommodate from 64 to 864 devices for parallel devices and . In addition to FLASH, the systems can also accommodate MRAM, EEPROM, EPROM, PROM (OUM), Mask ROM, SRAM, FeRAM, DRAM, PC Cards (PCMCIA), embedded FLASH microcontrollers and NVM based FPGA. The system's environmental chamber has a range of -55oC to +200oC and is ideal for temperature characterization of memory based devices and packages.
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Environment Associates Inc.
As specialists in dynamic testing, we provide equipment capable of exerting a 6,000 to 40,000 pound force with the capacity to perform closed-loop control from a single input to multiple channel inputs (from 2 to 32) with averaging or notched channel control. Vibration control systems can be programmed for real time monitoring, scheduled for length of time, or level scaled by dB or percentage, or scaled at various durations at different acceleration levels.
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Nautilus WM10-250 -
Teledyne Marine ODI
Trends in subsea oil & gas production are moving towards deeper water and longer step out distances. These trends drive demand for higher power equipment and higher power delivery and distribution capabilities subsea with high pressures and temperatures. Teledyne ODI'™s Nautilus WM10-250 is designed with the benefit of advanced material science testing and certification, and with insulation and redundant sealing systems for reliable performance in long-term harsh environments.
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Environment Associates Inc.
Environment Associates performs high-impact mechanical shock for all grades, classes and types of Navy ship board machinery, equipment, systems and structures. Our lightweight shock machine is approved by the Naval Surface Warfare Center for use in testing the survivability of Navy shipboard equipment to MIL-S-901D on items and fixturing weighing up to a combined 500 lbs.
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McBain Z-NIR Near Infrared Inspection Microscope -
McBain Systems
The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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OBR 4600 -
Luna Innovations Inc.
The Luna OBR 4600 Optical Backscatter Reflectometer (OBR) is a powerful tool for testing and analyzing loss in short-run networks and components. The OBR 4600 is an ultra-high resolution reflectometer that features a spatial sampling resolution of 10 microns, zero dead zone, and backscatter-level sensitivity. The OBR 4600 offers industry leading technology to precisely track loss and polarization states, allowing you to “see inside” your components and systems.
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KOERZIMAT® 1.097 MS -
Foerster Instruments, Incorporated
The KOERZIMAT 1.097 measuring system by FOERSTER facilitates the accurate, automatic, and fast measurement of the weight-specific saturation polarization σs and volume-specific saturation polarization Js. The largely geometry-free measurement is particularly suitable for testing samples with complex shapes. The KOERZIMAT 1.097 MS is used for applications such as controlling the sintering level during hard metal sintering processes and determining the tungsten content dissolved in cobalt as well as the free iron, cobalt, and nickel content in powder / hard metals. The saturation polarization Js in Tesla can also be determined in soft magnetic components of magnetic circuits.
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PI -
MOTOMEA
The MOTOMEA CMM-PI system is intended to be customized to fit specific requirements. Testing procedures use a motor's voltage and current to produce real-time results. Our products are used globally by electric vehicle manufacturers and brands and robotics and home appliance brands
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PXES-2780 -
ADLINK Technology Inc.
The ADLINK PXES-2780 is an 18-slot PXI Express chassis, compliant with PXI Express and cPCI Express specifications and offering one system slot, one system timing slot, ten hybrid peripheral slots, and six PXI Express peripheral slots for a wide variety of testing and measurement applications requiring enhanced bandwidth. The PXES-2780 provides a configurable PCIe switch fabric and is configurable in two-link, and four-link PXI express deployments, with 8 GB/s system bandwidth and up to 4 GB/s slot bandwidth for dedicated peripheral slots, thanks to PCIe gen2 signaling technology.
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ELMA Electronic, Inc.
Taking a new board-level product or system from concept to deliverable requires feature-rich development and testing tools. Elma has a varied selection of system development platforms to help you, from our E-Frame and smaller D-Frame to the L-Frame. Select the right backplane for the architecture you are developing on - CompactPCI, CompactPCI Serial, OpenVPX or SOSA - and either air-cooled or conduction-cooled guides to support the development boards.
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ELMA Electronic, Inc.
Taking a new board level product or system from concept to deliverable requires feature-rich development and testing tools. Elma's wide range of Type 15 (desktop), Type 32 & D-Frame (portable/desktop) and Type 39E (development frame) chassis for VITA and PICMG bus architectures provide the platforms necessary to meet your needs.
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SAT-18C -
Shaanxi Aitelong Technology Co., Ltd
SAT-18C handheld OTDR is the newest instrument designed for testing FTTx network. It is mainly used to measure the physical characteristics of optical fiber, such as the length, the transmission loss and the splice loss etc. It can also locate the faults or breaks of optical fiber. It is widely applied in the manufacture, construction and maintenance in optical fiber communication system.