Showing results: 451 - 465 of 978 items found.
-
AXP 2.0 -
Akrometrix, llc
The TherMoiré® AXP 2.0 is a modular metrology solution that utilizes the shadow moiré measurement technique, combined with automated phase-stepping, to characterize out-of-plane displacement for samples up to 400 mm x 400 mm. With time-temperature profiling capability, the TherMoiré® AXP 2.0 captures a complete history of a sample’s behavior during a user-defined thermal profile.
-
XGT-9000SL -
HORIBA, Ltd.
- Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm- X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure- Mapping area size up to 350 x 350 mm2- <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution- Dual types of detectors for transmission and fluorescent X-rays- Detectable element range down to C with a light element detector and He purge module
-
MM-10A -
High Power Pulse Instruments GmbH
- Pulse unit to generate JESD22-A115 machine-model (MM) waveforms with TLP- Extremely stable and reproducible machine-model (MM) waveforms- Compatible with HPPI TLP-3010C/4010C/8010A/8010Csystems which have installed pulse width of 25 ns and rise time of 100 ps to 300 ps- Up to ±10 A machine-model peak current with TLP-3010C, which is equivalent to ±667 V (MM)- Up to ±15 A machine-model peak current with TLP-4010C, which is equivalent to ±1000 V (MM)- Up to ±30 A machine-model peak current with TLP-8010A and TLP-8010C, which is equivalent to ±2000 V (MM)- Same measurement procedure as TLP including DC test of the DUT- Compatible with HPPI TLP software and waveform data storage and management- 50 Ω SMA input and output connectors- Compact size: 61 mm x 25 mm x 17 mm
-
NCS-200SA -
HenergySolar
Semi-Automatically, non-contact measurement of wafer thickness, TTV ,bow,Point and flatness.Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.the powerful software can test all the data above within several seconds,all the design according to SEMI standard and the ASTM,make sure the data can be easily unify. the system can used for several sample size,like 75 mm, 100 mm, 125 mm, 150 mm, 200 mm
-
PB6800 -
Integrated Technology Corp.
The ITC line of Probilt, probe card analyzers provide fast, accurate and repeatable test data for all types of probe card technologies. Simple user definable vision parameters allow even the newest and most complex probe tip geometries to be captured and accurately measured. Probilt’s PB6800 large measurement chuck allows probe arrays as big as 300 mm in diameter to be touched down without overhanging the chuck surface.
-
2650 -
Sensoray Co., Inc
8 form-C mechanical relays with 240VAC, 2A ratingConnects to an Ethernet through 2601 hub100 mm DIN carrierResponds to interlock and E-stop circuitsWatchdog TimerCompatible with Linux and WindowsUse our design assistant to configure a system and calculate pricing
-
Mini-Mon3 -
Murraypro Electronics
“Touch Latch” selection between 4 input Groups provides Flyaway, Mobile Kit, Edit Suites and CARs with comprehensive and cost effective monitoring facilities. The miniature "Type 19" meter movements that are fitted in this 1 U Unit boast a surprisingly large 42 x 20 mm scale which enables practical viewing at distances in excess of 2. The Movements have a very slightly relaxed specification which closely emulate the full-sized BS 6840 meters, which have now been withdrawn by their Torquay manufacturer. Note that Murraypro’s COMPACT PPM range continues to offer ‘full sized’ PPM metering.
-
NanJing DVP OE TECH CO., LTD
*Find the breakpoint, bending or cracking*Find the fault of OTDR dead zone*Identification of fiber from one end to other end*Universal adaptor*Testing distance up to 8km*Lightweight, red laser output, both SM and MM available
-
NC-80MAP -
NAPSON Corp.
*Possible to measure wide range of sheet resistance by installing Max. 4 probes*Min. 7 mm position from edge can be measured*User programable measurement pattern & programmable measuring pattern
-
Greenlee Tools
*For surface and air/gas temperature measurement*Not suitable for liquids*Measurement range: -40°F to 399°F (-40°C to 204°C)*Probe length: 39.4 IN ±0.2IN (1 m ±5 mm)*Type K thermocouple*Lifetime Limited Warranty
-
Teledyne Labtech
Teledyne Labtech is at the forefront of complex metal-cored PCB design and manufacture. The PCB use a thin metal core <2 mm, which acts as isolation between the RF/Microwave circuit and the Analogue/Digital circuitry and creates an excellent thermal path.The major advantages are reduced size and no need for complex microwave feed-thru's. The ability to laser cut pockets allows the designer engineer to mount the high power MMIC directly on to the metal core.
-
Standard Warp Measuring System -
Optik Elektronik Gerätetechnik GmbH
Optical, non contact measurement of warp and bow of specimen with size up to (1600 x 1200) mm. The system is designed for the contactless, optical measurement of the curvature (Warp) horizontal, coated float glass substrates. For that measurement the heights on different measuring points is evaluated.
-
SURFTENS HL -
Optik Elektronik Gerätetechnik GmbH
Measuring instrument for contact angle and surface free energy, special solution for semiconductor technology for wafers up to 300 mm.
-
ESDdoctor -
Sofics
ESDdoctor consulting service can identify, diagnose, and solve any ESD/EOS problem quickly and definitively, at a surprisingly low entry cost. You can choose testing and diagnosis only, or add ESD design services to the consulting package. ESD, Latch-up testing: HBM (ANSI/ESDA and JEDEC) on packaged dies. MM (ANSI/ESDA and JEDEC) on packaged dies. Latch-up JEDEC on packaged dies TLP on packaged and bare dies.VF-TLP on bare dies.
-
Optical Zonu Corp.
*Transports up to 6 GHz*19 grams, 40 x 18 x 8 mm*Operates from 5 VDC*Supports +20 LNA integration*Remote monitoring via I2C interface*Optional transport down to 1 MHz*CWDM*SMF and MMF support*Up to 36 modules in a 1RU chassis