Showing results: 586 - 600 of 978 items found.
-
Hildebrand Prüf- und Meßtechnik GmbH
The MICRO IRHD SYSTEM provides hardness readings on elastomers according to MICRO IHRD. Recommended specimen thickness is 1 to 5 mm. It complies to international standards such as DIN ISO 48, ISO 48 and ASTM D 1415.
-
MP-265 / MPC-365 -
Sutter Instrument Company
The MP265/M mechanical builds on our existing manipulator line in several ways. First, the narrow format means more manipulators can be grouped around a recording chamber. Next, the narrow format MP-265/M allows a high precision manipulator to be inserted into small spaces in existing setups. Finally, travel in the Y-axis is shortened (12.5 mm) both to economize on width and because radially oriented manipulators do not require long travel in the traverse axis.
-
Geotek Ltd.
The Geotek Multi-Sensor Core Logger (MSCL) systems enable a suite of geophysical measurements to be obtained rapidly, accurately and automatically on sediment or rock cores. The rugged nature of the equipment makes it suitable for use in either an onshore laboratory/repository environment or onboard survey and drilling vessels. All of Geotek’s core loggers accept core between 50 mm and 150 mm in diameter and up to 1.55 m in length. Geological cores and materials come in a variety of sizes therefore the MSCL and X-ray CT systems are designed for a full range of core material in a variety of liner compositions. To accommodate varying customers’ requirements (both operational and scientific), we provide a range of different core loggers and X-ray CT systems:
-
DLAP-201-JT2 -
ADLINK Technology Inc.
*Deep learning acceleration with NVIDIA® Jetson™ TX2*Compact fanless system 148(W)x105(D)x50(H)mm*Wide temperature range from -20°C to 70°C
-
FilmTek 6000 PAR-SE -
Scientific Computing International
Production-proven metrology system for film thickness, refractive index and stress measurement for a broad range of film layers at the 1x nm design node and beyond. Accommodates 200 or 300 mm wafer metrology. Combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry with a wide spectral range to meet the challenging demands associated with multi-patterning and other leading-edge device fabrication techniques.
-
Axiomtek Co., Ltd.
The Nano-ITX form factor is designed as a high integrated native x86 embedded platform, measuring a mere 120 mm x 120 mm which measures in at 50% smaller than the Mini-ITX form factor. The Nano-ITX form factor is available with a rich feature set and is targeted at the fast-emerging embedded markets, allowing developers to highly customize their system designs in the low-profile and fully-configured embedded devices.
-
PCE01 -
TEAM SOLUTIONS, INC.
The Latest PCI Express to ExpressCard34/54 adapter, which supports max 2. 5 Gb/s data transfer rate. The PCE01 accepts both 34mm and 54 mm ExpressCard & allows ExpressCard hot-plug and hot-swap without powering off the system. The PCE01 is quick & easy to install, allowing most ExpressCard devices to be used in any desktop or tower PC with an available PCI-Express plug-in card slot.
-
SE Series -
Nano-View Co. Ltd.
Spectroscopic data measurement– Visible range: 350~840 nm (or 1.5~3.5 eV)– Data acquisition speed: 5 sec for full spectra of {Δ, Ψ}Manually variable angle of incidence– 45°~90° with 5° stepSingle body system– 40 cm (W) × 30 cm (D) × 30 cm (H), 15 kg (typical)* UV- option requires external lamp power supplyEasy operation– No set-up / No keys to control– Low maintenanceUser-friendly software– operation and analysisOther features– Sample stage with tilt & height adjustmentssample size: (5 mm × 5 mm) ~ (200 mm × 200 mm)– Computer with current operating softwareOptions– Mapping stage: manual or automatic– UV-option: 250~840 nm (or 1.5~5.0 eV)
-
YIS 200 -
RMS Vision Systems Inc
The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.
-
OptoScope SC-20 systems -
Optronis GmbH
The SC-20 streak camera system is characterized by its large detection area of 35 mm x 4 mm and a large usable screen diagonal of 40 mm. Signals are mapped onto the fiber optic input window and measured without the need for optical reduction. In the simplest case, the entrance optics consists of a slit mask that lies directly on the entrance window. In addition, a flexible extension with a shutter, a lens mount or an adjustable slot with coupling optics is possible. The time resolution in the sub-nanosecond range qualifies the camera for many applications in detonics and plasma physics.
-
Axiomtek Co., Ltd.
Mini ITX motherboards are designed with rich functionality and reliable performance in a small footprint that measures just 170 x 170 mm. Mini ITX Motherboards provide greater flexibility for applications in which compact size and power-efficiency are required, such as kiosks, POS, lottery machines, gaming systems, factory automation, DSA, and more.
-
MM-10 -
Meyer Sound Laboratories Inc.
Delivering expanded low frequency for applications that require excellent audio quality from a compact system, the MM-10 subwoofer allows system designers to create full-range systems where space limitations are a concern, and are adaptable to complement MM‑4XP and UP-4XP loudspeakers.
-
SX12 ISR1200 -
Teledyne FLIR
The Neutrino SX12 ISR1200 is the inaugural series model. With a 1280×1024/12 µm resolution focal plane array (FPA), a 120 mm to 1,200mm CZ lens, and advanced image processing, it is the ideal OEM camera module for integration into long-range ground ISR, perimeter surveillance, border surveillance, and counter-UAS (CUAS) systems.
-
Acces I/O Products, Inc.
PCIe/104 boards are typically intended for use in small, space-constrained industrial control or vehicles systems. The standard size of these modules is just 3.550 × 3.775 inches (90 × 96 mm).
-
Nexera Mikros -
Shimadzu Corp.
Improvement in the sensitivity of an LC/MS/MS method can generally be achieved by reducing the analytical scale of the analysis. However, reducing the analytical scale significantly to nano-flow reduces the throughput, stability, and robustness as a trade-off for greater sensitivity. Nexera Mikros, a Shimadzu microflow LC/MS system, offers a balanced solution to increased sensitivity with less compromise to throughput and robustness, using flow rates from 1 to 500 μL/min and column I.D. from 0.1 to 1 mm. It achieves stable and sensitive quantitative analysis through robust performance of microflow solvent delivery, optimized ion source design, the unique UF-Link column connection, and system variety that supports a wide range of applications.