Showing results: 61 - 75 of 111 items found.
-
ORTEC
Nuclear Safeguards are measures to verify that States comply with their international obligations not to use nuclear materials (plutonium, uranium and thorium) for nuclear explosives purposes. Global recognition of the need for such verification is reflected in the requirements of the Treaty on the Non-Proliferation of Nuclear Weapons (NPT) for the application of safeguards by the International Atomic Energy Agency (IAEA). Also, the Treaty Establishing the European Atomic Energy Community (the Euratom Treaty) includes requirements for the application of safeguards by the European Commission. Organizations such as the IAEA and EURATOM and others are tasked with ensuring declared amounts of material are indeed present in the facilities in which they are stored and that such material is not being diverted to other uses.
-
CEMS-2000B -
Focused Photonics Inc.
Mercury analyzer applies cold vapor atomic fluorescence technology(CVAFS), integrated with dilution samplingsystem to eliminate interference with background components and ensure reliable performance. Automatic calibration of mercury check with internal CAL-200 calibration gas generator.
-
VLSI Standards, Inc.
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of Electron and Atomic Force Microscopes (AFM). Make the grade, with the highest quality pitch standard of its kind available.
-
AOSense
Rack-mount microwave atomic clock using laser-cooled 87Rb atoms. Production unit target specifications: Allan deviation 2×10-12 @ 1 s, 2×10-14 @ 104 s; flicker floor 1×10-14; absolute accuracy < 1×10-13.
-
NaniteAFM -
Nanosurf
The unparalleled small footprint of the NaniteAFM scan head and its highprecision/quick lock mounting system make it the ideal atomic force microscopefor integration into automated industrial environments. With a resolution below one nanometer, the NaniteAFM is capable of detecting and visualizing even the smallest surface structures.
-
alpha300 Series -
WITec
Alpha300 series consists of advanced Raman, Atomic Force Microscopy (AFM) and Scanning Near-field Optical Microscopy (SNOM) imaging systems. Its sophisticated design ensures exceptionally high-throughput and sensitivity. A unique modularity allows for single-technique solutions as well as correlative imaging configurations.
-
VLSI Standards, Inc.
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
-
VLSI Standards, Inc.
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
-
NEX CG II -
Applied Rigaku Technologies, Inc
NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
-
Dimension FastScan Bio -
Bruker Optics
The Dimension FastScan Bio Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.
-
IQRB-2 -
IQD Frequency Products Ltd
The IQRB-2 low noise rubidium oscillator is a sub-miniature atomic oscillator combined with 'active noise filter' technology. This rubidium oscillator has 100 times less drift than OCXOs and with short term stability of 0.002ppb/s at 100s this rubidium oscillator provides significant improvements in performance over other rubidium components.
-
Dimension AFP -
Bruker Optics
The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
-
Quartzlock (UK) Ltd.
Our range of atomic / rubidium disciplined time and frequency standards in a variety of enclosures and sizes to suit all appliations. These acurate time and frequency references are used in telecoms, aviation, nautical and precision test and measurement enviroments.
-
Quartzlock (UK) Ltd.
Our range of atomic / rubidium disciplined time and frequency standards in a variety of enclosures and sizes to suit all appliations. These acurate time and frequency references are used in telecoms, aviation, nautical and precision test and measurement enviroments.
-
MK52 Series -
Kinetic Systems, Inc.
Providing Ultra-Low Frequency levels, the MK52 Series offers the ultimate low natural frequency performance for a wide range of high resolution instruments, such as analytical balances, cell injection, confocal microscopes, patch clamping, optical microscopes, wafer probing, sensor calibration, atomic force microscopes and other sensitive equipment requiring high isolation efficiency.