Showing results: 5071 - 5085 of 5178 items found.
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Focus-2005 -
Kyoritsu Testsystem Co., Ltd.
As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)Short/Open checker for semiconductor sensor device.It is possible to measure two kinds of measurements which are constant voltage biased current measurement and constant current biased voltage measurement. User can set the threshold of 10 ranks. （auto measurement）Only device can be measured. It is also possible to fabricate the test fixture.Various devices can be measured by replacing the socket board.It is no need to generate complex test programs as reference values are calculated from good device.It can be expanded by adding multiplexer boards which are 128pins per one board.(MAX 2048pins)
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ACMAS Technologies Pvt. Ltd.
The rain water or moisture penetrating through a leak in the case, can often reach into the circuit board and lead to failure of the equipment. This problem is frequently encountered with external equipments and devices during storage, usage or transportation in a rainy weather. Therefore, the automotive industries and various research and developmental units often use Rain Test Chambers to test the quality and performance of the product in such extreme environments.Weiber's Rain Test Chambers are such Rain Testing Machines/Chambers used for the testing of automobiles, electronic parts and components, light equipments, voltage cabinets and other wide variety of products under a rainy environment. These IP Test Chamber and IP Testing Chambers are designed to simulate specific environmental conditions, mimicking a natural rainy weather, to test the seals and water proofing capacity of the equipment and devices, thereby providing an estimation of the product performance over a period of time.
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ACMAS Technologies Pvt. Ltd.
Xenon is one of the noble gases and is a major component of arc lamps and flash lamp and it also has its importance in general anesthetics. One of the major applications of xenon lamp is that it can be used in research applications to simulate the sunlight.Weiber walk in xenon lamp chamber uses xenon lamp to simulate the whole sunlight spectrum that can produce many destructive effects on the products. This simulation environment provided in the chamber is used to test the resistance of various manufactured products towards these destructive conditions. This chamber is used for quality control, product development and scientific researches and many more. With a variety of models and options, you can customize your chamber to fit your testing needs. With walk in option you have a facility to test your product in bulk quantity and even for the products which are larger in size. This chamber also known as Uv Test Chamber and Xenon Lamp Weather Resistance Test Chamber.
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Protocol Manager™ Software -
Teledyne LABS
Teledyne LABS helps ensure the world’s pharmaceuticals are pure, safe, and effective by manufacturing instruments that set the global standard for quality, innovation, and long-term value. Software and software management play a large role in making sure those systems run as they should, and providing results that can be quickly analyzed and acted upon. Hanson software does so effectively and intuitively.Pharmaceutical research, manufacturing, and QC labs running Teledyne LABS Vision and/or CD14 dissolution testers can now manage users, methods, and instruments more efficiently than ever before. Our Protocol Manager software eliminates all instrument-based connectivity and storage limits by connecting your Hanson systems to a centralized protocol database on a Windows® client/server operating system. The spacious, easy-to-use, desktop interface provides drag-and-drop simplicity and increased support for 21 CFR Part 11 compliance.
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Inframet
Surveillance cameras based on CCD/CMOS/ ICCD/ EMCCD/EBAPS imaging sensors sensitive in visible and near infrared range are widely used in many long range surveillance applications as independent imagers or as part of a bigger multi-sensor surveillance systems. Majority of VIS-NIR cameras are used for day level applications but an increasing number of these cameras is used to enable surveillance in both night and day conditions. In both cases it is important to verify performance of these cameras under varying illumination conditions from very dark nights to ultra bright days. Important missions can fail due to too low sensitivity of VIS-NIR cameras at night conditions (dark, noisy images) or due to too low dynamic at ultra bright day conditions (saturated, blurred images). Next, it is important to use VIS-NIR cameras that generate high quality images in order to achieve maximal effective surveillance ranges.
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Lambient Technologies
Organizations working on new thermosets or new thermoset formulations need an intimate understanding of how these materials cure before they can proceed to the next step in the research, quality control, or production process. What happens when the material is heated? When is the best time to apply pressure to squeeze out voids? How fast does the material react at 120C? 150C? 180C? Most organizations today address this need by curing a sample for an arbitrary amount of time before using inexact, error-prone manual methods, or complex thermal analytical instruments to test cure state. Maybe the sample has reached the end of cure, but maybe not. With traditional methods, it’s difficult to tell for sure. How can organizations determine whether they’re processing materials longer than necessary? Dielectric cure monitoring lets them know for sure.
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MS 1534 -
Meltronics Systemtech
The Inverterless ATE is an automatic test equipment which is used to test the all functional and various test conditions of Inverterless Solar Unit. This ATE shall be a GO/NOGO Tester for Inverterless Solar Unit. All production units can be tested with this ATE for functional testing and clearance. This ATE reduces the man effort for quality checks and detects the failure units. The Inverterless ATE can check the UUT with minimum user interactions. It shall test and generate test report in PDF format for the conducted tests with necessary data. The ATE operates on 230V AC power. The ATE has In-Built AC-DC converter which provides 12V DC for operate the unit. Also it has additional AC-DC converter to simulate solar power to the Inverterless units. The main objective of the ATE is to test the Inverterless S in all possible test scenarios without external test equipments and less user interactions.
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NI
The C Series Current Input Module features programmable input ranges, variable connectivity options, and built-in noise rejection. You can also choose from options with built-in anti-aliasing filters or high-channel density to reduce the number of modules needed. The C Series Current Input Module supports safety features, certifications, input ranges, overvoltage ranges, and connectivity for applications such as power quality monitoring and metering, utility pole-mounted smart switches, utility pole-mounted smart grid reclosers, substation merging units, industrial machine measurements, health monitoring, predictive maintenance and prognostics, and phasor measurement units (PMUs). The C Series Current Input Module includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.
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BVM-5006 -
BYC Industrial Ltd
BVM-5006 Electric 3D Microscope features the quality optical system, high resolution, large field of view, high zoom ratio, novel design and one-up technology, easy and automatic operations. Includes: Motorized zooming, motorized observation angle for changing and optional motorized focusing. The speed can be adjusted while changing observation angle. With the angle attachment, the microscope can realize 3D image effects for observing the components and deep holes. The LED lights can generate high brightness. Theoretically the service life of LED lights can reach 20,000 hours. The LED lights with area control function can illuminate from different angles for convenient multi-angle inspections. The M-N3D Microscope can be widely used in micro-electronics, automated monitoring and testing industries. By selecting the appropriate objectives and video couplers, different magnification, field of view and depth of field can be acquired. Digital and Analog video systems can meet the different users' demands.
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Precise Time and Frequency, Inc.
The ptf 1208A (transmitter) and ptf 1209A (receiver) provide a convenient and simple way to transmit high quality RF signals over long distances, without the concerns associated with electrical interference and pick-up.The ptf 1208A accepts an RF input in the range from 1kHz up to greater than 10MHz and provides a combination of 8 local, high isolation, RF distribution outputs and 4 optical transmission outputs for distances up to 2 kilometers.The ptf 1209A accepts an optical input (transmitted from the ptf 1208A) and provides 12 local RF outputs, either digital (TTL into 50 ohms) or low noise sine wave signals driving 1V rms into 50 ohms (with the PLL option), or both.These systems are especially designed to accommodate IRIG B DCLS, 1PPS and other RF signals in the range from 1kHz to 20MHz.The modular construction allows for a variety of input/output configurations to provide a fully tailored application solution.
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CB50 -
CAMI Research Inc. (CableEye®)
Populated with precision resistors, it allows users to determine empirically whether the tester requires calibration. The CB50 may be used on all CableEye models. The CB50 is intended for periodic verification of tester calibration. To ensure that resistance measurements remain accurate, CAMI recommends yearly calibration. However, depending on environmental conditions and usage, testers may need calibrating more or less frequently. Certain components within models M3U, M3UH, HVX, and HVX-21 (i.e. those capable of measuring resistance) are analog components whose characteristics change slightly over time. This aging is a natural phenomenon common to all electronic components and may cause resistance measurements or gradually deviate from normal. A tester that is out of calibration will give inaccurate results. Some (maybe all) resistance measurements will be incorrect. Consequently, it may Pass what should Fail and, conversely, Fail what should Pass. In other words product yield will be contaminated due to unreliable quality.
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AFM-8A -
Chuan Sheng Electronics Co., Ltd.
AFM-8A has Developed for AFC*(Auto Frequency Control) high performance measurement and frequency update, its update up quickeer than 100mSec. multifunction power analyzer provides high-accuracy measurement and is designed for single phase and three phase application. It includes 4 Digital inputs, 4 Relay outputs, and a RS-485 Modbus RTU Communication port. The user can choose one more communication port, and 2 Analog outputs for output expansion.It provides measure voltage and current of the 2~63 harmonic, and it shows CO2 emissions, which is suitable for power monitoring, management and analyze power quality. It has TOU (time-of-use) function and 4MB Flash memory capacity, allowing users to record data for a long time. It also has a software line adjustment function to reduce the on-site line adjustment work.It has the functions of waveform capture and recording, power record, and event record, which can be used for multifunction power analyzer.
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8130A -
TSI Inc.
The Automated Filter Tester Model 8130A continues to be the best solution for testing particulate respirator filters, disposable filtering face pieces, and a wide assortment of filter media. The TSI filter testers have been used in quality control and manufacturing by leading filter and filter media manufacturers and test centers around the world for more than 20 years. Based on TSI's established model 8130, the world's most-used filter tester, model 8130A now offers higher sensitivity and resolution - up to 99.9999 percent efficiency - at a lower cost of ownership due to the new serviceable photometers inside. The model 8130A features a high degree of automation and self-diagnostics that greatly simplifies operation, increases throughput, and improves overall measurement performance. Whether looking for a stand-alone tester to check a few filters per day or need to integrate a tester in an automated, high-volume production line, the model 8130A is up to the challenge.
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ImpactQA
The use of DevOps testing practices is aimed at bringing improved collaboration across teams and better changes in business response rate. ImpactQA follows an extensive skill set for structuring the right QA capabilities for DevOps. We are living in a fast-paced environment which comes with a shorter testing window. The inclusion of shift-left approach and an efficient team of development engineers permit quicker testing execution and improved code quality. Our continuous testing and crowd testing techniques are powerful testing methods that assist in upholding a DevOps environment within an enterprise. At ImpactQA, we deploy a systemized arrangement that regulates better time-to-market via DevOps testing solutions. Our motto is to bring augmented operational efficiency that is motivated through our DevOps testing professionals with their far-reaching expertise in Continuous Integration (CI) testing & Continuous Deployment (CD). We offer end-to-end automated solutions for sustaining Continuous Testing (CT) that functions with CI & CD tool
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TLP-3010C -
High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±8 kV*High pulse output current up to ±30 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components
