- Virginia Panel Corporation
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ITA, I2 Micro ICon, 120/12 Position Hybrid
410130104
The i2 Micro iCon ITA is capable of holding up to 120 QuadraPaddle contacts and up to 12 Micro Power or Micro Coax contacts. Its sleek, 0.8” footprint increases the horizontal stackability. The 30 degree U-shaped cable clamp allows ITA modules to be pre-wired before assembly and can hold cable bundles with an oblong bushing effective diameter of 0.77 in. The removable cover allows easy access to wiring for maintenance and probing. Integrated spring locking tabs ensure even and secure engagement.
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Probing Adaptors
Accessories primarily enable the connection between an industry standard logic analyzer footprint (D-Max, Mictor, P6860, etc) and an instrument probe. For example, a connection between a D-Max footprint and the digital channels of an MSO (Mixes Signal Oscilloscope). They can also enable the interconnect of a probe to a different industry standard footprint. Adding flying leads to a probe designed for a mictor footprint and a probe tester are also some of the accessories that are available.
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Probing Machines
Probing machine is a wafer transfer and positioning device used for testing the electrical characteristics of chips formed on wafers. This wafer test is used to sort out good and defective chips.
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Probing Solutions
High Power Pulse Instruments GmbH
Probing Solutions and Probe Arms by HPPI GmbH
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Probing Solutions
ES62X-CMPS
The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.
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Stack Probing Sensor
L722
The Model L722 Stack Probing Sensor coupled with the L612 Digital Recording Moisture Meter makes it easy to reach deep into stickered units of lumber and take accurate moisture readings without the danger of broken pins. Wagner''s electromagnetic wave technology makes it possible to take multiple readings throughout an entire stack in just minutes.
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Magnetic Probing Systems
MPS-C-300 and MPS-C-350
MicroXact’s truly unique patent-pending design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate test and measurement.
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Vacuum Probing Systems
Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the Vacuum Probing System. All key modules are interchangeable and upgradeable.
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Wafer Probing Machine
UF3000EX-e
Wafer Probe Station is used in connection with test system in Wafer Test process.It is a device to move wafer automatically to examine fair quality of individual chip on the wafer. Probe Station is seperated depending on purpose. For analysis, for mass production as well as manual, semi-automatic, full-automatic.
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Probing & Analysis Adapters
No matter how well designed a circuit is, there is almost always a need to hook up test instruments to it to verify function, look for bugs, or baseline performance. As IC packages become smaller and pin counts grow this becomes harder and harder. probing adapters are required to alleviate this de-bug problem. Many different types of adapters fall into the test and debug category. The common feature is that they bring the signals of an IC out to a format that is easy to interface with test and analysis equipment.
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Probing, Monitoring & Setting
Marposs offers solutions and equipment that make your machine tool an instrument of unprecedented precision, productivity and reliability. Touch probes and laser-based tool setters hold the cutting process accuracy in check. Our balancing actuators and many dedicated sensors guarantee that your machine tool's functional processes never deviate from their specified set points.
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Auxiliary Equipment For Probing Machines
We have a lineup of products that support the probing process.
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CMM Contact Measurement (Probing)
A method of collecting single points relative to each other in small or large volumes. This information can then be used for evaluation, inspection, layout or basic geometric reverse engineering. For capturing localized or small volume information, digitizing or articulating arms are ideal. For larger volumetric projects, optical solutions like laser trackers and photogrammetry CMMs perform best.
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Robotic Probing of Circuit Cards
System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
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Portable Manual Probing Station
Model W4.0 x L6.5
This portable manual probing station is designed for a versatile, comfortable, and accurate operation on up to 4.0” wafers or 4.0” X 6.5” printed circuit board assemblies. This turn-key, manually operated probing station, model W4.0 x L6.5, is part of the D-COAX commitment to the test and measurement and PCB fabrication industries.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Topside Probing for Functional Test Fixtures
Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.
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Topside Probing In-Circuit Test Fixtures
Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.Today’s fifth generation Pneumatic drive supports as many as 8,000 test probes with centerline spacing to 25mil, and contacting test pads as small as 0.014″.
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Gold Probes
4900 Series
The "GOLD PROBE" has been designed specifically for use with Tektronix, Hewlett Packard and other high performance oscilloscopes. This new slim design along with a host of versatile accessories, allows you to reach the most difficult test point in today's highly complex circuitry. The gold plated Probe Tips, Sprung Hook, Ground Lead, Alligator Tip and other critical interconnect points within the Gold Probe, provide excellent contacts for probing low level analog signals and high speed digital data. Unlike most "off shore" commodity probes, Probe Master guarantees quality and continuing domestic support for our "Made in America" Gold Probe.
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Grypper
Grypper
*Package-size PCB footprint: Since the PCB footprint of Grypper is identical to or smaller than the IC package, only one PCB design is required, enabling a seamless transition from test and validation through production and reducing overall cost of test*No lid required: The package snaps directly without a lid, enabling easy probing, scoping and troubleshooting the topside of the device*Excellent signal performance: A short signal path achieves low inductance and low insertion loss, providing a nearly invisible electrical connection
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Grypper G80 / G80 LIF
*Package-size PCB footprint: Since the PCB footprint of G80 is identical to the package, only one PCB design is required, enabling a seamless transition from test and validation through production and reducing overall cost of test*Low insertion force: Unique contact design reduces the insertion force required to insert and retain higher-ball-count packages safely and securely within the test socket*No lid required: The package snaps directly without a lid, enabling easy probing, scoping and troubleshooting the topside of the device*Excellent signal performance: A short signal path achieves low inductance and low insertion loss, providing a nearly invisible electrical connection
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Heavy-Duty Continuity Tester
TE6-0710
Hangzhou Tonny Electric & Tools Co., Ltd.
*Designed to test circuits while power is OFF*2- 1.5V Button cell batteries included. *Durable ABS housing.*High-quality materials for long-lasting durability.*Sharp tip for probing circuits.*Electrical Multi-Testers for almost any automotive repair on all 6, 12 , 24 and 48 volt systems.*Suitable for a broad range of household, car, trucks, boats, trailers, vans, motorcycles, industrial and commercial uses
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High Frequency/Microwave
SemiProbe high frequency probing solutions provide a broad array of capabilities for measurements ranging from DC to over 300 GHz. We design PS4L systems for high frequency applications with carefully selected components including chucks, probe arms, probes, cables, tuner modules, and calibration suites that are optimized for the frequency range that the application will operate in.
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High-Frequency Probe, 300 kHz to 3 GHz
85024A
85024A high-frequency probe makes it easy to perform in-circuit measurements. An input capacitance of only 0.7 pF shunted by 1 megohm of resistance permits high frequency probing without adversely loading the circuit under test. Excellent frequency response and unity gain guarantee high accuracy in swept measurements with this probe. High probe sensitivity and low distortion levels allow measurements to be made while taking advantage of the full dynamic range of RF analyzers.
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High Impedance Active Probes
7
Designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes. The Model 7 consists of a flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms in order to avoid undesirable reflections. A special miniature connector receives replacement coaxial probe tips that provide a shielded environment to within 3 mm of the fine tungsten probe point, thus minimizing capacitive coupling to other parts of the circuit. The replaceable coaxial probe tips are offered in various point sizes and can also be bent to any shape in order to accommodate a variety of probing geometries.
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High Impedance Active Probes
18C & 19C
High impedance probes, PICOPROBE® MODEL 18C and MODEL 19C, combine the most advanced MOS and bipolar technologies with special, low capacitance packaging techniques to achieve truly remarkable electronic measurement capabilities. While being manufactured each instrument is individually optimized for the best possible performance. The extremely low input capacitance, high input impedance, and almost negligible input leakage current permits the direct probing of even the most sensitive MOS dynamic nodes. At the same time, the full dc capability of this Picoprobe coupled with the high speed capability permits the full characterization of circuits.
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High Power Probe System Solutions
MPI Advanced Semiconductor Test
MPI high power probing solutions offer variety of probing systems which include manual, automated and fully-automated versions to provide solution for different budgets and specific requirements.
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High Voltage Isolator for Logic Analyzers
LX-08
The LX-08 series of high voltage logic analyzer adapters provides a safe isolated method of measuring high voltage control signals with a low voltage logic analyzer. All inbound signals are optically isolated and attenuated to a safe level for the delicate inputs typically found on logic analyzers. The inputs on the LX-08 are capable of withstanding voltages up to +/- 300V AC/DC, higher voltage configurations are available upon request. Rather than probing with multiple neon screwdrivers, the...show more -
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High Voltage Passive Probes
The PPE6KV-A and HVP120 can handle up to 6000 Vpeak transient overvoltages and are designed for probing up to 2000 Vrms and 1000 Vrms respectively. Fast rise times, excellent frequency response, and a variety of standard accessories make these probes safe and ideal for high voltage measurement applications
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High Volume / Double-Side Applications
APS 80D
Simultaneous, double-sided probing of up to 8" wafersPowerful, user-friendly control and monitoring softwarePlanarization of needle sets and constant preset needle loadPattern recognition systemRobot handling systemConfigurable to voltages in excess of 5 kV for specialized applications
