Memory Device
directly accessible computer's internal or main memory.
See Also: Memory, Memory Test, DDR, NAND, DRAM, RAM, ROM, Memory Testers, DUT
- TEAM SOLUTIONS, INC.
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IEEE-488 GPIB Device Interface IC (Chip) for the PCI-Bus
GPIB-72120
The i72120 GPIB-Chip is the ideal solution to implement a IEEE488.2 GPIB interface for next generation PCI based instruments. The GPIB-ASIC is designed to meet all of the functional requirements for talker and listener (TL) devices as specified by the IEEE Standards 488.1-1987 and 488.2-1987. Connected between the PCI bus and the GPIB, this GPIB-IC provides high-level management of the GPIB to unburden the processor and to simplify both hardware and software design. The i72120 is fully compatible with the PCI specification and requires only the addition of bus driver/receiver components to implement a talker/listener GPIB interface.
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Memory Device Tester
T5822
Wafer-level testing of DRAMs, NAND devices and other non-volatile memories used throughout portable electronic devices. The T5822 is designed to provide manufacturers of multiple memory devices with cost efficiency and optimal functionality, including full test coverage of as many as 1,536 devices in parallel with data transfer rates up to 1.2 gigabits per second (Gbps).
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Memory
Renesas is renowned for its product lifetimes, and our memory products are no different. Our wide range of low power SRAM products provide high reliability, stable supply and long lifetime support often not found in these devices, making them ideal for industrial designs. Renesas’ ultra-fast QDR™ (Quad Data Rate) SRAMs are ideal for next-generation high bandwidth communication systems that require memories capable of very high operating frequencies combined with low latencies and full cycle utilization. Our EEPROM realizes high speed, low power consumption and a high level of reliability by employing advanced MONOS memory technology, a CMOS process and low voltage circuitry technology.
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Memory
Renesas offers MIL-STD-883-compliant CMOS random access memory (RAM) and CMOS programmable read-only memory (PROM) devices that are that are qualified to QML Class Q military standards.
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Ultra-high Performance Solution for Memory Device Test
Magnum EPIC
Teradyne’s Magnum EPIC is a high-performance test solution for latest generation DRAM devices. These devices are key enablers for technologies like 5G, AI, cloud computing, autonomous vehicles, AR/VR and applications with high definition graphics.
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Memory Module
Advantech Memory module and DRAM modules offer an extensive portfolio of industrial grade memory, like un-buffered DIMMs, LONG-DIMM and SO-DIMM which are designed according to the latest JEDEC standards and cover all technologies from DDR to DDR3 memory in wide temp ranges (-40 to 85C). Advantech Memory module and DRAM modules'' synchronous design allows precise cycle control with the use of system clock. I/O data transactions are possible on both edges of DQS. Range of operation frequencies, and programmable latencies allow the same device to be useful for a variety of high bandwidth, high performance memory system applications.
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Memory Products
The electronic systems we use today require some form of memory for data and software storage. As a leading supplier of high-quality memory products, we offer a broad portfolio of serial EEPROM, serial EERAM, parallel EEPROM, OTP EPROM, serial Flash, parallel Flash, serial SRAM, NVSRAM, and CryptoMemory® security ICs to meet your memory needs. We also offer the industry’s first commercially available serial memory controller for use in high-performance data center computing applicatio...show more -
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Memory Test Software
Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell...show more -
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wi...show more -
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Memory Test Systems
T5503HS2
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Semiconductor Memory Tester
T5851
Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well a...show more -
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Flash Memory Test System
T5830
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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High-Speed Memory Test Solution
UltraFLEX-M
The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
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Oscilloscope Device
Oscilloscope Devices are flexible, software‐defined instruments that are versatile enough for both time‐ and frequency‐domain measurements and are offered in industry-standard form factors like PCI and USB. They feature up to eight channels that can sample at speeds up to 2 GS/s. The devices also feature numerous triggering modes, deep onboard memory, and driver software API that includes data streaming and analysis functions.
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Data Logging Device
E84 DLD
Finally the solution every field technician and equipment owner needs to quickly locate and resolve signal anomalies, dropouts and glitches that cause E84 handoffs to fail. This next generation recording device is a small self-contained unit that inserts between the passive equipment and PI/O transceiver to capture and write E84 handshakes to its non-volatile memory.
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LIN Interface Device
LIN Interface Devices are bus interfaces for developing applications with the NI-XNET driver. The NI-XNET device-driven DMA engine couples the LIN bus to host memory to minimize message latency. You can import, edit, and use signals from LDF databases in integrated LIN databases. LIN Interface Devices work well for applications requiring real-time, high-speed manipulation of many LIN frames and signals, such as hardware-in-the-loop simulation, rapid control prototyping, bus monitoring, and automation control.
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External Data Storage Devices
External data storage devices can be used for redundant data storage, additional data storage, or convenient data retrieval from the field. These devices use a variety of technologies, including USB, flash memory, CompactFlash, and microSD.
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Flash Device Test System
MS7208
The MS7208 system can test a wide range of device families including – but not limited to – NAND flash, NOR flash, multi-level flash, multi-die flash, EEPROM, RAM, and mixed-technology memory devices.
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PCI-5922, 24-Bit, Flexible Resolution PCI Oscilloscope Device
779659-03
24-Bit, Flexible Resolution PCI Oscilloscope Device - The PCI‑5922 high resolution oscilloscope device features a flexible measurement resolution range up to 24 bits and up to 15 MS/s rates. This oscilloscope device has flexible settings for coupling, and voltage range, as well as a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. The PCI‑5922 is capable of taking extremely resolute and accurate analog measurements. It is ideal for audio signals, spectrum analysis, and any other small, accurate signal measurements.
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PCI-5922, 24-Bit, Flexible Resolution PCI Oscilloscope Device
779659-01
24-Bit, Flexible Resolution PCI Oscilloscope Device - The PCI‑5922 high resolution oscilloscope device features a flexible measurement resolution range up to 24 bits and up to 15 MS/s rates. This oscilloscope device has flexible settings for coupling, and voltage range, as well as a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. The PCI‑5922 is capable of taking extremely resolute and accurate analog measurements. It is ideal for audio signals, spectrum analysis, and any other small, accurate signal measurements.
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PCI-5922, 24-Bit, Flexible Resolution PCI Oscilloscope Device
779659-02
24-Bit, Flexible Resolution PCI Oscilloscope Device - The PCI‑5922 high resolution oscilloscope device features a flexible measurement resolution range up to 24 bits and up to 15 MS/s rates. This oscilloscope device has flexible settings for coupling, and voltage range, as well as a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. The PCI‑5922 is capable of taking extremely resolute and accurate analog measurements. It is ideal for audio signals, spectrum analysis, and any other small, accurate signal measurements.
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PCI-5105, 8‐Channel, 12-Bit, 60 MHz Bandwidth PCI Oscilloscope Device
779686-02
8‐Channel, 12-Bit, 60 MHz Bandwidth PCI Oscilloscope Device—The PCI‑5105 high-density oscilloscope device has eight simultaneously-sampled channels with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with many channels that require up to 60 MS/s or 60 MHz of analog bandwidth.
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PCI-5105, 8‐Channel, 12-Bit, 60 MHz Bandwidth PCI Oscilloscope Device
779686-03
8‐Channel, 12-Bit, 60 MHz Bandwidth PCI Oscilloscope Device—The PCI‑5105 high-density oscilloscope device has eight simultaneously-sampled channels with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with many channels that require up to 60 MS/s or 60 MHz of analog bandwidth.
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PCI-5105, 8‐Channel, 12-Bit, 60 MHz Bandwidth PCI Oscilloscope Device
779686-01
8‐Channel, 12-Bit, 60 MHz Bandwidth PCI Oscilloscope Device—The PCI‑5105 high-density oscilloscope device has eight simultaneously-sampled channels with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with many channels that require up to 60 MS/s or 60 MHz of analog bandwidth.
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PCI-5122, 100 MHz Bandwidth, 100 MS/s, 14-Bit PCI Oscilloscope Device
778758-02
100 MHz Bandwidth, 100 MS/s, 14-Bit PCI Oscilloscope Device—The PCI‑5122 high-resolution oscilloscope device has two channels with greater than 75 dBc spurious‑free dynamic range (SFDR) and flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for both time-domain and frequency-domain applications that require high-resolution, low-noise measurements with up to 100 MS/s and 100 MHz of analog bandwidth.
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PCI-5122, 100 MHz Bandwidth, 100 MS/s, 14-Bit PCI Oscilloscope Device
778758-03
100 MHz Bandwidth, 100 MS/s, 14-Bit PCI Oscilloscope Device—The PCI‑5122 high-resolution oscilloscope device has two channels with greater than 75 dBc spurious‑free dynamic range (SFDR) and flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for both time-domain and frequency-domain applications that require high-resolution, low-noise measurements with up to 100 MS/s and 100 MHz of analog bandwidth.
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PCI-5122, 100 MHz Bandwidth, 100 MS/s, 14-Bit PCI Oscilloscope Device
778758-01
100 MHz Bandwidth, 100 MS/s, 14-Bit PCI Oscilloscope Device—The PCI‑5122 high-resolution oscilloscope device has two channels with greater than 75 dBc spurious‑free dynamic range (SFDR) and flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for both time-domain and frequency-domain applications that require high-resolution, low-noise measurements with up to 100 MS/s and 100 MHz of analog bandwidth.
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PCI-5124 , 150 MHz Bandwidth, 200 MS/s, 12-Bit PCI Oscilloscope Device
779171-02
150 MHz Bandwidth, 200 MS/s, 12-Bit PCI Oscilloscope Device—The PCI-5124 high-resolution oscilloscope device has two channels that sample up to 200 MS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for both time-domain and frequency-domain applications that require high-resolution measurements with up to 150 MHz of analog bandwidth.
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PCI-5124 , 150 MHz Bandwidth, 200 MS/s, 12-Bit PCI Oscilloscope Device
779171-03
150 MHz Bandwidth, 200 MS/s, 12-Bit PCI Oscilloscope Device—The PCI-5124 high-resolution oscilloscope device has two channels that sample up to 200 MS/s with flexible settings for coupling, impedance, voltage range, and filtering. Oscilloscope devices also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for both time-domain and frequency-domain applications that require high-resolution measurements with up to 150 MHz of analog bandwidth.
