Showing results: 1 - 15 of 103 items found.
-
23005 -
Norland Products, Inc.
The unique design of the splice accommodates either 125um or 140um fiber and any size buffer up to 900um. The precision made splice holder firmly holds the pigtail in position without causing stress on the fiber. The low viscosity index matching liquid has an indefinite shelf life and allows for an easy glide of the bare fiber into the splice. Within seconds, a fiber acceptance reading can be made with an OTDR or test set. Low loss with minimum back reflection can easily be achieved for more accurate signatures. Other applications for this kit: splice training aids, bare fiber adapters, and temporary splicing.
-
TA-65 -
Tech-Aid Products
DGS-65 Customer Acceptance Panel for both testing and trouble- shooting. We have added an option to the panel that allows you to select an analog slaving meter or the LED monitor lights as shown in the maintenance manual Fig. 5-14. The addition of the meter provides the technician with a more visible means to monitor the slaving "trend". The 50 pin DG connector is broken out on the panel to assist in monitoring or isolating unit signals.
-
NetOp -
Rohde & Schwarz GmbH & Co. KG
R&S®NetOp is the leading platform for network operator device acceptance test, covering all leading tier 1 operators.As one-stop shop for Protocol, IMS, Data Performance, E911 GNSS the supported carriers include:North America: AT&T, Verizon Wireless, T-Mobile USLatin America: America MovilChina: China Mobile, China Unicom, China TelecomJapan: NTT DoCoMo, Softbank, KDDI
-
Rohde & Schwarz GmbH & Co. KG
The Rohde & Schwarz carrier acceptance test systems provide access to the most important test plans of the world’s major mobile operators.Voice over NR, data throughput, protocol, positioning, RF, RRM and application testing – all relevant test scenarios are available on a common hardware platform.The entire range of 5G NR testing modes are available, covering sub-8 GHz (FR1) and mmWave (FR2) frequencies, and both non-standalone (NSA) and standalone (SA) modes.Contact your Rohde & Schwarz sales representative to learn more about the latest products and features.
-
ROBOT FRAMEWORK -
Robot Framework
Robot Framework is a generic test automation framework for acceptance testing and acceptance test-driven development (ATDD). It has easy-to-use tabular test data syntax and it utilizes the keyword-driven testing approach. Its testing capabilities can be extended by test libraries implemented either with Python or Java, and users can create new higher-level keywords from existing ones using the same syntax that is used for creating test cases.
-
CTS-6010 -
Astronics Corporation
The CTS-6010 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
-
Astronics Corporation
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
-
-
PXP-500A -
Teledyne LeCroy
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
-
Teledyne LeCroy
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
-
iWave Systems Technologies
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
-
27014 -
Chroma ATE Inc.
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
-
TS-960e -
Marvin Test Solutions, Inc.
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
-
17020E -
Chroma ATE Inc.
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
-
3380P -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.