Showing results: 331 - 345 of 977 items found.
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ST5C Colibri -
Advance Devices Corp.
*Built-in direct LCR probe*Convenient one-hand operation*Ideal for Surface Mount Devices*Automated component identification*Automated test range selection*Manual C, R, L and ESR modes*Manual test frequency overrides*Test signal level 0.5 Vrms*Portable and ergonomic design*OLED Display*Built-in Li-Ion battery
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DPA Components International
DPACI Cryogenics Test Laboratory has been operational for over a decade providing test data, temperature cycling, simulation, and analysis for our customer’s rigid deep space component qualification requirements. Our firm provides our customers with most accurate test data taken at temperatures ranging from 10°Kelvin to 400°Kelvin.
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VectorCAST/Ada -
Vector Software Inc.
An integrated software test solution that significantly reduces the time, effort, and cost associated with testing Ada software components necessary for validating safety- and mission-critical embedded systems. VectorCAST/Ada parses your source code and invokes code generators to automatically create the test code (stubs and drivers) required to construct a complete, executable test harness.
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F6150e -
Doble Engineering
The Doble F6150e is a versatile solution for testing protection relays and schemes.This power system simulator performs the simplest through the most complex tests. Meeting all your testing needs, the F6150e is available in different configurations.Whether you need to test a specific component or test an entire scheme, the F6150e is the proven solution to assess protection system performance.
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NX Solo -
Dynalab Test Systems, Inc.
The Dynalab NX Solo Wire HarnessTester is a low-cost, feature-packed, stand-alone tester with a maximum capacity of 256 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to decide which operation to perform next. Testing for continuity, shorts, and a variety of components.
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M9380A -
Keysight Technologies
Save floor space with a compact, modular analog signal generator Provides Keysight quality and performance for local oscillator (LO) substitution, interference and component test Minimize need for external amplification with output power of +18 dBm across the frequency range Reduce test time with easy integration into your high-speed automated test system
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N4375E -
Keysight Technologies
The new N4375E single-Mode LCA is based on the latest 5222A series network analyzers with 2-port or 4-port configuration. This LCA is the ideal measurement solution for electro-optical components up 26.5GHz electro-optical components, as well as Radio over Fiber (RoF) and aerospace and defense (A&D) electro-optical test applications. The N4375D is traceable to international standards and provides guaranteed specifications for electro-optical responsively S-parameter measurements in a turn-key solution. In combination with N4691B electronic calibration kit you get fastest setup of your test, so you can focus on developing your components. The new N4375D replaces the industry standard 8703A/B series and supports specified modulation frequencies up to 26.5 GHz at 1310nm and 1550nm source wavelength or individual wavelength with external optical input.
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LT-01 -
Jinan Leading Instruments Co., Ltd.
LT-01 Leak Tester is applicable in leak testing of pouches, bottles, pipes, cans and boxes of foodstuff, pharmaceutical, medical, daily chemistry, automotive, electronic components, stationary and other industries. It's also applicable in the leak testing of the specimens after falling tests and pressure resistance tests.
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HVL Models -
Instron
Developed for high-capacity tension, compression, bend/flex, and shear testing, the HVL Models feature a dual test space and long test stroke. Understanding the critical importance of operator safety, these frames incorporate high-quality materials, components, and craftsmanship, and are ideal for testing metals, wire, fasteners, concrete, and wood.
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P700 -
Bemco Inc.
Bemco's Standard P700 Salt Spray and Fog chamber is designed to fill the needs of laboratories that require accurately controlled salt spray and fog tests on small components and assemblies. This unit meets all standard military, commercial, and ASTM salt fog corrosion and humidity corrosion tests.
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Mess- & Prüfsysteme GmbH
Our high-voltage coupling capacitors are a main component of our partial discharge test stations. They serve to decouple the partial discharge impulses and act as a voltage divider, the output voltage of which is matched to our partial discharge measuring devices (with integrated voltage measurement) and peak voltage measuring devices. These high-voltage components are also available separately in their various designs, sizes, capacities and voltage ranges.
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U1733C -
Keysight Technologies
20,000 counts resolution0.2% accuracy Wide LCR ranges with 5 selectable test frequencies (100Hz, 120Hz and 1kHz, 10kHz and 100kHz)Auto identification(Ai) which automatically determines and displays component type and measurements Detailed component analysis with DCR, ESR, Z, D, Q, functions Battery life of 16 hours/Ac-powered IR-to-USB connectivity for data logging to PC
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Imapact 7BT -
Lorlin Test Systems
The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results and uses a Windows 10 64-BIT Operating Systems and a USB 2.0 Interface.
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ESPEC North America, INC.
The ESPEC Criterion benchtop temperature chamber provides a simple and economical solution for a variety of temperature testing requirements. The chamber's 1.5 cu. ft. interior size is popular for component level tests.
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBELL Temperature cycling test chamber is suitable for testing various performance indexes of aerospace products, electronic instruments, materials, electronic products and various electronic components under the condition of rapid temperature change.