Showing results: 466 - 480 of 4492 items found.
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MTS1000i -
Applied Test Resources
The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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MTS1010i -
Applied Test Resources
The MTS-1010i is a more economical version of the MTS-2010i & MTS-1020i testers. It has a reduced platform size and reduced power supplies. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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MTS2010i -
Applied Test Resources
The MTS-2010i are a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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Meridian -
Optikos Corporation
Designed for rapid customization, the Meridian product line offers a revolutionary hardware and software approach to production camera testing. It's a flexible test tool kit that's compact, cost-effective and easy to incorporate in your production line: the graphical user interface facilitates setup and selection of metrology parameters; and a library of functions integrates easily into your testing software.
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Qosmotec Software Solutions GmbH
Wireless Communication Technology is finding its way into automotive industry – not only for entertainment purposes, but for security and safety reasons: With Car-to-X technology, drivers shall get information that other vehicles and road side facilities already have, for example, in case of a traffic jam ahead, a slippery road behind a curve or a necessary change of the traffic lane because of road constructions.
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MB Dynamics Inc.
MB Dynamics delivers effective, low-cost, and quiet excitation technology to root source S&Rs in vehicles, trimmed bodies, subsystems and components, including 4 poster test rigs. MB’s patented Direct Body Excitation (DBE) Road Simulator and Dynamic Vehicle Torquer (DVT) are advanced vehicle road simulation technologies which help detect vehicle S&Rs during development, launch, and production.
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BADGER -
ADVINT, LLC
Badger systems utilize NI's CompactRIO (cRIO), Single Board RIO (sbRIO), and/or CompactDAQ (cDAQ) hardware. The Badger product line offers high speed data acquisition/control and flexibility in an industrial package. Badger chassis and instrumentation have a 50 g shock ratings and a wide -40 to 70 °C operating temperature. These systems are ideal for automotive, industrial automation, remote monitoring, field service, and advanced control applications.
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Instron
The Instron® Curved Needle Testing System is ideally suited for testing needles used in wound closure or surgical procedures. This system provides a platform for two different needle testing solutions: one for curved needle puncture testing to ASTM F3014 and the other for cantilever bend testing.
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Shanghai Himalayal Co.
Diagnostic test that indicates the degree of cable insulation degradation. Rather than using only a VLF instrument to perform a go/no-go proof test, the Tan Delta, used in conjunction with a VLF hipot, permits the user to grade the deterioration level of many cables in order to prioritize replacement, rejuvenation, or to determine what additional tests may be useful.
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TH2829AX-24 -
Changzhou Tonghui Electronic Co., Ltd.
Number of Test PIN: 24 ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms) ■ Test Speed: max. 13ms ■ 7-inch TFT LCD display with a resolution of 800×RGB×480
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TH2840AX -
Changzhou Tonghui Electronic Co., Ltd.
■ The test speed is as high as 1000 times/s (>10kHz), without relay action time ■ Test level up to 20Vrms ■ The bias voltage is built-in ±40V/±100mA/2A ■ Up to 288 test pins (only TH2840NX) ■ Industry-friendly user experience: Linux bottom layer, built-in help file
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TH2829LX -
Changzhou Tonghui Electronic Co., Ltd.
Number of Test PIN: 20 ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms) ■ Test Speed: max. 13ms ■ 7-inch TFT LCD display with a resolution of 800×RGB×480
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TH2829CX -
Changzhou Tonghui Electronic Co., Ltd.
Number of Test PIN: 20 ■ Frequency: 20Hz-1MHz, Resolution: 0.5mHz ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms) ■ Test Speed: max. 13ms ■ 7-inch TFT LCD display with a resolution of 800×RGB×480