Filter Results By:
Products
Applications
Manufacturers
System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
-
product
Voltage and Current Amplifier
CMS 356
The CMS 356 is a voltage and current amplifier for analog low-level signals provided by a CMC test set or by any other signal source, such as a digital real-time power system network simulator. When used in combination with a CMC test set, the amplifier extends the capabilities of the test set to provide additional output channels and higher amplitudes.
-
product
Test Chambers
Associated Environmental Systems
Associated Environmental Systems (AES) designs and manufactures standard and customized environmental test chambers. Our products vary in size from small bench top test chambers to very large walk-in environmental rooms. Whether you are looking for off-the-shelf or unique test chamber solution, we can meet your needs.
-
product
GPIB (IEEE-488) Switching
Pickering's GPIB (IEEE-488) switching systems offer you a comprehensive line of switching modules that are ideal for functional test, factory automation and data acquisition applications. These GPIB switching systems range from small low-cost entry level systems to large high performance units with extensive built in self-test.
-
product
JTAG External Modules for Cluster Test
JEMIO
The JTAG External Modules JEMIO™ for Cluster test are intended to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system. For many designs, Boundary-Scan has adequate access to on-board signals, but signals that go off the board often cannot be tested by a JTAG tester. By adding JTAG access to these off-board signals, JEMIO™ modules can increase the board's JTAG test coverage, possibly reducing the need for implementing another test method or for developing alternative tests to reach the required level of test coverage.
-
product
Dust Chamber Manufacturer
Wewon Environmental Chambers Co, Ltd.
Wewon Environmental Chambers Co., Ltd. is a good dust chamber manufacturer and made a 3380 liters blowing sand and dust test chamber for a Vietnam customer last week. The controller system of this 3380 liters dust test chamber can be connected to the computer.
-
product
DC Power Supplies
Rohde & Schwarz offers a versatile portfolio of DC Power supplies that fit variety of test and measurement scenarios. Whether you are looking to equip an educational lab or integrate a power supply into a production test system, we have the right equipment for you.
-
product
System Components
For demanding computational tasks, Rohde & Schwarz offers the versatile, flexible equipment you need for everyday use – from the system controller and switch unit to the test chamber. All feature excellent EMC shielding, reliable test results and modular solutions.
-
product
Inspects MEMS and Wafer Level Devices
NorCom 2020-WL
The NorCom 2020-WL is specifically designed for wafer-level inspection and leak tests up to 1000 devices per cycle. The system can inspect up to an 8” wafer on or off a saw frame. It is designed to test MEMS and other wafer level devices that have a cavity.
-
product
Earth Ground Clamp
1630-2
The 1630-2 FC clamp measures earth ground loop resistances for multi-grounded systems using the dual-clamp jaw. This test technique eliminates the dangerous and time-consuming activity of disconnecting parallel grounds, as well as the process of finding suitable locations for auxiliary test stakes.
-
product
DC/AC High Current Probe
698
Unit is designed for use with digital multimeters,lab scopes or graphing meters. With 1000 Amp capabiltiy, this instrument can be used to test starting and charging systems. It can even be used to test relative compression when used with your lab scope or graphing meter.
-
product
Automatic Voltage Transformer Comparator
KATC-V2
Knopp’s KATC-V2 is a highly accurate state-of-the-art voltage transformer comparator that is compatible with all older generation Knopp comparators, and is designed to be a direct, plug-in replacement with additional test set cables to fit in the existing Knopp Voltage Transformer Test Systems.
-
product
Cord Grip Test Apparatus
SCR ELEKTRONIKS focuses on designing a solution around the end use at her customer. Instead of offering a standard instrument for a specific task, we have an approach of customizing the test bench to target the specific goals of the process or test procedure. Our measurement instruments, test modules, electrical power systems & software libraries are developed with this vision, thereby reducing the test system’s time-to-deploy. Cord Grip Test Apparatus for testing effectiveness of the retention in flexible cables.
-
product
Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
-
product
BNC To BNC Cable, 50 Ohm, 0.9 M
781887-01
Connects measurement and signal generation devices. Model options include industry-standard coaxial connector types including BNC, SMA, SMB, and MCX. Long cables can act as antennae picking up extra noise that can affect measurements, so ensure you select only the length required for your test system. Also look at the impedance of your test system and consider buying a cable with the same impedance. Matched impedance can maximize the power transfer or minimize signal reflection from the load of your system.
-
product
Xenon Lamp Weathering Test Chamber
Sanwood Environmental Chambers Co ., Ltd.
Sanwood , a 23 years of Bench-top Xenon Lamp Test Chamber, Bench-top Xenon lamp aging test chamber, Bench-top xenon lamp weathering test chamber ,Xenon Lamp Test Chamber, Xenon Test Chamber manufacturers Small, simple and economic xenon test chamber. It uses a low power air-cooling xenon lamp to produce enough big irradiance energy in a small space. Moreover, through a special catoptrical system to ensure every exposure sample get the homogeneous irradiance distribution.
-
product
Plug-in Temperature Conditioners
PITC
The PITC, with a temperature range of -70 C to +177 C, was first introduced in the late 1950s by Bemcos Conrad/Missimer Division. Today, the modernized version of this system is the ideal solution where short run or infrequent tests are required, test specimens are unusual in size or shape, initial capital costs must be held low, or test needs are frequently changed.
-
product
PXI Versatile Multiplexer, Solid State, 250mA, 40V
40-682A-002
The 40-682A-002 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 250mA current and 40V voltage handling. The 40-682A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
-
product
PXI Versatile Multiplexer, Solid State, 350mA, 60V
40-681A-001
The 40-681A-001 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 350mA current and 60V voltage handling. The 40-681A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
-
product
PXI Versatile Multiplexer, Solid State, 125mA, 100V
40-683A-001
The 40-683A-001 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 125mA current and 100V voltage handling. The 40-683A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
-
product
Dual HD Test Signal Generator with Embedded Audio
7751TG2-HD
The 7751TG2-HD Test Signal Generator provides a cost-effective method of generating 1.5Gb/s HDTV 4:2:2 and 4:4:4 test signals. The 7751TG2-HD is ideal for checking signal path integrity, or to determine system performance over varying cable lengths. The 7751TG2-HD generates test signals in a wide variety of SMPTE 292M video formats.
-
product
P-GW Functional Tester
The LTE PGW Functional Tester provides a wrap-around test solution for the Packet Date Network Gateway by emulating all the LTE network elements surrounding the PDN-GW (System Under Test). The P-GW Functional Tester emulates LTE Core Network entities such as the S-GW, PCRF, OCS and OFCS. It tests the S5/S8, S7/Gx, Gy and Gz interfaces of the P-GW.
-
product
onTAP DLL
Whether plugging into a test executive, or running as a plug-in to your own interface, onTAP’s DLL can be linked to and run from third party test executives such as, National Instruments’ LabVIEW™. Flynn Systems provides GUI demo programs written in C++ and C# showing you how to link the onTAP DLL to your test executive
-
product
GPIB Controlled Signal Routing Box
GPIB
Test Electronics will customize the TE3000 GPIB signal routing box for your test application. Then, you simply rack and stack all the equipment, cable all the switched signals to the back of this GPIB box, add a rack mount computer, plug in the National Instruments GPIB board and software. Then run your customized GPIB based test system.
-
product
Wire Harness Tester
NX Solo
The Dynalab NX Solo Wire HarnessTester is a low-cost, feature-packed, stand-alone tester with a maximum capacity of 256 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to decide which operation to perform next. Testing for continuity, shorts, and a variety of components.
-
product
Digital Test Instrumentation
Di-Series™
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
-
product
SpaceWire Physical Layer Tester
141
The SpaceWire Physical Layer Tester (SPLT) is a tool designed to test, validate and verify a SpaceWire system across all levels of the SpaceWire standard. Two SpaceWire ports employ a special LVDS interface which allows the transmitted signals to be deliberately and measurably manipulated to test the capability of a unit under test to receive signals of varying quality.
-
product
Aircraft Escape Systems
The Emergency Interseat Sequencing System (EISS) was designed an qualified for the F-15K Fighter and has since been installed in the F-15SG and F-15SA configurations of the F-15. The system consists of Thermal Batteries with Initiators, a Digital Interseat Sequencer, Mode Selector, and customer provided cabling Electro-Explosive Devices (EEDs). The system is operated from either thermal battery and aircraft 28Vdc for redundancy. A separate field Test Set (EESSTS) performs both complete system continuity tests and an operational test of the total system installed in the aircraft. The sequencer is programmable and could be used in any escape system.Based on the initiation point, Forward or Aft Seat Handle, Internal or External Canopy Jettison Handles, and the Mode Selector setting, the Sequencer provides firing pulses to the EEDs to support canopy removal, ejection seat inertial reel activation(s) and ejection seat catapult firing(s). Sensing capabilities are provided to determine system state, canopy gone, seat gone, so as to provide the optimum escape timing.
-
product
HEV, PHEV, EV Tester
Series 8500s
The Series 8500s are high power fully automated test systems designed for testing and characterizing Electric Vehicle and Energy Storage batteries. The systems are designed with B2G technology, allowing the electrical energy produced during discharge to be recycled to the electrical grid.
-
product
IR/Visible Ranging Projectors
SBIR offers various ranging test bench systems that can be configured for non-infinity focus testing. Each system can be specifically designed for various tasks including characterizing the performance of IR and visible sensors and performing multi-sensor boresighting (IR to Visible to Laser).
-
product
DIgital 3D Image Correlation System
Q-400
The Digital 3D Image Correlation System Q-400 is an optical measuring device for true full-field, non-contact, three-dimensional measurement of shape, displacements and strains on components and structures made from almost any material.The Q-400 system is used for determination of three-dimensional material properties in tensile, torsion, bending or combined tests. In addition, deformation and strain analysis can be applied to fatigue tests, fracture mechanics, FEA validation, and much more.