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System Test

Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .

See Also: Systems, Equipment, Test Systems, System Integrators


Showing results: 3751 - 3765 of 4500 items found.

  • PXI Source Switching Module

    40-618-001 - Pickering Interfaces Ltd.

    The 40-618 PXI Source Switching Module consists of 12 separate 4-channel multiplexers and 44 uncommitted SPST relay contacts in a single width PXI module. Typical applications include signal routing for avionics test systems that conform to the ARINC 608A specification.

  • USB Powered, 4 channel, 24-bit Data Acquisition System

    DATS-solo - Prosig Ltd

    The DATS-solo is a pocket-sized, ultra portable, high quality, 24-bit data acquisition system. The fully integrated DATS software provides options for acoustic & vibration testing, rotating machinery analysis, NVH tests, hammer impact analysis, resonance testing and modal analysis.

  • Life Cycle Module Testing System

    LCN - Bitrode, Inc.

    Full featured test system for quality control and R&DLife Cycle Testing: Perform charge/discharge cycling of batteries or modules to obtain charge and discharge capacity, energy and DC internal resistanceAutomotive Battery TestingStarting, Lighting and Ignition (SLI) TestingTraction Battery Testing

  • RF Detectors

    BroadWave Technologies, Inc.

    BroadWave designs and manufactures RF Detectors and other coaxial RF components that are ideally suited for test, verification and system integration. With frequency ranges of DC to 18 GHz, our components offer consistent performance at a low cost with an emphasis on performance and configuration flexibility.

  • Optical Power Meter W/6 Wavelength Calibrating Spots

    Maxcom Inc.

    With six wavelength calibrating spots (980nm, 1310nm, 1490nm, 1550nm, 1590nm and 1610nm), refined design, easy operation, linearity or non-linearity display, SC connector, the MXOPM26-50 hand-held optical power meter can be used for direct optical power measurement as well as relative measurement of optical link loss. It’s an essential test instrument in Optical Communication systems, CATV systems, construction and maintenance applications and more.

  • BusTools/1553 BusTools Software Analyzer

    Abaco Systems Inc

    Abaco Systems' BusTools-1553 is an integrated, Microsoft Windows-based, application solution for MIL-STD-1553 test, analysis and simulation. BT-1553 software harnesses the power of Abaco Systems' hardware interfaces on PCI, PCI Express, CompactPCI, PMC, ExpressCard, PCMCIA, USB, XMC, PC/104-Plus, VME and VXI platforms for simplified control over simulation, display, data logging, playback, and protocol analysis of MIL-STD-1553/1760 A and B networks.

  • Current Transformer Testing System

    KCTS-8000 - Knopp Incorporated

    The Knopp Current Transformer Testing System (Type KCTS-8000) is designed to measure the accuracy of instrument transformers having 1 or 5 ampere secondaries and primaries of up to 8000 amperes. The system uses a high accuracy multi-range current transformer as a reference standard. All ANSI standard burdens are included. The phase angle and ratio errors of the transformer-under-test (TUT) are measured by the built-in Knopp Automatic Transformer Comparator.

  • Battery Management Systems Testing

    Bloomy Controls, Inc.

    A Battery Management System (BMS) is an embedded unit performing critical battery functions, including cell monitoring and balancing, pack charge and discharge control, safety, and communications. The BMS must be tested early in development to optimize control algorithms, as well as during manufacturing to ensure reliable functionality. Bloomy’s family of BMS test systems provides a consistent platform for engineers to bring a BMS to market faster, and more reliably.

  • Current Transformer Testing System

    KCTS-8000 - The Eastern Specialty Company

    The Knopp Current Transformer Testing System (Type KCTS-8000) is designed to measure the accuracy of instrument transformers having 1 or 5 ampere secondaries and primaries of up to 8000 amperes. The system uses a high accuracy multi-range current transformer as a reference standard. All ANSI standard burdens are included. The phase angle and ratio errors of the transformer-under-test (TUT) are measured by the built-in Knopp Automatic Transformer Comparator.

  • VXI Video Processor System

    65VP1 - North Atlantic Industries

    NAI’s 65VP1 is a Video Processor System (VPS) on a VXI board. Capable of highly accurate video stimulus and measurements, this state-of-the-art instrument is the culmination of over three generations of Automatic Test Equipment (ATE) development programs. It provides increased functional density, and it reduces power consumption, size, and cost of the overall system. The 65VP1 is ideally suited for defense and commercial ATE programs, including television applications.

  • X-Ray Inspection Systems

    Sciencescope International

    Scienscope’s X-Ray inspection systems division offers state of the art X-ray cabinet systems with the highest performance to price ratio in the industry today. Scienscope has over 16 years of experience selling solutions as a leading NDT (non-destructive test) supplier of x-ray inspection equipment into the electronic, medical device, materials, and biological markets. Our advanced x-ray systems feature high power micro-focus x-ray sources up to 130kV, high resolution digital detectors, large inspection stages with 350° degrees rotation, oblique angle inspection, and all of the manual and automated s/w tools you expect in an advanced system are included.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope

    780319-02 - NI

    1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope

    780319-01 - NI

    1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

  • PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope

    780319-03 - NI

    1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.

  • Compact Goniophotometer

    LSG-1200A - Lisun Electronics Inc.

    The compact goniophotometer of LSG-1200A is used to measure the luminous intensity distribution curve, intensity data, spread angle and other parameters for Chip LED, LED Module, LED Spotlight and all other light which beam angle is no more than 180 degree. • Meets the requirements of IEC, CIE and LM-79 standards • Measures beam angle automatically: staple half intensity angle as well as 1/4 intensity angle, 3/4 intensity angle and 1/10 intensity angle which meets the special requirements. • Measured data is matched with international standard form (IES) and can be applied for lighting design by other lighting design software such as DiaLux • LSG-1200A has included a dark room, measures the maximum size of lamps: 180mm • Test range of luminosity: 0.1~30,000lx. Test accuracy of detector: Class 1 • The distance between the tested lamp and detector is 316mm/1000mm • Angle interval: Horizontal angle: 1°/5°/10°/15°/22.5°/30°/45°/90°, Vertical angle: 0.5°/2°/1.5° • The LSG-1200A horizontal automatic rotating on 0°~360° and Vertical automatic rotating on -90°~+90° • Test accuracy of angle: ±0.2° Work with the follow instruments as a System

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