Showing results: 3961 - 3975 of 4500 items found.
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Cincinnati Sub-Zero Products
Our vibration test chambers offer a variety of solutions for vibration testing. AV-Series and CV-Series vibration chambers offer rapid temperature change rates with combined temperature, humidity, and/or vibration environments. These chambers are designed for compatibility with your choice of electrodynamic or mechanical vibration systems. The Benchtop Vibration Table, ideal for vibration testing of small components or electronics and is designed for stand-alone testing or may be placed in an environmental chamber for combined temperature and vibration testing. HALT/HASS Test Chambers provide extreme vibration and temperature capabilities in order to identify design and product weaknesses.
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Intego GmbH
Due to their special material properties, ceramic and glass components are the basis of many high-tech products. The same properties make the production complex and costly. Substrate defects that lead to failure of finished components should be avoided at all costs. For this reason, early automated optical inspection is essential.For the inspection of sapphire and quartz glass Intego has developed systems to detect both external and internal defects and can also provide cutting suggestions. Using index matching it is possible to test rough or uneven glass profiles.For the inspection of ceramic components Intego offers solutions specifically tailored to the respective testing task. Our modular design uses standard components that have already been developed and tested and in most cases only requires minimal adaptation.
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Fieldpiece Instruments, Inc
The Fieldpiece Dual-Temperature Accessory, model ATH4, measures two temperatures simultaneously using the included k-type, wrap tab beaded thermocouples. The technology inside the ATH4 provides superior temperature compensation in rapidly changing environments commonly found while performing field service. Use the ATH4 to find Delta T and just about any temperature split you want to measure. Displays T1, T2 and T1-T2 on your Fieldpiece meter, handle or data logger. It is included with the HVAC Guide® System Analyzer to get target superheat and for the Target Evaporator Exit Temperature test. Fieldpiece offers a wide variety of k-type thermocouples for various HVAC specific applications. Use pipe clamp T/Cs with the ATH4 to check for blocked filters.
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IT6700H Series -
I-TECH Electronic Co., Ltd
IT6700H series high-voltage DC power supplies is with maximum output power 3000W, adjustable voltage 0-1200V and current 0-10A, IT6700H series have desktop and shelves installation function, easy to operate. IT6700H series provide list mode, built-in RS232 / USB / GPIB communication interface, rich SCPI instructions facilitate the formation of a variety of intelligent test platforms. IT6700H can accurately describe the battery charge and discharge process, widely used in battery fluctuation simulation test, battery charger, high voltage ultra high speed diode, electrolytic capacitor, electromechanical control field and ATE test system, etc., which need to use high voltage and low current DC power supply.
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GT98901 Series -
Marvin Test Solutions, Inc.
The GT98901 Demo board is a USB controlled, cost-effective, multi-function PCB assembly. The module is completely self-contained and includes an LCD display, measurement and stimulus resources, digital I/O, relays, and switches – all of which can be accessed and monitored via the USB port using a SCPI command set via a USBTMC interface which supports the USB488 protocol. Power for the board is provided via the USB interface, providing a totally self-contained assembly which can provide users with a simple yet complete vehicle that replicates many of the stimulus and measurement functions associated with ATE systems. When combined with Marvin Test Solutions' ATEasy® Test Executive and Test Development environment, the GT98901 is the ideal product for creating and supporting ATE training and education applications.
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GGT Series -
IBEKO Power AB
The GGT500 ground grid integrity tester is designed for inspection of the substation ground grid. It can also be used as a portable micro-ohmmeter with Both Sides Grounded and Remote Control functionalities. It is intended to inspection the conditions of a grounding system beneath substations, testing of medium- and high-voltage circuit breakers, disconnecting switches, high-current bus bar joints, cable splices, and different high-current links.In the United States when inspecting the quality of the grounding systems beneath a substation, the proper procedure is to inject 300 A DC during a time period of 60 s. This is what the GGT500 will do, and in that time period, the current path and voltage drop are checked. Also acting as a micro-ohmmeter, the GGT500 can test low resistance values by producing high test currents of up to 500 A.The instrument is placed in an unbreakable, plastic case with IP67 protective rating (with closed lid). Although very portable and lightweight, micro-ohmmeters have very high output power capabilities. High output voltage enables a wider measurement range at higher test currents, as well as the use of thinner/longer test cables. GGT500 ground grid integrity tester generates a true DC ripple-free (less than 1 % ripple) current with automatically regulated test ramps. This significantly decreases magnetic transients and ensures great accuracy.When used for testing in Both Sides Grounded conditions, a special current clamp powered from the ground grid integrity tester is used for measuring a current through groundings. If even a higher safety level is required, the remote control feature enables the operator to perform measurements from a distant location, away from the instrument and test object.
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MPI Advanced Semiconductor Test
MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE
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F-Series -
Emite Ingeniería SL. Ed
The F large-size hybrid Reverberation/Anechoic Chamber represents the most versatile OTA test system in the market today. With the same unique test features of their E Series RC counterparts, the F-Series can also test large form-factor devices under test (DUTs) like laptops, large TV sets, solar and trash compactors, drones, fridges or washing and vending machines, among others. With up to 16x16, 8DLCC and DUTs up to 2m and 500 kg including full-body phantoms in a turntable, the F Series also expands the frequency range down to cover 200 MHz up to 40 GHz frequency ranges and the test modes to include EMC, BS, small cell, eNodeB and Virtual Drive Testing over the air (VDT-OTA). In an again unheard-of feature, the F-Series is also reverse-convertible into an Anechoic chamber, allowing Far Field (FF) and Spherical Near Field (SNF) radiation patterns, efficiency and gain measurements and pre-5G testing of antennas and devices. Conversion from RC to AC or vice versa can be performed within half a day.
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R.R.Transformers & Equipments
Protective devices such as relays, overload Coils, Circuit breakers and CTS etc. must be checked regularly to ensure that they are always ready to operate correctly, Routine current injection testing will quickly detect faulty or incorrectly adjusted protection circuits / devices & will be possible to prevent serious damage to the system. Primary injection kit is designed to operate on single phase 230/240 volts AC 50 HZ to develop smooth & continuous test current as for loading, calibrating, and testing of CTS, Bimetal Relays, Protection Relays etc. The test set gives high current output at low cost and with inherent safety. The primary current injection testing checks all parts of the protection system by injecting current down the cable / bus bars. The application of the primary current injection sets is to ascertain the current carrying capacity of any Conductor, insulator, connector or calibration of CTS / Bi-metallic relays etc.
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SL1800A Series -
Keysight Technologies
Keysight's SL1800A Scienlab Regenerative DC Emulator - High-Power Series enables users to emulate the large batteries in electric vehicles. The bidirectional power flow allows emulation of both power sourcing applications, such as traction inverter test, as well as power-absorbing (sinking) applications, such as EV charging. Being regenerative, the power absorbed is delivered back to the grid, saving on energy and cooling costs. The SL1800A Series is fully integrated with the SL1040A Scienlab Charging Discovery System. The SL1093A Scienlab Charging Discover Software fully automates DC charging applications to many different test standards. With bi-directionality, integrated DC voltage and current controllers, high dynamics, and its regenerative energy feedback capacity, the Scienlab Dynamic DC Emulator provides an all-in-one system for efficient and effective testing of the power electronic components in electric vehicles (EV) and electric vehicle supply equipment (EVSE).
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783761-01 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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783762-01 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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783762-02 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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783761-02 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers
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PXI-501 -
Konrad Technologies GmbH
The PXI-501 is a multifunction measurement instrument for functional and in-circuit measurements.It combines two parametric measurement units with a digital voltmeter, a high voltage current source and a discharge unit. This powerful combination makes it the ideal instrument for classical analog in-circuit test and manufacturing defect analysis with additional functional test capabilities.With it’s fast sampling rate of up to 4MSps it speeds up measurements and is capable of measuring and generating AC signals up to 100kHz.To enhance the PXI-501 capabilities it can be combined with an ABex TM-501 or an ABex TM-404. The ABex TM-501 enhances the in and output range of the PXI-501. Furthermore, it provides a shunt current measurement upgrade. In combination with the ABex TM-404 it’s a complete in-circuit test solution with 86 channels in one ABex slot. For sure it can be upgraded to 2838 test points in one rack by simply adding additional matrix modules.With the above-mentioned terminal modules, the PXI-501 is able to act as a ABex system controller, so that no additional controller is required in the cassis.
