Showing results: 721 - 735 of 888 items found.
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Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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PHI 710 -
Physical Electronics
The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.
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Teledyne e2v
EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates such as adaptive optics and lucky imaging™.The combination of Teledyne e2v’s back-thinning technology and anti-reflection coatings enables industry leading quantum efficiency that can be optimised for applications in the visible, UV or NIR wavelength ranges.
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SphereOptics GmbH
Portable or handheld spectrometers (field spectrometers) and hyperspectral cameras (imaging spectrometers) are the ideal tools for spectral data acquisitions and ground truthing of remote sensing imagery. SphereOptics offers you a wide range of spectrometers for the visible (VIS), near infrared (NIR), shortwave infrared (SWIR), and thermal infrared (TIR) wavelength regions. More details about our single point spectrometers for the VIS-NIR-SWIR can be found here, and for TIR here.
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nac MEMRECAM HX-7s -
nac Image Technology Inc.
nac's compact, lightweight MEMRECAM HX-7s offers an astounding 5 Mega Pixel resolution at up to 850 fps, Full HD resolution at up to 2,000 fps, 1 Mega Pixel resolution at up to 3,600 fps, and so much more! The HX-7s gives the user the best possible solutions: the highest resolutions available; the highest light sensitivity available; true mobility and stand-alone performance; and ultra fast imaging.
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Emergent Vision Technologies
Emergent Vision Technologies has two software packages available to meet all requirements. eCapture is a standalone imaging package that provides accessibility to all functions of the Emergent Vision Cameras. eSDK is Emergent''s Software Developer''s Kit for integration of Emergent cameras into your system. Both software solutions provide <3% CPU overhead for Windows and Linux when capturing a 9Gbps video stream from the cameras.
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Sciencetech, Inc.
Far-Infrared and terahertz (THz) radiation is the spectral region at the long wavelength end of the infrared and the short end of the microwave region, also known as the sub-millimeter wavelength spectral region. Recently, there has been an explosion of interest in THz applications as the radiation generated can penetrate various materials. THz light is commonly used in materials science, security, pharmaceutical com- pound analysis, biomedical imaging, superconducting materials, astronomy, and particle physics research.
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Rocky Mountain Laboratories, Inc.
Cross sections are prepared by mounting samples in epoxy and then grinding and polishing the mount for imaging in the optical microscope or Scanning Electron Microscopy (SEM). Valuable information from cross sectioning can include: film thicknesses, inclusions, corrosion thickness, dimensional verification, and subsurface defects. Metallographic cross sections are typically etched to reveal the microstructure. Microstructural analysis can provide information about heat treatment history, corrosion susceptibility, as well as undesirable microconstituents.
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Tracewell Systems
Tracewell has extensive experience designing and manufacturing systems based on standard architectures including VPX, VXS, VME, VME64x, VXI, ATCA, MicroTCA, and CPCI. The Tracewell System Architecture (SA) products, based on standard, commercial technologies can be used in a wide variety of commercial and military applications including: battlefield command & control systems, ground and flight sensor control systems, vehicle navigation controls, and medical imaging devices.
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OptiConcepts
The USB Connector Inspection System features easy focusing with high resolution imaging. The system includes standard software that provides image display, image capture, digital zoom, auto calibration, and basic analysis tools. Pass/Fail analysis and reporting features are optional software features. The Inspection System scope is fully compatible with the FiberWarrior Pro OTDR as well as other FiberWarrior Pro test sets, providing a full fiber optic testing solution.
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AEP Technology
AEP Technology offers unique nanomechanical testers with a variety of interchangeable test heads that allow nanoindentation, scratch testing, microindentation testing and abrasion testing to be performed on the same platform. The rugged platform with built-in high-resolution imaging systems (atomic force microscope, 3D profiler, etc.) makes the UNT-30 a powerful tool for R&D and production. In order to ensure the high reliability of the data, the tester is also equipped with a shockproof platform and a soundproof cover.
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ZEISS Atlas 5 -
Carl Zeiss AG
Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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TR7502DT -
Test Research, Inc.
Equipped with a 1-CCD high resolution color camera, the TR7502 DT desktop automated optical inspection system offers TRI' hallmark Dynamic Imaging technology for powerful pre/post reflow inspection in a compact economical solution. The system features a highly flexible coaxial RGB+W lighting system with low-angle lighting for better inspection of polarity and black components and is capable of inspecting 01005 fine pitch components in both lead-free and legacy PCB assemblies
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Star SAFIRE® III -
Teledyne FLIR
With thousands of systems fielded, the Star SAFIRE III provides extremely reliable high performance. Along with superior image stabilization and long-range imaging, Star SAFIRE III features internal navigation for precise targeting, MWIR thermal imager, optional EO color and low-light cameras, and multiple laser payload options. The system is fully hardened for military fixed-wing and helicopter operations, and it operates continuously in all conditions – even while sitting on the tarmac with no airflow.
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OpTest™ MTF -
Optikos Corporation
The Optikos OpTest™ MTF Testing Equipment is the most flexible and complete system for characterizing the optical performance of optical elements, lens assemblies and optical imaging systems in Infinite Conjugate, Finite Conjugate and Afocal configurations spanning the UV, Visible, NIR, SWIR, MWIR and LWIR spectral regions . OpTest™ software drives Optikos hardware, is easy to use and controls all motion control, image acquisition, configuration set-up and data reporting.
