Showing results: 136 - 150 of 367 items found.
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FECPLS500 -
Frothingham Electronics Corporation
The PLS500 automatic tester is designed primarily to do SURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses and THERMAL RESPONSE either in DVF (mV) or degrees per watt. All three test types may be performed in a single test program.
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Userlytics
User experience research platforms. Analytics delivers what, Userlytics reveals why & how. A scalable user testing program combined with response & action dependent user test scripts. Now you can design a scalable user testing project that has the flexibility and ability to customize the UX test to the actions and responses of each UX test participant.
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Flynn Systems Corp.
Whether plugging into a test executive, or running as a plug-in to your own interface, onTAP’s DLL can be linked to and run from third party test executives such as, National Instruments’ LabVIEW™. Flynn Systems provides GUI demo programs written in C++ and C# showing you how to link the onTAP DLL to your test executive
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CT350 -
Dr. Eschke Elektronik GmbH
ICT test points: max 2736 CAD Data import Automatic program generator Powerful debugging tools Test coverage analysis Paperless repair station Logging- and statistic functions Full graphical functions Panel and multisite tests Fast adapter exchange High Pin Count-Interface On table optional usable shelf part.
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FECPLS510 -
Frothingham Electronics Corporation
The PLS510 automatic tester is designed primarily to doSURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses andTHERMAL RESPONSE either in DVF (mV) or degrees per Watt. All three test types may be performed in a single test program.
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ComTest Pro -
Baseblock Software LLC
ComTest Pro Communication Test Software for MODBUS RTU Devices via Serial and Ethernet. This complementary program allows users to test and troubleshoot MODBUS RTU communication by sending single or multiple read or write commands to the device. The software offers comprehensive data-logging, data-formatting and error checking features.
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ESS -
ESPEC North America, INC.
Environmental stress screening (ESS) is also known as Burn-in, AST (Accelerated Stress Testing), HALT (Highly Accelerated Stress Test), or HASS (Highly Accelerated Stress Screening). Whatever the name, the idea is the same: create a test program that allows you to eliminate the infant mortality of your product.
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SCHILLER AUTOMATION GmbH & Co. KG
The Standard SD Express Memory Card Test Adapters support PCIe® 16 GT/s (Gen4) and PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD8.0 and SD7.1. Minimal crosstalk, short trace lengths. The Micro SD Express Memory Card Test Adapters supports PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD7.1. Minimal crosstalk, short trace lengths. They all support SDHC, SDXC, and SDUC operation modes Data collection via Lab Standard SSMP Test Cables and hard gold mating surface allow for high cycle count insertions and reliable performance.
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Hill Engineering, LLC
Fatigue engineering is subject to uncertainty, and data from well executed tests are used to validate conclusions made by analysis and to provide a basis for structural certification. Our staff have extensive experience in testing materials and components under slowly varying, static loads, and under rapidly varying cyclic loads. Tests under static loads are used to assess material properties or to assess the load-deformation behavior of structural components. Tests under cyclic loads provide time to crack initiation, time to failure, or measurements of crack growth over time. We have extensive experience in measuring fatigue crack growth behavior in metallic materials. Past programs have measured crack growth with microscopy and photogrammetry at the surface, cracked area with direct current potential drop, and through-thickness crack profiles with quantitative fractography. By assessing crack growth with a variety of experimental methods, we enable robust analysis validation for cases of complex cracking. Our capabilities in fatigue engineering allow for careful design of a fatigue test program. Whether the tests use constant amplitude loading or an irregular loading spectrum, we specialize in engineering the test that meet your needs. Much of our experience is in non-standard test programs, which require engineering to optimize the test setup. Few others match our capability and experience in fatigue test engineering.
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ELQ 2+ -
Vonaq Ltd
*Physical parameter measurements on balanced access lines like:ADSL2, ADSL2+, READSL, ADSL, HDSL, SHDSL, ISDN, etc.*Memory for test results*PC software for test result transfer*Demo program for training*320 x 240 dot LCD display with backlight*Selectable English, German or Russian languages
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80-91 -
Testing Machines, Inc.
The Lab Master® Peel Tester for Release and Adhesion testing operates with Windows®-based software, and features the ability to create user-defined test set-up, individual test speed selection, user-definable default areas for analysis, exporting of graphs or data to Microsoft Excel and SPC programs, and enhanced calibration procedures.
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Teledyne LeCroy
Teledyne LeCroy provides NVM Express, SATA Express and SCSI Express protocol decoding, analysis and test equipment to SSD storage companies worldwide. It works closely with the following organizations providing equipment to its members and conformance programs.
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PowerTRAC™ -
EEC
Program and run your power source remotely via PC. Easily gather data and analyze test results like never before.
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VerOStack -
Verocel, Inc.
VerOStack examines the binary executable to statically determine the actual worst-case stack size. This is a precise measurement technique not influenced by particular dynamic test runs and their variance based on a particular execution path. Furthermore, it can take into account not only the current program but also other programs that will run on the target at the same time, such as other applications running on a real-time operating system (RTOS) or in combination with the RTOS itself. It can thus provide truly meaningful data on target memory requirements.
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MEZ-E1553 -
Alta Data Technologies LLC
From our popular ENET product, the MEZ-E1553 is a small, rugged mezzanine product that can easily be integrated into your system design. Alta provides full reference schematics, design notes, STEP 3-D Files, and sample ESS test programs. Guaranteed 1553A/B/C compliant with AS4111 5.2 Protocol Test reports.