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See Also: IEC, IEEE, Mil, Interoperability Test, Compliance


Showing results: 4636 - 4650 of 6646 items found.

  • Temperature and Humidity Sensors

    Monarch Instrument

    The Portable USB Temperature and Humidity Probe combines high accuracy temperature and humidity sensors into a rugged stainless steel probe with built-in USB interface. The probe can be used with Windows based PC’s or Android devices that support On-The-Go communications. To use with an Android device simply download the free App from Google Play, plug the probe into your device with the supplied interface cables and start the application. The probe receives its power from the host USB device. Real time data is displayed and can be stored for review on the PC using a spread sheet or review data graphically using our free Track-It™ data logger software. Available in 300mm or 450mm (12” or 18”) lengths. The probe comes standard with a free flow Delrin cap. Optional sintered stainless steel filter caps are available for measuring dry bulk material or for use in dusty/dirty environments. Field pre-calibrated replacement sensors are available (with or without N.I.S.T. certificate).

  • 4-Channel 200 MHz A/D with DDC, VITA 49.0, Virtex-6 FPGA - 3U VPX

    Model 52664 - Pentek, Inc.

    - Complete radar and software radio interface solution- PCIe output supports VITA 49.0 VITA Radio Transport (VRT) Standard- Supports Xilinx Virtex-6 LXT and SXT FPGAs- Four 200 MHz 16-bit A/Ds- Four multiband DDCs (digital downconverters)- Multiboard programmable beamformer- Up to 2 GB of DDR3 SDRAM or 32 MB of QDRII+ SRAM- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multiboard synchronization- Optional LVDS connections to the Virtex-6 FPGA for custom I/O- 3U VPX form factors provides a compact, rugged platform- Compatible with several VITA standards including: VITA-46, VITA-48 AND VITA-65 (OpenVPX™ System Specification)- Ruggedized and conduction-cooled versions available- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe

  • Bending Deflectometers For ISO 178, JIS K 7171, And ASTM D790 Compliant Testing

    Shimadzu Corp.

    After tensile testing, flexural tests are the most common strength tests for plastics and other resins. The main standards for plastic flexural (bend) tests are ISO 178, JIS K 7171, and ASTM D790, which require very accurate test systems. These standards include flexural strain measurements using a deflectometer, ranging from micro-strain measurements in the elastic region, the reversible elongation at the beginning of tests, to larger strain measurements in the plastic region. Shimadzu's deflectometers integrate easily into AG-X plus series, AGS-X series, and EZ-X test frames and Trapezium X testing software. Since these deflectometers push up against the specimen from below, the specimen color is not a limiting factor, as can be for laser type non-contact deflectometers. Furthermore, these deflectometers can partially absorb the shock during specimen failure, preventing specimen fragments from scattering.

  • Universal Amplifier Heatsinks

    ERAVANT

    A universal heatsink, which is designed and fabricated for Eravant's active device applications with up to 15-watt power dissipation. The heatsink consists of the main heatsink body, a DC fan and a heat spreader. The heat spreader is also known as adapter, which is used to bridge the mounting gap between the heat sink main body and the to-be-heat-sunk devices, such as power amplifier, frequency active multiplier, oscillator, transmitter and transceiver due to various mounting hole locations. The heat spreader offers various mounting patterns to accommodate more than 15 product models. This heatsink is not only designed for Eravant's standard products and Uni-Guide™ featured products, but also for many industrial standard microwave and millimeter wave products offered by other manufacturers. Other heatsinks with different power dissipation capacities are offered under different model numbers.

  • Cryogenic Applications

    Celadon

    Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe card as well as DUT probing solutions. These custom cryogenic probe card solutions are widely used to test Space, Military, Medical and Quantum Computing products. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovative custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cableout designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.

  • Cryogenic 4K Probe Cards

    Celadon

    Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe cards as well as DUT probing solutions. These Cryogenic probe cards have all the benefits of Celadon’s Crash Resistant™ probe technology but with the ability to probe as cold as humanly possible. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovate custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cable-out designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.

  • Debug Fixture

    IST Engineering, INC.

    With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.

  • Series Flame Detector

    DF-TV7 - Teledyne Gas & Flame Detection

    The device offers a wide range of output options, as standard and is suitable for use in SIL 2 applications. The detector can ​​be configured to communicate with a wide range of fire panels, controllers, and PLCs and offer HART 7 and Syntel (Lonworks) protocols for addressable event monitoring. The devices come standard with a configurable 4-20mA or 0-22mA (PLC) output, two configurable alarm relays, and two detector status LEDs.All MultiFlame detectors are equipped with a continuous optical lens auto-check to ensure that the optical path is clear and that the detector functions properly. Sensors can be replaced easily in the field without removing any cable glands. Devices are easy to test and configure using a TLU600 wireless hand-held unit that is approved for use in hazardous areas. The TLU600 can also be used for wireless testing of the optical and output circuits. The TLU600 can also be used for wireless testing of the optical and output circuits.​​​​​​​​​​​​​​​​​​​​

  • Total Sulfur Process Analyzer

    NEX XT - Applied Rigaku Technologies, Inc

    Featuring third-generation X-ray transmission technology, the NEX XT represents the next evolution of process gauge for sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums.The Rigaku NEX XT system is faster, more sensitive and far more compact than competitive systems, and provides continuous, reliable detection of sulfur at pressures up to 1480 psig. Rigaku NEX XT can operate as a stand-alone analyzer or provide real-time closed-loop control when tied into a blending or plant-wide automation system. Among its other key features are a simplified user interface, reduced standards requirement, automatic density compensation, password protection, and standard platform for communicating sulfur and density to a plant-wide DCS. Due to its unique design and robust construction, sample conditioning and recovery systems are typically not required.

  • Dry Arc Resistance Tester

    SCR ELEKTRONIKS

    Dry Arc Resistance Tester is designed to conduct high voltage,low current Arc Resistance test on solid electrical insulation material as per:ASTM standard D495-99 (2004) and UL 746A. Why Arc Resistance Test? Many Cases of insulator failure are due to deterioration of its surface because of sustained electrical discharge or Arc. This test method is intended to test the resistance of insulating material when a high -Voltage low -current Arc close to the surface of insulation, intending to form a conducting path therein or in causing the material to become conducting due to decomposition and erosion.AdvantagesThis Test ensures that your products meet high standards of quality & safety. This product is meant for all Switchgears/ insulator/ Polymer/ electro plastic manufacturers and manufacturers who use insulators in their products e.g. Wiring Accessories, Appliances, HT/LT line insulators etc.

  • 96/48-CH Opto-22 Compatible PCI Express Digital I/O Cards

    PCIe-7248/7296 - ADLINK Technology Inc.

    ADLINK"s PCIe-7248/7296 are high-density parallel digital I/O boards with 96/48 I/O channels. The header connectors are fully compatible with industry Opto-22 standard. Thus, PCIe-7248/7296 can utilize the Opto-22 external devices. The PCIe-7248/7296 devices emulate mode 0 of the industry standard 8255 programmable peripheral interface (PPI) chips. The PCIe-7248/7296 provides 4/2 PPI chips respectively. Each PPI offers three 8-bit ports: Port A, Port B and Port C. The Port C is divided into 2 nibble-wide (4-bit) ports. The PCIe-7248/7296 devices have programmable timer/counters. One 16-bit counter is available for event counting, while the other 32-bit timer is available for timed interrupt generation. The PCIe-7248/7296 devices provide multiple programmable interrupt sources from DIO channels, as well as the output of the timer.

  • Battery Extra Load Units

    IBEKO Power AB

    Performing capacity/discharge test on a high-capacity battery may be challenging since high requirements are set on the discharge system. In cases when discharge test times need to be reduced, high load capacities are required from the discharge system. The battery extra load unit BXL is an additional load unit designed especially for this purpose.It is primarily used with BLU battery testers. However, the unit is a universal add-on device. This means it can be used as an additional load with any other discharge/capacity tester in the market.When discharge current exceeds the capacity of a single BLU device, extra load unit increases discharge capacity. A system of BLU and BXL instruments enables performing the capacity test in an accurate, user-friendly way in accordance to battery testing standards: IEEE 450-2010, IEEE 1188-2005, IEEE 1106-2015, IEC 60896-11/22, and other relevant standards.

  • Wire Damaged Tester

    WDT-1 - Lisun Electronics Inc.

    This equipment is designed and manufactured according to corresponding regulation in standard IEC884-1, GB299.1-96, GB16915.1-97 and other electronic accessories relevant standard. Mainly used to test damage degree of fixed connection components lead wire of with thread clamping type and no screw terminals, so as to inspect whether it can withstand mechanical stress during normal use.Specification: • Power supply: AC220V 50Hz • Test rate: 10±2r/min (GB16915.1-97: 12 ±1r/min) • Rotating radius: 100mm • Test distance: 250~500mm adjustable • Test numbers (Number of rotating): 0~999999 any set • Mass: 0.3KG, 0.4KG, 0.7KG, 0.9KG, 1.4KG, and 2.0KG (GB16915.1-97: 30N, 40N, 50N, 60N each of 2 pcs) • Stations: 2 • Dimension: 1200×1400×400 (mm) • Remarks: The mass and rotating radius can be optional as per customer requirements.

  • 96/48/24-CH Opto-22 Compatible Digital I/O PCI Cards

    PCI-7296/7248/7224 - ADLINK Technology Inc.

    ADLINK"s PCI-7296/7248/7224 are high-density parallel digital I/O boards with 96/48/24 I/O channels. The header connectors are fully compatible with industry Opto-22 standard. Thus, PCI-7296/48/24 can utilize the Opto-22 external devices. The PCI-7296/7248/7224 devices emulate mode 0 of the industry standard 8255 programmable peripheral interface (PPI) chips. The PCI-7296/7248/7224 provides 4/2/1 PPI chips respectively. Each PPI offers three 8-bit ports: Port A, Port B and Port C. The Port C is divided into 2 nibble-wide (4-bit) ports. The PCI-7296/7248/7224 devices have programmable timer/counters. One 16-bit counter is available for event counting, while the other 32-bit timer is available for timed interrupt generation. The PCI-7296/7248/7224 devices provide multiple programmable interrupt sources from DIO channels, as well as the output of the timer.

  • Computer-Based Instruments

    GT210PXI - Guide Technology, Inc.

    GuideTech’s GT210PXI 3U form factor, meets industrial standard chassis with an expandable platform, achieving optimal test system with optimal cost. The ability to precisely resolve frequency and time yields both increased accuracy as well as reduced measurement time. For example, with the GT210PXI-1 you can determine any frequency to 0.01 part per million (eight digits) in just 1 mS, and resolve each time measurement to 8pS. Couple that with 2300 measurements per second, one of the fastest rates available and you can acquire more data in a single second than a typical GPIB counter can in one minute! Faster measurements and higher resolution, along with built-in statistics functions give you a more thorough analysis of your signal. Standard deviation, peak to peak jitter, or a graph of the measurements are available at the push of a button.​

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