Showing results: 31 - 45 of 71 items found.
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DRK111A -
Shandong Drick Instruments Co., Ltd.
DRK111A MIT folding tester is designed according to relevant standards and adopts modern mechanical philosophy and computer processing technology. It has LCD display function, various parameters setting function, conversion, adjust, memory, printing and other functions.
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TIME®5330 -
Beijing TIME High Technology Ltd.
Handheld Metal Hardness Tester TIME®5330 is loaded with 4.3 inch LCD screen and a large memory of 2000 groups of data. Built-in conversion table enables you to read HB value directly if D/DC impact devices are installed.
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1047 -
The Eastern Specialty Company
TESCO’s new CT Ratio/Burden Tester (Catalog No. 1047) is a lightweight, portable and highly accurate in-service test set to assist in finding lost revenue by testing the accuracy of your meter circuits. The Tester can help determine if there are installations errors, loose connections, incorrect ratios, resistance buildup, open CT’s, or manufacturers defects. The CT Ratio/Burden Tester measures and displays the primary and secondary current of the CT under test, and the ratio of the currents. All test data is stored in the internal memory and easily uploaded to a PC.
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TOS7210S -
Kikusui Electronics Corp.
The PID insulation tester (TOS7210S) is designed based on the insulation resistance tester (TOS7200) to carry out the evaluation of the PID (Potential Induced Degradation) effect of the PV module precisely and efficiently. Being equipped with the output ability of 2000 V and the ammeter with nA resolution as well as a polarity switching function, the TOS7210S is also applicable not only to the PID evaluation but also the evaluation of the insulators that requires a high sensitivity of measurement. The tester is equipped with the panel memory that is externally accessible and RS232C interface as standard; it can be flexibly compatible with the automated system.
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DRK113 -
Shandong Drick Instruments Co., Ltd.
DRK113 Crush Tester 350 is a high accuracy and intelligent instrument, designed according relevant standards. The advanced components, mating parts and micro-computer are logical structured, to ensure the property and appearance. The instrument have parameter testing, adjusting, LCD digital display, memory, printing function.
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DRK113E -
Shandong Drick Instruments Co., Ltd.
DRK113E Crush Tester PC is a high accuracy and intelligent instrument, designed according relevant standards. The advanced components, mating parts and micro-computer are logical structured, to ensure the property and appearance.The instrument has parameter testing, adjusting, computer screen display, memory, printing function.
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CableJoG 64 -
CableJoG Ltd
CableJoG 64 can test up to 64 individual connections of all manufacturers of connectors. This simple test instrument stores up to 55 separate connection configurations. Each cable that is tested is compared with the configuration stored in the cable testers memory to produce a pass/fail indication of each pin connection.
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Neutronics Manufacturing Co.
Sonel (Poland) Digital Insulation Resistance Tester, Range : 0-5kV/5TeraOhms, Battery-cum-Mains Operated, Voltage increment in Steps of 50v & 100V upto 5kV, Memory storage upto 11880 records, Data Transfer to PC/Laptop by USB Port, Free Software, PI & DAR Measurements.
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VSM-C7 -
TOEI INDUSTRY CO, LTD.
Small size and light weight system 1/5 in weight and about 1/3 in occupied floor space upon heretofore measurement tester Type VSM P7-15. This equipment is capable of measuring all merchandized memory media and low in price. Easy-handling and one-touch measurement after installation can be made possible.
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NX Pro -
Dynalab Test Systems, Inc.
The Dynalab NX Pro Wire Harness Tester is a low-cost, feature-packed, stand-alone continuity tester with a maximum capability of 512 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to "decide" which operation to perform next. The NX Pro Tester has 1.3Mb memory capacity for program storage and is compatible with Printers, Scanners, and all other Dynalab NX System accessories.
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LBT210 -
Microtronic Microelectronic Vertriebs GmbH
Microtronic's LBT-210 solderability tester has software that offers statistical information such as mean value, standard deviation, etc. A camera option offers video of the test cycle and storage in memory with the appropriate test measurements and data. Additionally, it has the feature to test under nitrogen. This function can be switched on in the software. An enclosure that is flooded with nitrogen lowers and rises with the device under test.
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TM263 -
T&M Tools Limited Co
◇ Self Calibration◇ Set the Auto Off◇ Wavelength Memory function after turn off the tester◇ High Accuracy, high ,High sensitivity, high linearity◇ Stable VFL Output◇ USB Charge port◇ FC,SC Connector◇ 18650Li-ion Battery◇ Lower power consumption design, long standby time◇ Rubber Out shell, increased the protective properties for field work
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TestFairy
When testing mobile apps in the crowd, in house or with paid testers, you never know what exactly was tested and what exactly went wrong on the client side. TestFairy solves this problem by providing a video that shows everything that happened on the mobile device, including detailed internal metrics such as CPU, memory, GPS, logs, and crash reports as well as detecting ANRs and alerting when exactly apps behave abnormally.
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TIME®5310 -
Beijing TIME High Technology Ltd.
TIME5310 is an advanced digital Leeb hardness tester developed with advanced micro electronic technology. It is loaded with all the features for metal hardness testing, such as probe auto recognition, large memory, USB output, removable printer, software, etc. The improved display makes it is much easier to read the values. TIME5310 digital hardness meter is a must have for testing in the field or in the lab. By the way, there are newly designed probes for this hardness meter now.
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Hprobe Company
Hprobe design and fabricate turnkey automated testing equipment (ATE) for electrical characterization and testing of integrated circuits under magnetic field such as MRAM (Magnetic Random Access Memory) and sensors. In each phase of the technology and product development as well as during mass manufacturing, a dedicated magnetic tester is available.