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Spring Probes
Spring loaded electrical conductor contacting elements. AKA: Pogo Pin
See Also: Pogo Pin, Test Fixtures, Bed of Nails
- QA Technology Company, Inc.
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Spring Probes & Hyperboloid Contacts
In-Circuit / Functional Probes, Socketless X Probes®, High Current Probes, Double Ended Probes, ATE Interface Probes, integraMate®
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Spring Probes
Spring probes are designed to optimize performance in high reliability, multicycle applications. Smiths Interconnect's spring probes, featuring IDI contact technology, are compliant which makes them ideal for blind mate applications as they self correct for x, y, z, rotational and angular misalignment of the target. Offered in compressed heights less than 2 mm and utilized on pitches as tight as 0.4 mm, they are well suited for high density, board-to-board, battery contact and high frequency applications.
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Spring Probes
An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
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Spring Contact Probes
We differentiated the spring contact probes by center and application, for the purpose of clarity. Please choose in the left navigation bar!
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MEMS Spring Probe
MEMS Spring Probe is developed by NIDEC-READ original ultra-fine 3D processing technology and enables our customer to supply advanced and innovative test solutions at PCB & semiconductor testing market.
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Ingun Spring Probes
MicroContact AG offers the assortment of test probes and test adapters from Ingun as a Swiss representative.
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Spring Contact Probe
ICT
LEENO provides a variety of choices, offering over 1,000 standard ICT probe types. The ICT probes can be customized to deliver optimum solutions to customers.
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Spring Contact Probes
FEINMETALL offers a wide range of contact probe:ICT / FCT probes, short travel probes, double plunger probes, fine pitch probes, interface probes, wire harness probes, threaded probes, high current probes, switch probes, twist proof probes, push back probes, koaxial probes, radio frequency probes.
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High-Current Leaf Spring Probes
Made for flat contacts - fully customizable - great contacting.
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Long Spring Ground for ZD Differential Probe Qty 2
PACC-ZD003
Long spring ground for ZD differential probe Qty 2
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Manual Test Adapter With Rigid Needles
Frequently, manual test adapters are required for the functional and IC test. In order to contact the test subject, spring contact probes are often installed in the adapter, but the pitch of the spring contact probes is approx. 1.27 mm and thus too great for certain applications.
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Probe Card
VS Series
Japan Electronic Materials Corp.
*Vertical contact Probe Card with Spring*Suitable for Area array Bump Test
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Test Probes and Pins
Spring Loaded Test Probes for Circuit Board Testing, "Pogo Pins" Test Electronics sources and stockes a large variety of Test Probes and Spring Loaded Test Pins. Let our applications engineers help you find the correct pin for your test fixture application.
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24V Heavy Duty Circuit Tester
27430
Heavy duty probe, cord and clamp. The probe is insulated with high-visibility shrink tubing to prevent the possibility of shorting the side of the probe to other components. Comes with a strain relief spring on the cord.
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Hybrid Socket
CSP/Ballnest
Any grid size available on 0.50mm pitch or larger. ZIF style socket using Aries solderless, gold plated pressure mount Spring Probe. The gold over nickel plated compression spring probes leave very small witness marks on the bottom surface of the device solderballs.
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Pogo Pin
Probe pin is also known as pogo pin or spring probe. It is designed to test the connection between two circuit boards and devices or equipment under test.
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Spring Loaded Contacts
ATE Probes, Pogo pins and Contact Pads. Gold-plated, spring-loaded, capable of thousands of cycles. Probes for Automated Test Equipment (ATE). Various height SMT contact pins. Flat SMT contact pads. Spring loaded contacts consist of a plunger (or head), barrel (or body), and a fully encapsulated fine spring, to provide the spring force required to maintain positive contact. All have a high durability, exceeding 10,000 mating cycles.
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Semiconductor Probe
Using the spring contact probes for semiconductor package inspection, customers can test various types of packages with LEENO's Total Interface Solution.
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Connectors
Through our Hypertac, IDI and Sabritec technology brands, we supply application-specific, high-reliability electrical interconnect solutions from highly integrated assemblies to microminiature connectors and spring probe contacts. The core of our advanced interconnect solutions is our contact technologies: Hyperboloid, Tortac, Spring Probe, High Speed, Edge Card, Fiber Optic, EMI/EMP, High Power and High Temperature.
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Data Communications And Semiconductor Device Related Products
Using our original micro springs and MC probes, these are highly durable products that are also lead-free. It is used for inspection of finished semiconductor products.
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Probe Cards
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
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WLCSP Probe Heads
Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
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Heavy Duty Circuit Tester
28400
A heavy duty circuit tester for lifetime use. The probe, handle, cord and clamp are reinforced for extra durability. Comes with a strain relief spring on the cord. Cord is 49".
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Active probe 50 Ohm Differential SMB
80609010
The differential active probe helps to carry weak HF signals far away with the minimum disturbance of the original source. The module accepts discrete wiring or direct spring loaded test probe solder. In any case, the input signal wires might be as short as possible.
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PCB Connectors
Smiths Interconnect offers a broad range PCB connectors for harsh environments. A wide choice of configurations and terminations of signal, power, high speed, RF contacts and spring probes solutions.
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Switch Probes
A Switch Probe is a spring contact probe and receptacle combination that is normally open, and after a designated travel the switch probe closes. The most common use for switch probes is in the cable harness testing industry. The switch probe is used to verify the correct location of a terminal in a connector while checking the retention force as well. Switch probes also verify the presence of nonconductive components such as caps for connectors or devices on a circuit board. Smiths Interconnect offers three standard sizes of switch probes.
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Active Probe 50Ohm Single Ended SMB
80609000
The single ended active probe helps to carry weak HF signals far away with the minimum disturbance of the original source. The module accepts discrete wiring or direct spring loaded test probe solder. In any case, the input signal wires might be as short as possible.
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Active Probe 75Ohm Single Ended SMB
80609007
The single ended active probe helps to carry weak HF signals far away with the minimum disturbance of the original source. The module accepts discrete wiring or direct spring loaded test probe solder. In any case, the input signal wires might be as short as possible.
