Showing results: 1 - 15 of 27 items found.
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SiliconAid Solutions, Inc.
SiliconAid Solutions provides expert consulting services for all aspects of semiconductor Design-for-Test (DFT) development and implementation. Staffed by experts with proven track records from major semiconductor manufacturers, SiliconAid focused expertise provides you resources when and where you need them the most.
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DFT- PRO Plus -
Syntest Technologies
DFT-PRO Plus offers an integrated DFT solution covering scan synthesis and ATPG, memory Built-In Self-Test (BIST) synthesis and boundaryscan (BSD) synthesis. The corresponding tools generate RTL blocks that fit seamlessly into an existing synthesis flow
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Corelis, Inc.
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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NEBULA Silicon Debugger -
Intellitech Corp.
NEBULA provides advanced features for performing early validation of DFT infrastructure and ATPG patterns in first silicon. The NEBULA solution directly imports test pattern formats and DFT information from leading EDA vendor tools, such as Synopsys' TetraMAX and Cadence's Encounter Test.
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TestWay -
ASTER Technologies
TestWay's electrical DfT analyzer enables designers to validate designs at the schematic capture stage, to ensure that adequate measures have been included to comply with the manufacturers test requirements. The ability to verify that PCB designs have been developed with adequate Design-for-Test in mind, is key in determining the most effective test strategies and accurately calculating fault coverage, which is crucial in improving competitive advantage, lowering cost and ensuring product quality.
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ScanExpress DFT Analyzer -
Corelis, Inc.
Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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TurboDFT -
Syntest Technologies
TurboDFT contains a suite of very useful and powerful DFT integration tools. TurboDFT allows users to automatically integrate and stitch DFT cores, whether they are created using DFT tools from SynTest or other vendors
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Test Coach Corporation
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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DeFelsko Corp.
Coating thickness or dry film thickness (DFT) is an important variable that plays a role in product quality, process control, and cost control. Measurement of film thickness can be accomplished by selecting the best mil gage for the particular application.
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Averna
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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SD1000 -
Powertek LLC
The SD1000 phase meter offers superb accuracy with a wide range of signal conditions. Conventional phase meters are easily upset when small levels of noise and distortion are present - the result is often unstable and incorrect phase readings. The SD1000 overcomes this by using Discrete Fourier Analysis (DFT), this process rejects any noise and distortion without the need for tracking filters.
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EL & Associates, Inc.
EL & Associates, Inc. specializes in integrated solutions for design (RTL to GDSII), Design-For-Test (DFT) and Design-For-Manufacturing (DFM) services for ASIC, ASSP, COT, and FPGA. We engage with customers from RTL phase to silicon prototype. The ELA methodology is optimized to manage risk in design, manufacture and product deployment. ELA has successfully completed over 750 designs to date.
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NF Corp.
A/D converted input signals undergo discrete Fourier transform (DFT) to calculate complex impedance values and obtain parameters and characteristics specific to the DUT, such as its capacitance, inductance and quality factor. Original NF algorithms are also applied to allow equivalent circuits made up of R, L and C along with the constants for those circuits to be estimated from the complex impedance spectrum obtained by sweeping the frequencies.
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NI
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.