Showing results: 1006 - 1020 of 1055 items found.
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781046-01 -
NI
PCI Express, 16 AI (16-Bit, 500 kS/s), 2 AO (900 kS/s), 24 DIO Multifunction I/O Device - The PCIe‑6341 offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe‑6341 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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781043-01 -
NI
PCI Express, 16 AI (16-Bit, 250 kS/s), 24 DIO Multifunction I/O Device - The PCIe‑6320 offers analog input, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe‑6320 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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779949-01 -
NI
48-Channel, Sink/Source Inputs, Channel-Channel Isolated PXI Digital I/O Module—The PXI‑6529 is an industrial, parallel digital input interface. PXI‑6529 devices are ideal for a variety of applications from automotive design, industrial factory automation, and machine control to aerospace, laboratory research, and biomedical applications. With programmable power-up states, you can configure the initial output states in software to ensure safe operation when connected to industrial actuators. If a computer or application fault occurs, the PXI‑6529 can use digital I/O watchdogs to switch to a configurable safe output state to ensure detection and safe recovery from fault conditions. Programmable input filters eliminate glitches/spikes and provide debouncing for digital switches/relays through a software-selectable digital filter.
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ATE-2 -
Lisun Electronics Inc.
•This system includes 2 groups (left and right); the 2 groups can work in turn, so that to improve the work efficiency. For example, if the left is on working, then the right can make wire connection. •It can test 4 LED drivers input and output at one time. •The equipment can connect with electronic load and LED load, the two difference loads can be fast switch under the control of computer. •Enable to print out the series number and parameters of sub-quality products by working with a micro-printer, •Enable to achieve the bar-code record function by working with a bar-code scanner. •The test report can be saved as Excel file for consult, statistic and analysis purpose. •Good software interface to freely choose the difference parameters combination, so that to meet different demands. All the parameters can set limit, and with the quality analysis function.
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IT8700 Series -
I-TECH Electronic Co., Ltd
IT8700 series programmable DC electronic load adopts removable modules design, supports up to 16 channels with mainframe extension transient mode up to 25 kHz, which improves your test efficiency, with high resolution and accuracy. Users can freely choose in the 8 load modules according to the number of channels and power requirements, controlled by mainframe control panel, or controlled by host computer software via built-in LAN / RS232 /USB / GPIB interface. IT8700 is with adjustable slope, list function, automatic test and other functions, and can be applied to multiple or single output AC/ DC, DC / DC power converters, chargers and other power supply electronic components performance test, also can be used in ATE test system, solar cells, LED, communications testing, aerospace and other fields.
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Instron
The Instron® Curved Needle Testing System is built on the 5900 system platform and is ideally suited for needles used in abdominal, fistula, vascular, intestinal, or other surgical procedures. This system provides two different needle testing solutions: one for curved needle puncture testing and one for bend testing. The curved needle puncture testing fixture is used to evaluate needle sharpness and insertion force, while the needle bend testing fixture is used to evaluate flexural properties of the needle during use. With its tabletop design, the Curved Needle Testing System has a small footprint and takes up minimal bench-top space. The testing system operates with Instron Bluehill® Universal software that provides test control, data acquisition, test results, and reports, as well as a large library of calculations.
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LCIC-4HS -
Industrial Measurement Systems Ltd.
Four Channel Load Cell Interface Card Model LCIC-4HS The LCIC-4HS is a four channel load-cell interface board for the IBM PC/AT and compatible computers (ISA Bus). This board was especially designed to fit very fast and real-time weighing applications such as multi-head fillers. It supports up to four channels with one load-cell on each. All the necessary filters and the batching control functions are built on the board and are easily accessible by the user. Direct communication with the PC bus and high-frequency sampling enables the LCIC-4HS to handle all real-time applications and to achieve very high accuracy. The LCIC-4HS is memory-mapped. Up to 32 boards (128 channels) may be installed in a single PC. It comes with a detailed user manual and software utilities for easy installation and calibration as well as full examples for the programmer (including Win 95/98 drivers).
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81049-01 -
NI
PCI Express, 32 AI, (16-Bit, 1.25 MS/s), 4 AO (2.86 MS/s), 48 DIO Multifunction I/O Device - The PCIe‑6353 offers analog I/O, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality … leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe‑6353 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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N5990A -
Keysight Technologies
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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785813-01 -
NI
PCIe, 8 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, Multifunction I/O Device - The PCIe-6346 offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality, leveraging the high-throughput PCI Express (PCIe) bus and multicore-optimized driver and application software. Because of its multi-ADC architecture, the device offers simultaneous sampling. Onboard NI-STC3 timing and synchronization technology deliver advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe-6346 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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781048-01 -
NI
PCI Express, 16 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO Multifunction I/O Device - The PCIe‑6351 offers analog I/O, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe‑6351 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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781044-01 -
NI
PCI Express, 16 AI (16-Bit, 250 kS/s), 2 AO (900 kS/s), 24 DIO Multifunction I/O Device - The PCIe‑6321 offers analog I/O, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe‑6321 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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785809-01 -
NI
8 AI (16-Bit, 3.5 MS/s/ch), 2 AO, 24 DIO, Multifunction I/O Device - The PCIe‑6376 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, four 32‑bit counters, and analog and digital triggering. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe‑6376 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included DAQExpress™ companion software provides basic measurement and analysis, while the NI‑DAQmx driver provides the ability to create customized automated measurement and control applications.
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781050-01 -
NI
PCI Express 16 AI (16-Bit, 2 MS/s), 2 AO (2.86 MS/s), 24 DIO Multifunction I/O Device - The PCIe‑6361 offers analog I/O, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality leveraging the high-throughput PCI Express bus and multicore-optimized driver and application software. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe‑6361 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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LXinstruments GmbH
LXinstruments FCT systems for industrial electronics assemblies are particularly suited for applications with a large variant diversity for medium volume sizes. They are used for testing utility electronics as well as for drive control and grid management systems. We have also implemented systems for functional test, repair and calibration of decentralized PLC I/O assemblies.Since early failures in the field often lead to enormous costs, we not only provide functional test systems, but also burn-in systems for simultaneous testing of many assemblies in a climate chamber. Due to the modular structure of our software, it is possible to establish a logical separation between the definition of the climatic profile to be executed and the actual test sequence, during which the different electrical tests are processed. Connections to HALT/HASS systems can also be established without problems.
