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CiCi-Raman-NIR Spectrometer
HORIBA Scientific is the world leader in Raman spectroscopy, with a long history in the technique. HORIBA OEM has pioneered Raman systems for spectroscopy, designing and manufacturing them for over four decades. We provide miniature spectrometers and systems for industrial applications such as process control, security, pharmaceutical, medical and semiconductor. The CiCi-Raman-785 is our high performance spectrometer featuring an aberration-corrected concave holographic grating configured with Horiba Scientific's Syncerity™ TE-cooled CCD camera with a VIS-NIR 2048 x 70 detector, in a TE-cooled Head at -50° C.
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Optical Profiler
DRK8090
Shandong Drick Instruments Co., Ltd.
This instrument uses noncontact, optical phase shift interferometry method does not damage the surface when measuring graphics can be quickly measured by a variety of three dimensional surface morphology, and analyzed to calculate the measurement results. Suitable for measuring a variety of blocks, the surface roughness of optical components; scale, dial the groove depth; magnetic (optical) disk, the head surface texture measurements; structural morphology of coating thickness and coating trough structure at the boundary of the grating; silicon surface roughness measurement and the graph structure and so on.
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Traffic Control Cabinets
Our intelligent traffic control cabinet designs are based on the most popular features of Safetran’s Caltrans, NEMA, and ITS cabinets. The ATCC uses high-speed serial communications, providing modern features, advanced diagnostics, enhanced safety, simplified traffic control cabinet wiring, and reduced traffic control cabinet size. The ATCC Standard supports both 120 VAC and 48-volt DC signal heads, while high-density load switches and quad detector modules allow for up to 32 signal outputs and 120 detection inputs.
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Universal Preamplifier 14
UP14
For Two Dimensional Magnetic Recording (TDMR) and Heat-assisted Magnetic Recording (HAMR) Headamplifiers. Universal Preamplifier 14 (UP14) is designed for TDMR and HAMR Head Amplifiers. With new Guzik RWA4000 TDMR, UP14 allows to process signals from three Read Channels. It also supports two high speed data channels for Write data and Laser data. UP14 has two channels for dynamic TFC control and allows to program TFC power per sector and close loop TFC power control in each channel. UP14 can generate two programmable modulation signals for write data and laser data with bandwidth up to 20 MHz. UP14 consist of two boards. The first UP14 RW Board processes high-frequency signals: read-back signals, write data and laser data. The second UP14 Control Board provides power, control and low-frequency signal generation: TFC, write data modulation and laser modulation.
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Whole Body EM Phantoms
EM - PHANTOM
Schmid & Partner Engineering AG
The POsable Phantom for Electromagnetic sYstems Evaluations (POPEYE) is an anatomically correct human phantom based on a torso shell w/ head with posable arms, hands and legs. This radio frequency (RF) human has been designed to meet the requirements for test configurations for which the effects of the body on the EM performance cannot be neglected, such as operating tablet and laptop computers and other body-mounted transmitters. With a simple adjustment (one tightening screw), the arms, hands and legs can be positioned accordingly for conducting simulations of any usage or operation (standing, sitting, arms raised, talking position, etc...).
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Partial discharge measurement with remote wireless reading
PD-LT
The PD-LT allows online partial discharge detection on cable accessories such as cable head for safety and maintenance purposes.The PD-LT indicates the intensity of the partial discharges, converting the electrical charge units (pC) into decibels (dB). Thus the reading is kept as a simple intensity level indication, proportional to the probability of a fault's presence in the tested medium voltage accessory.The remote display gives a dB value of the probe's measurement. The dB value will vary along with the discharges indicators on the PD-LT probe. The measurement range is from 0 to 65dB and the display will show ''OL'' if the reading is over 65dB.
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Wafer Probe Loadboards/PIB
DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.
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Precise Testing & Simulation of A2B® Networks
A2B®-Component-Tester
The Automotive Audio Bus (A²B®) is a bus developed by Analog Devices Inc. for infotainment systems in automobiles. It is increasingly being used in other applications such as AV conferencing systems. Typical A²B® -products are Hi-Fi amplifiers/speakers, head units, eCall systems, microphones, vibration/noise suppression units, actuators, or sensorsCommunication happens via a simple two-wire UTP (Unshielded Twist Pair) cable. All A²B® -components are connected in a master/slave architecture to form a network. The complexity of audio systems in these A²B® -networks is reduced, and with it the cost and weight.
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Portable Bar Code Verifier
Inspector Model D4000 CR2 Scanner
The Model D4000 CR2 Scanner provide a Point-and-Shoot Traditional Method that also includes the ISO 15416 and ANSI X3.182 Decodability parameter grade. This unique portable bar code verifier can interface with either the patented RJS Auto-Optic scan head or a CR2 scanner (either in a single piece or connected with a cable). Store and print capability, multiple scan averaging and subsymbology choices are easily accessed through a simple four-button user interface. The scanners are easily installed by the user, which makes the unit quickly adaptable to practically any verification requirement.
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Portable Bar Code Verifier
Inspector 5000 CR3 Scanner
The Inspector 5000 CR3 Scanner provide a Point-and-Shoot Traditional Method that also includes the ISO 15416 and ANSI X3.182 Decodability parameter grade. This unique portable bar code verifier can interface with either a CR3 scanner or the patented RJS Auto-Optic scan head. Store and print capability, multiple scan averaging and subsymbology choices are easily accessed through a simple seven-button user interface with a large color LCD display. The scanners are easily installed by the user, which makes the unit quickly adaptable to practically any verification requirement.
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÷10 HiZ 500 MHz Passive Probe for WaveSufer 400 Series Oscilloscopes.
PP007-WS-1
The PP007 embodies leading technology in passive probe design. The small probe is optimized for maximum waveform fidelity, including high frequency signal components, in a rugged probe suitable for every day.The sharp probe tip* is spring loaded, allowing it to retract into the narrow probe head. The tip does not slip off the object being probed—important when probing small geometry surface-mounted components. Probing dense circuits is easier with the small 2.5 mm ground sleeve, which provides much better visibility than 5 mm and 3.5 mm probes.
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Passive Probe, 500 MHz, 2.5mm Tip
PP007-WR-1
The PP007 embodies leading technology in passive probe design. The small probe is optimized for maximum waveform fidelity, including high frequency signal components, in a rugged probe suitable for every day.The sharp probe tip* is spring loaded, allowing it to retract into the narrow probe head. The tip does not slip off the object being probed—important when probing small geometry surface-mounted components. Probing dense circuits is easier with the small 2.5 mm ground sleeve, which provides much better visibility than 5 mm and 3.5 mm probes.
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Memory Burn-In Test
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies. Up to 64 Blades populated in one test head can test over 2000 DUTs in parallel. Neosem Technology’s high parallel DUT count architecture, combined with low capital cost, provides the absolute lowest HVM cost of test.
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Multi-Channel Gas Detection Controller
MCA
The Neutronics MCA Multi-Channel Controllers are designed to accept up to 8 inputs. Primarily used with gas detector heads, the MCA controllers will also accept individual inputs from various types of monitoring instruments or transducers. A backlit LED display is provided to show the status of each channel, display graphs, and enable configuration of the unit (set alarm levels, program the output relay voting, etc.). The MCA can be programmed on-site by the user using the password protected configuration program. Each monitoring channel provides relay contact outputs along with 4-20mA and voltage outputs.
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Short Pulse High-Frequency Laser Marker
LP-RV SERIES
Panasonic Industrial Devices Sales Company of America
The LP-RV Series FAYb Laser Marker features:- Short Pulse 20W Fiber Laser Offers Excellent Mark Contrast On Difficult To Mark Plastics And Various Other Materials- Optional EtherNET/IP Or ProfiNET Interface Adaptor Card- Modular Laser Oscillator System Makes Servicing In The Field Possible - Direct Connection To Panasonic PV230 Vision System For Mark Verification, Auto-Targeting, And Other Machine Vision Functions- Compact IP64-Rated Marking Head For Use In Harsh Environments- Compliant With FDA Regulations, GB Standard, KC Mark, Machinery Directive (Declaration of Incorporation), EMC Directive, RoHS Directive
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Fiber Optic Sensors
Leuze electronic GmbH + Co. KG
Plastic fiber optics are suitable for universal applications with low space requirements for object detection. Glass fiber optics are used in demanding environmental conditions with high temperatures and are resistant to chemicals. For radiation through foils or applications with high light power, they offer further advantages through the especially low damping. The flexible fiber optics with various head shapes can be integrated in nearly any system design. The detection range is dependent on the fiber optics and amplifiers used. Fiber optics can be used with the throughbeam principle or with scanning function. As a fiber array with multiple light beams, they can be used to detect especially small objects.
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Cryocooler
CryoTel® DS30
The CryoTel® DS 30 Stirling cryocooler offers efficient, reliable, compact and high power cooling to the market in the temperature range of 35 to 250 Kelvin. The DS30 was optimized for applications in which SWAP (size, weight and power) and reliability are concerns. The DS30 consumes considerably less power than other cooling alternatives and requires no maintenance, making it ideal for strategic as well as industrial applications. Both the cold head and the pressure wave generator can be mounted in any orientation. Application examples include semiconductor manufacturing, large infrared detectors, RF receivers or antennas, astronomical telescopes, laser cooling, high-temperature superconductivity, cold traps, and others.
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Oscilloscope Software Module
Metra Mess- und Frequenztechnik in Radebeul e.K.
*Oscilloscope for transient vibration signals*Displays the time response of vibration acceleration and VM-SCOPE+ also for velocity and displacement*Suitable for shock and drop testing of packagings and other products *Memory for 110 s post-trigger and 1 s pre-trigger real time signal recording*Two measuring cursors*Export function for bitmap and text*Up to four signals per window*One VM-SCOPE license can be operated simultaneously up to four times with different settings *Measurement of decay time*Measurement of HIC (Head Injury Criterion)*VM-SCOPE may trigger the frequency analyzer module VM-FFT*External Messengers *Offline measurement
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Picosecond Laser
PIXEA
The PIXEA is a high-quality laser system for OEM and R&D applications generating ultra-short optical pulses by using gain-switched laser diode technologies. The laser features high-quality picosecond laser pulses with no satellite pulses and minimize pulse tail. The PIXEA series offer a large variety of centered wavelengths between 375 nm and 2 um. The pulse duration down to 20 ps is optimized for each wavelength. The system is based in two modules or one module, the laser head and the dedicated Control Unit including the GUI software. Different optical output options are available, including free space collimating optics and fiber coupled.
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Near Field Probes 1GHz - 10 GHz
SX set
The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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Temperature Forcing System
ETF-SERIES
Precise Temperature Accuracies with Reliable Test Results Temperature Limits: -40/-60 °C to 30 °C Temperature Accuracies: ±2-3°C Temperature Rate of Change: 20-25 deg /min (Non-linear) Maintenance Free Access to The System Self-Sufficient System Compact with small footprints suitable for any space constraint laboratories Low decibel system Suitable for testing electronic chips / devices Environmentally friendly refrigerants Efficient heating Microprocessor based single set point PID temperature controller with data logging Flexible hose up to 2.5-3.0m Interchangeable heads according to chip size. Inbuilt electrical control panel with switchgear system
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Precision Flying Probe Platforms For Automated Test Applications
Flying Probe technology is used to automate the testing of printed circuit boards (PCB) that would otherwise have to be tested manually. Adding a Huntron Access Prober to your test procedure will significantly decrease test times therefore increasing productivity.Access Probers can accurately place a probe on test points with high accuracy achieved using micro-stepping motors and linear laser encoders. Probing the smallest surface mounted devices is possible. Huntron Access Probers can automate your unique test process using the standard probe or by adding a custom probe of your design. Huntron offers three Flying Probe system configurations based on PCB size and test head requirements.
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Comprehensive Simulation of Master, Slave and End Nodes in A 2 B ® Networks
Infotainment Test Device ITD 1024
The complexity, cost and weight of audio systems are significantly reduced with the Automotive Audio Bus (A 2 B ® ) from Analog Devices Inc. Regardless of their hierarchical structure or use as master or slave, all A 2 B ® products must be adequately tested before use. This applies, for example, to HiFi amplifiers/loudspeakers, head units, eCall systems, microphones, vibration/noise suppression units, actuators or sensors.Our small and very compact infotainment test system ITD 1024 takes on this task for you: It comprehensively and extremely reliably tests all A 2 B ® signals and communication in all phases of the product development process - during development, for validation and in production.
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Beam Profiling
The beam propagation factor M2 is a common single parameter that charac-terizes the whole beam as it propagates through space. According to ISO standard 11146, this parameter could be defined by several measurement techniques based on beam profiling along several points of the propagating beam. The standard defines several measurement techniques, all of which are based on beam profiling measurements using devices such as cam-eras, knife edge and slits. There are two main measurement requierments - 1) Measurements of focused beams. 2) Measurements of collimated beams. Our M2 devices are capable of measurements of both laser types and due to their modular design interchangeable heads can be mounted in same M2 gear.
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CPRI Interface Panel Kits for Connectivity Testing
RFS’ CPRI Interface Panels are used to test fiber connectivity between Optical Base Band Units (BBU) and Remote Radio Heads (RRH), allowing cell operations and system performance engineers to ensure the best performance without having to disconnect the fiber optical system or disrupt service. In addition, the CPRI panel enables easy RF over CPRI testing at the bottom of the tower, reducing the need for unnecessary tower climbs, thus minimizing maintenance cost and overall OPEX for customers. The RFS CPRI panel is bundled with RFS’ high-quality fiber optic jumpers, providing an end-to-end solution that includes HYBRIFLEX® fiber-to-the-antenna DC and F/O solutions.
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Acoustic Probe
AA-Ultrasonic
The AA-Ultrasonic acoustic probe is designed for use on air insulated terminations where a clear sound path between the electrically stressed insulation and the probe is present. The sensor is extremely sensitive and can detect activity below 10pC. The probe has a magnetic base to allow coupling to steel enclosures and a swivel head as so the detecting sensor can be aimed directly at the HV point. Corona in air and surface tracking can seriously damage high voltage insulating surfaces in a way that will ultimately lead to flashover and complete failure of the insulator. This discharge activity creates acoustic emission that can be detected using a high frequency sensor. The magnitude of the acoustic emission is indicative of the degree and severity of the discharge activity.
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Universal Spring Impact Hammer 0.14J To 1.0J
CX-T03
Shenzhen Chuangxin Instruments Co., Ltd.
The Universal Impact Hammer is designed to perform impact tests for product durability. The CX-T03 meets the testing needs of industry standards such as IEC 60065, 60335, 60598, 60601, 61010 and others. The hammer simulates mechanical impact to electronic products and electrical appliances. This impact hammer is versatile -- it can be dialed to a whole range of energy values to perform tests to many different standards. A compressed spring accelerates a hammer head to hit the sample undergoing test. The spring is released from a lock mechanism by pressing the cone-shaped top of the impact hammer against the product under test. The CX-T03 is adjustable from 0.2 Nm to 1 Nm by turning a ring on the hammer.
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Scanner Probe
RFS set
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
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Near Field Probes 30 MHz up to 3 GHz
RF1 set
The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Micro probes 1 MHz up to 6 GHz
MFA 01 set
The micro probes are used to measure magnetic fields and they have a high resolution. They measure magnetic fields up to 6 GHz, e.g. at signal conductors (150µm), SMD components (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the Bias tee BT 706. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee BT 706 to a spectrum analyzer or an oscilloscope. Langer EMV-Technik GmbH includes correction lines in the delivery. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.