Showing results: 496 - 510 of 580 items found.
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SIFT -
FA Instruments
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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ED-205 -
Standard Electric Works Co., Ltd
● Dimension：91(L) × 103(W) × 100(D)mm● Deflection Angle : 90°● Scale Length：Approx. 65mm ● Terminal： 4mm socket captive head, suitable for wire or pin-type test lead.● Material And Color： Acrylic resin meter cover, white scale plate, plastic stand in black.● Safety Standard： IEC/EN 61010-1 CAT Ⅱ 300V EN 61326-1 EN 61000-4-2 EN 61000-4-3
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SphereOptics GmbH
Goniometer has the capability not to only fit into almost every optical laboratory, but also to provide measurement data on concise level. The type C set up of this instrument enables the developer of single LEDs, LED modules or chips to study angular performance in many development stages; fast and most important: reliable. The detector head of the goniometer is a high-quality, visible-range spectrometer, equipped with diffuser optics to collect all important measurement quantities over the customer required angular range. With a maximum allowable source sample size of 300mmx100mm and 25kg, the new benchtop goniometer covers a wide range of LED measurement requirements. The footprint of the instrument itself with 1.65mx0.60mx1.73m allows the usage also in small dark rooms and optical laboratories.
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SphereOptics GmbH
This small goniometer has the capability not to only fit into almost every optical laboratory, but also to provide measurement data on concise level. The type C set up of this instrument enables the developer of single LEDs, LED modules or chips to study angular performance in many development stages; fast and most important: reliable. The detector head of the goniometer is a high-quality, visible-range spectrometer, equipped with diffuser optics to collect all important measurement quantities over the customer required angular range. With a maximum allowable source sample size of 300mmx100mm and 25kg, the new benchtop goniometer covers a wide range of LED measurement requirements. The footprint of the instrument itself with 1.65mx0.60mx1.73m allows the usage also in small dark rooms and optical laboratories.
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Micro-Epsilon Group
Laser scanners from Micro-Epsilon are among the highest performing profile sensors in the world with respect to accuracy and measuring rate. They detect, measure and evaluate profiles on different object surfaces without contact. The available models are suitable for numerous industrial applications. The integrated intelligence in their sensor head (scanCONTROL SMART) solves versatile measurement tasks. Models for the customer’s own programming are available for integrators. The scanCONTROL profile scanners do not require any external controller.
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Amida Technology, Inc.
The AMIDA-3KS test system provides a lower cost, cost-optimized test solution for all consumer power management ICs and portable product components. The AMIDA-3KS tester provides 6 board slots in the test head for the required number of analog board channels, thus reducing the overall system procurement cost, making the cost-effectiveness of each board channel 2 times higher and more flexible. The customer's product testing time is greatly shortened.
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GATS-3200 -
W.M. Hague Company
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
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AEP Technology
AEP Technology offers unique nanomechanical testers with a variety of interchangeable test heads that allow nanoindentation, scratch testing, microindentation testing and abrasion testing to be performed on the same platform. The rugged platform with built-in high-resolution imaging systems (atomic force microscope, 3D profiler, etc.) makes the UNT-30 a powerful tool for R&D and production. In order to ensure the high reliability of the data, the tester is also equipped with a shockproof platform and a soundproof cover.
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NanoScan -
mks Ophir
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
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Fieldpiece Instruments, Inc
The In-Duct Hot-Wire Anemometer & Psychrometer accessory head, AAT3 allows HVACR professionals to measure air velocity, temperature, and %RH all in one tool. The engineered 38" telescoping probe with laser etching and quick-response sensor provides quick and easy airflow measurements from the correct location--near the evaporator. When using with the Fieldpiece HVAC Guide System Analyzers, the AAT3 can automatically calculate target super heat and target evaporator exit temperature.
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Well-Camera.1 -
PASI srl
Taking advantage of our vast experience in designing and manufacturing TV-inspection systems for boreholes and wells, we created the innovative WELL-CAMERA Series that follows all our Customer’ requests about an easy use, reliable, compact and lightweight instrument for field operations. The complete system consist of: reel and camera head, display unit with integrated LCD, USB2 grabber board and microphone, battery charger. Pictures, movies and comments can be saved to any external laptop.
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International Gas Detectors Ltd
We offer a vast and versatile product range with detector heads for every possible environment. Pioneering the use of addressable gas detection systems IGD today offer the latest networked systems. Our latest addressable gas detection systems network using IGD’s Sentinel+ 2-Wire protocol for enhanced operation and security. IGD is the home of addressable gas detection but we still offer legacy analogue detectors used to interface to older systems.
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Harwin Plc
ATE Probes, Pogo pins and Contact Pads. Gold-plated, spring-loaded, capable of thousands of cycles. Probes for Automated Test Equipment (ATE). Various height SMT contact pins. Flat SMT contact pads. Spring loaded contacts consist of a plunger (or head), barrel (or body), and a fully encapsulated fine spring, to provide the spring force required to maintain positive contact. All have a high durability, exceeding 10,000 mating cycles.
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UVISEL -
HORIBA, Ltd.
The UVISEL Spectroscopic Phase Modulated Ellipsometer is a turn-key thin film metrology instrument for in-line measurement of thin film thickness and optical properties. It features rapid measurement capability with data acquired every 50 ms for powerful control of thin film uniformity across the entire web.The design of the UVISEL ellipsometric heads allows simple integration into roll-to-roll systems, while the software provides advanced communication capabilities suited to roll-to-roll production.
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S2-2 -
Dwyer Instruments Inc.
The Series S2-2 General Purpose Surface Temperature Assembly is ideal for monitoring the temperature of indoor distribution lines when it is not possible to penetrate the pipe. The plastic housing is in the shape of a standard junction box with multiple knockouts for easy conduit access. The strap-on connection quickly wraps around a pipe and can be securely tightened using a flat head screw driver. The Series S2-2 can be ordered with a choice of 11 output options that allow it to communicate to any standard building control system
