Showing results: 181 - 195 of 205 items found.
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Pulse Instruments
Multiple timing signals ("clocks") are required by CCDs, IR FPAs, and some CMOS image sensors to transport electrical charge across the array to a sense amplifier for conversion into image data. Pulse Instruments offers a line of "clock drivers" for generating these timing signals. The parameters of these clocks (clock rate, pulse width, pulse amplitude, rise- and fall-times, etc.) greatly influence the behavior and performance of the imaging device. Our products take logic-level inputs from a pattern generator and allow the user to adjust the output parameters to suit their device and testing requirements. Clocks can be "tweaked" in real-time to determine optimal operating parameters for a particular device, or else programmed in accordance with a test plan for automated production test.
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CA9806 -
UC Instruments, Corp.
The UC INSTRUEMNTS CA9806 is a high performance, flexible four channel Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (consult factory for higher or lower operation speeds). It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build‐in 8.5 ~ 15 Gb/s eye diagram testing function.
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Mirotech
Mirotech manufactures portable benchtop PCB test fixture kits and provides customized test fixture solutions for the electronics industry. Our innovative, streamlined designs are compact in size and feature a linear collapsing system, interchangeable and reusable plate design, top and bottom probing, and are affordably priced. All fixtures are built using high quality hardware and materials and manufactured using the DATRON M8Cube, known for its precision and accuracy. Each of our custom designs are unique to our customer’s particular project requirements. Fixture kits come pre-assembled, and include blank plates ready for you to drill your test pattern.
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Eye-BERT 100G -
Spectronix
The Eye-BERT 100G is a low cost, full-featured, stand-alone communication test set with an integrated post equalizer eye opening monitor / scanner. Ultimate flexibility is provided with three different physical interfaces, 13 different configurations, and configurable transmit and receive clocks. The tester supports PRBS patterns up to 263-1 and select data rates from 1.25 to 29Gbps on up to 4 simultaneous channels. Front panel controls are also provided for stand-alone operation. Unlike competing products, fast post equalizer eye monitoring and scanning is included and can be performed on any input channel above 5Gbps.
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USB Explorer 260 -
Ellisys Sàrl
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
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FOX-XP -
Aehr Test Systems
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Schwarzbeck Mess Elektronik
The broadband horn antennas BBHA 9120 offer a very low SWR in their nominal frequency range and a very broad bandwidth. The gain increases with frequency up to approx. 21 dBi, depending on the horn's size and shape. The increasing gain with frequency helps to compensate cable losses. The BBHA 9120 series is suitable for both, transmission and receiving applications. The max. allowed Input Power is only limited by the female N-connector. The detailed manual of the calibrated test antennas includes Gain, Antenna Factor, SWR and Directional Patterns. The antenna is mounted with the 22 mm tube, equipped with a Index Ring for quick changes of polarisation without using tools.
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AP-B Series -
Applied Image, Inc.
A unique concept in imaging calibration technology, The ACCUplace Bulls Eye / Recognition Grid allows the end user to calibrate magnification at multiple power levels, as well as test the system’s ability to recognize and locate distinctive shapes within shapes by focusing on the concentric circles.Each Bulls Eye / Recognition Grid target has individual patterns consisting of 5 concentric circles with 0.50mm line width and 0.50mm spacing between circles (10mm Pitch) with a 0.100mm center dot. In addition, each row and column is labeled with X & Y coordinates. The AP-B series is offered on four standard substrates; Chrome on Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).
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GX5292e -
Marvin Test Solutions, Inc.
The GX5292e is a high performance, cost-effective 3U PXI Express dynamic digital I/O boards offering 32 TTL or LVDS input or output channels with dynamic direction control. The GX5292e also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 100 MHz. The single board design supports both master and slave functionality without the use of add-on modules.
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upj10 -
KEYCOM Corp
KEYCOM''s cryogenic millimeter-wave / microwave test fixtures and calibration kits are specifically optimized for testing the performance of patterns between the edges of printed boards(edge type) and circuit testing on the printed boards(probe type). They are also designed to minimize heat capacity by miniaturizing their dimensions so they cool off efficiently, and materials with low coefficient of linear thermal expansion such as invar are used for major parts where high dimensional stability is required. Their operating frequency ranges from DC to 110GHz.
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Raymond RF Measurements Corp.
Raymond RF's Antenna Measurement Software performs 2-D (polar/rectangular) and 3-D (spherical) antenna pattern measurements for passive antennas and active wireless mobile stations (cell phones). Insertion loss of passive devices is included as part of the calibration component. Data management and reporting of antenna properties such as half power beam-width, directivity, gain, radiation efficiency, total radiated power, and total isotropic sensitivity. AMS performs and reports all measurements required by the CTIA Over-the-Air Performance Test Plan.
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Eye-BERT Micro -
Spectronix
The Eye-BERT Micro is a low cost, easy to use, all-in-one SFP based fiber optic test solution offering high performance bit error rate testing at a fraction of the cost while providing a rich set of features not found in other bit error rate testers. Features include: variable bit rate, user programmable patterns, and optical power and temperature monitoring (per SFP capability). Additionally, with a click of a button, the Eye-BERT Micro will automatically test an SFP module based on the information it reads from the module and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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Eye-BERT Micro 10G -
Spectronix
The Eye-BERT Micro 10G is a low cost, easy to use, all-in-one XFP based fiber optic test solution offering high performance bit error rate testing at a fraction of the cost while providing a rich set of features not found in other bit error rate testers. Features include: variable bit rate, user programmable patterns, diagnostic monitoring, and wavelength tuning (per XFP capability). Additionally, with a click of a button, the Eye-BERT Micro 10G will automatically test an XFP module based on the information it reads from the transceiver and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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LT 4610 -
Leader Electronics Corp.
The LT 4610 is 1RU full-rack size sync signal generator that can output triple-rate SDI (3G-SDI/HD-SDI/SD-SDI) signals. It employs two power supply units for redundant operation to protect against power supply failures. The genlock function for external sync signals enables SDI signals, six sets of analog black burst sync signals, and audio word-clock signals to be output synchronously. The genlock function is equipped with a STAY IN SYNC function that maintains the phase when errors occur in the input signal, making it possible to provide stable sync systems.In addition to test pattern output including color bars and SDI check fields, the LT 4610 can embed ID characters, QVGA logo marks, safety area markers, and embedded audio in a SDI signal output.
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NI
PXI Digital Waveform Instruments feature up to 32 channels, can sample and generate digital waveforms at up to 200 MHz, and interface with various standard TTL and low-voltage differential signals (LVDS), as well as settable voltage levels. These devices offer per clock cycle, per channel bidirectional control, and phase shifting. They include deep onboard memory with triggering and pattern sequencing. Some models also support doubledatarate (DDR) technology and real-time hardware data comparison. You can use Digital Waveform Devices to create device simulation and complex stimulusresponse tests.
