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Test Pattern
Test signals for the calibration and alignment of TV broadcast and reception equipment.
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Dynamic Digital I/O (3U), 32 Ch., Per Pin Control, Up To 100 MHz W/256MB Memory & LVDS
GX5292
The GX5290 Series are a high performance, cost-effective 3U PXI dynamic digital I/O boards offering 32 digital input or output channels with dynamic direction control. The GX5290 Series also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.Dynamic Digital I/O (3U), 32 ch., per Pin Control, up to 100 MHz w/256MB Memory & LVDS
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Dynamic Digital I/O (3U), 32 Channel, 50 MHz
GX5291-50
The GX5290 Series are a high performance, cost-effective 3U PXI dynamic digital I/O boards offering 32 digital input or output channels with dynamic direction control. The GX5290 Series also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.Dynamic Digital I/O (3U), 32 ch. up to 50 MHz w/128MB On-Board Memory, 32-ch Domain.
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Protocol Test System
USB Explorer 260
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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ACCUplace BullsEye /Recognition Grid
AP-B Series
A unique concept in imaging calibration technology, The ACCUplace Bulls Eye / Recognition Grid allows the end user to calibrate magnification at multiple power levels, as well as test the system’s ability to recognize and locate distinctive shapes within shapes by focusing on the concentric circles.Each Bulls Eye / Recognition Grid target has individual patterns consisting of 5 concentric circles with 0.50mm line width and 0.50mm spacing between circles (10mm Pitch) with a 0.100mm center dot. In addition, each row and column is labeled with X & Y coordinates. The AP-B series is offered on four standard substrates; Chrome on Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).
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Dynamically Controlled, High Speed Digital I/O PXI Express Card
GX5292e
The GX5292e is a high performance, cost-effective 3U PXI Express dynamic digital I/O boards offering 32 TTL or LVDS input or output channels with dynamic direction control. The GX5292e also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 100 MHz. The single board design supports both master and slave functionality without the use of add-on modules.
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Cryogenic Millimeter-Wave / Microwave Test Fixtures and Calibration Kits
upj10
KEYCOM''s cryogenic millimeter-wave / microwave test fixtures and calibration kits are specifically optimized for testing the performance of patterns between the edges of printed boards(edge type) and circuit testing on the printed boards(probe type). They are also designed to minimize heat capacity by miniaturizing their dimensions so they cool off efficiently, and materials with low coefficient of linear thermal expansion such as invar are used for major parts where high dimensional stability is required. Their operating frequency ranges from DC to 110GHz.
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Antenna Measurement Software
Raymond RF's Antenna Measurement Software performs 2-D (polar/rectangular) and 3-D (spherical) antenna pattern measurements for passive antennas and active wireless mobile stations (cell phones). Insertion loss of passive devices is included as part of the calibration component. Data management and reporting of antenna properties such as half power beam-width, directivity, gain, radiation efficiency, total radiated power, and total isotropic sensitivity. AMS performs and reports all measurements required by the CTIA Over-the-Air Performance Test Plan.
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SFP Based Fiber Optic Test Solution
Eye-BERT Micro
The Eye-BERT Micro is a low cost, easy to use, all-in-one SFP based fiber optic test solution offering high performance bit error rate testing at a fraction of the cost while providing a rich set of features not found in other bit error rate testers. Features include: variable bit rate, user programmable patterns, and optical power and temperature monitoring (per SFP capability). Additionally, with a click of a button, the Eye-BERT Micro will automatically test an SFP module based on the information it reads from the module and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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Fiber Optic Test Solution
Eye-BERT Micro 10G
The Eye-BERT Micro 10G is a low cost, easy to use, all-in-one XFP based fiber optic test solution offering high performance bit error rate testing at a fraction of the cost while providing a rich set of features not found in other bit error rate testers. Features include: variable bit rate, user programmable patterns, diagnostic monitoring, and wavelength tuning (per XFP capability). Additionally, with a click of a button, the Eye-BERT Micro 10G will automatically test an XFP module based on the information it reads from the transceiver and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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Sync Generator
LT 4610
The LT 4610 is 1RU full-rack size sync signal generator that can output triple-rate SDI (3G-SDI/HD-SDI/SD-SDI) signals. It employs two power supply units for redundant operation to protect against power supply failures. The genlock function for external sync signals enables SDI signals, six sets of analog black burst sync signals, and audio word-clock signals to be output synchronously. The genlock function is equipped with a STAY IN SYNC function that maintains the phase when errors occur in the input signal, making it possible to provide stable sync systems.In addition to test pattern output including color bars and SDI check fields, the LT 4610 can embed ID characters, QVGA logo marks, safety area markers, and embedded audio in a SDI signal output.
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PXI Digital Waveform Instrument
PXI Digital Waveform Instruments feature up to 32 channels, can sample and generate digital waveforms at up to 200 MHz, and interface with various standard TTL and low-voltage differential signals (LVDS), as well as settable voltage levels. These devices offer per clock cycle, per channel bidirectional control, and phase shifting. They include deep onboard memory with triggering and pattern sequencing. Some models also support doubledatarate (DDR) technology and real-time hardware data comparison. You can use Digital Waveform Devices to create device simulation and complex stimulusresponse tests.
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Full Wafer Test System
FOX-1P
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Large-size Hybrid Reverberation / Anechoic Chamber
F-Series
The F large-size hybrid Reverberation/Anechoic Chamber represents the most versatile OTA test system in the market today. With the same unique test features of their E Series RC counterparts, the F-Series can also test large form-factor devices under test (DUTs) like laptops, large TV sets, solar and trash compactors, drones, fridges or washing and vending machines, among others. With up to 16x16, 8DLCC and DUTs up to 2m and 500 kg including full-body phantoms in a turntable, the F Series also expands the frequency range down to cover 200 MHz up to 40 GHz frequency ranges and the test modes to include EMC, BS, small cell, eNodeB and Virtual Drive Testing over the air (VDT-OTA). In an again unheard-of feature, the F-Series is also reverse-convertible into an Anechoic chamber, allowing Far Field (FF) and Spherical Near Field (SNF) radiation patterns, efficiency and gain measurements and pre-5G testing of antennas and devices. Conversion from RC to AC or vice versa can be performed within half a day.
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Muzzle Velocity Radars
MVR Series
The MVR Series of Muzzle-Velocity Radars are Doppler-CW transceivers that measure the velocity of viewed objects such as projectiles. They use phase-locked millimeter-wave transmitter-receivers along with an integrated radome-protected antenna to illuminate objects under investigation. An optical boresighting aid provides alignment assistance for the narrow radiation patterns. Reflected signals from the target are received by the antenna and mixed to produce a video output equal to the Doppler spectrum of the target. A low-noise, variable gain video amplifier can drive a 50-ohm cable up to +1 volt output. The video amplifier has a feed-forward DC offset compensation circuit that extends the Doppler frequency response from under 1 Hz to over 2 MHz. An integrated DMM and LCD display on the front panel monitors various test points within the sensor to verify proper operation. The extremely rugged design allows the MVRs to withstand high acousitic shock environments so they can be located in close proximity to the projectile source.
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MMW Field Sensors
ITS-9050
The Innovative Technical Systems ITS-9050 Detector is a sensitive, harmonic mixing detector designed to measure millimeter-wave free-space radiation. It is ideal for measuring radiation patterns of antennas inboth the near and far-field. The ITS-9050 employs a free-running dielectric resonator oscillator (DRO) and an integrated harmonic mixer with a waveguide RF input that either connects directly to a circuit under test or to an antenna for radiation detection. The resulting IF is amplified and detected by an IF log-detector that drives a front panel LCD voltmeter to provide an indication of signal strength. A DC output voltage from the log detector is available on a BNC connector to drive external data acquisition instrumentation. Also, a sample of the IF output is provided for measurement on a spectrum analyzer.
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Cable Testers
Passage test:Detects open wires, short circuits and faulty wiring. Pass / fail test using a given pattern cable. Finding intermittent connections.Save cable data for documentation purposes. Print wiring diagrams. Printing labels. Log and print error logs.Graphical representation of the wiring of cables, graphical comparison of two cables. Easy, intuitive, graphical tracking of individual wires of a cable.Quickly install quick-mount boards for a variety of connector types such as BNC, RJ45, Sub-D, flat-ribbon connectors, and many more.Easy connection to the PC via USB .Light Director System:LED-led assembly of connectors. Optional also with voice output. High degree of safety due to fault checking during assembly.
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PCI Fault Insertion Switch Range for Differential Serial Interfaces
50-200/201
Pickering Interfaces, a leading supplier of modular signal switching for electronic test and simulation, is expanding its range of PCI Fault Insertion switching with the introduction of two new modules (models 50-200 and 50-201) designed for use with differential serial interfaces. PCI Fault Insertion Switch Cards for Differential Serial InterfacesThe new modules include the Differential PCI Fault Insertion Switch (model 50-200) which is designed for lower data rate serial interfaces such as CAN and FlexRay, and the High Bandwidth Differential PCI Fault Insertion Switch (model 50-201) which is designed for higher data rate serial interfaces such as AFDX and 1000BaseT Ethernet. Each module allows the introduction of fault connections that include data paths open, data paths shorted together, and data paths shorted to externally applied faults such as power supplies and ground. The software driver defaults to a protective mode where conflicting faults are prevented to avoid accidentally shorting unintended paths, such as power to ground. A separate mode allows complete freedom in setting fault patterns.
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Telemetry Transmitter for FM with up to 3 Bands
LS-11-F
The LS-11-F portable FM test transmitter is designed for checkout and troubleshooting of telemetry receiving systems operating with FM modulation. For applications with any of the ARTM modulations (Tier 0, Tier I, or Tier II), please refer to the LS-11-M Data Sheet. Complete ground stations including the antenna with LNA, RF down-converter, IF receiver, bit synchronizer, and PCM decommutator can be tested and bit error tests performed. The design allows secure links to be tested with an external encryptor. The Test Transmitter contains an internal PCM Data Simulator and Pseudorandom patterngenerator that operates in a BERT mode. The device provides simulated clock and data (without transmitter enabled) and accepts external data for modulating the internal transmitter. Complete setup can be achieved locally through the keypad and two-line LCD display or remotely through the USB Interface. Operational parameters include the PCM format parameter database information (frame sync patterns, wavewords, etc…), pre-modulation filter selection, transmitter carrier frequency, transmitter deviation, and output power level. Output power can be selected from approx. -60 to +5 dBm in 5 dB steps. The Test Transmitter contains a LiFePO4 Battery (Lithium Iron Phosphate), which provides higher energy density at ¼ the weight of legacy lead-acid batteries. The unit also provides an internal battery charger and will operate for up to twelve hours on battery power having received on a full charge.
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80Gbps Video Analyzer/Generator for DisplayPort 2.0 Testing
M42d
The Teledyne LeCroy quantumdata M42d Video Analyzer/Generator provides functional and will support compliance testing for video, audio and protocol of DisplayPort 2.0 and DisplayPort 1.4. The M42d supports legacy DisplayPort lane rates of 1.62, 2.7, 5.4, 8.1 Gb/s and the new DP 2.0 higher speed lane rates of 10.0, 13.5, & 20.0 Gb/s data rates with the new line coding—128b/132b. The protocol analyzer provides a snap shot status view and deep analysis using captures of incoming DisplayPort 2.0 streams from source devices including DSC/FEC compressed streams. The M42d’s video generator can be used for testing silicon as well as devices such as displays, USB-C adapters, extenders, etc. The video generator offers a large library of standard video timings and test patterns necessary for testing next generation high resolution displays.
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Engineering Support Platform
ESP
ESP, or Engineering Support Platform, is a low cost, powerful and versatile platform for the development, deployment and support of FPGA Applications. ESP is powered by DSX core, ARC’s core element for the development and deployment of digital and mixed signal systems. The standard system contains 2 custom FPGA system, often configured in combination where one acts as the application firmware, and the other is used for test. But the system is expandable and configurable in any combination to solve any problem in a digital, analog or mixed signal system. The FPGAs can be configured to generate, analyze, process and/or output complex signals at a wide range of voltages, frequencies and serial protocols. It has been used to develop solutions for Radar systems, testers, Pattern Generation, digital signal processing and generating, Video processing, and many more. ESP comes as a desktop or rack mounted solution, and no special interfaces are needed.
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Broadband Antenna
Vivaldi
The dbDIRECT Broadband Antenna features a broad frequency range of operation, high gain, small form factor and directional radiation pattern, making it highly attractive for widespread use in test and measurement of emerging wireless technology devices and radars. Contrary to conventional Vivaldi antennas limited to operating only at higher frequencies, the dbDIRECT Broadband Antenna design is optimized to operate at a frequency as low as 700 MHz up to 6 GHz. This lightweight and compact antenna design provides excellent matching over a broad frequency range.The antenna is designed to be placed in a DVTEST's portable anechoic chamber such as the dbSAFE enclosures for OTA (Over the Air) testing of DUTs. The antennas can be mounted in fixed positions to facilitate repeatable results. When used in conjunction with a rotary positioning mechanism, customers are able to detect the highest point of power sensitivity for enhanced accuracy and repeatability in measurements. In this configuration, both the antennas and DUTs can be positioned in order to facilitate the measurement.
