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an acertained value.

See Also: Metrology, Instrumentation, Sensors, Meters, Stability


Showing results: 1711 - 1725 of 10567 items found.

  • Resistivity and Hall Effect

    Cryogenic Ltd.

    The Resistivity System allows the user to make Resistivity and Hall Effect measurements in the range of to M. Samples are mounted on special platforms inside the VTI with contacts made to the sample according to the customer's requirements. Connections at the top of the probe are made via Fischer Connectors or Coaxial Cables. Keithley source and measurement electronics are provided with the system. These are fully controlled using the Measurement System Software.

  • Laser Tracker System

    Leica Absolute Tracker AT403 - Leica Geosystems AG

    New all-in-one large-volume laser tracker system that sets a new standard for portability, simplicity, robust construction and measurement efficiency. An all-in-one metrology solution more portable than any other on the market, the Leica Absolute Tracker AT403 from Hexagon Manufacturing Intelligence is a self-contained measurement workshop inside a compact and convenient single case. With outperforming measurement process speed, operational simplicity like no other laser tracker and an unmatched level of robust construction, the Leica Absolute Tracker AT403 is a calculated bundle of affordable innovation without equal on the portable measurement market. Improvements include faster and more economical stationary and continuous measurement processes, along with a streamlined station change procedure. Added WiFi access point functionality and hot-swappable batteries deliver unmatched measurement freedom. Designed for leading results in almost any imaginable measurement environment, it is rated for operation in temperatures ranging from -15 to 45 degrees Celsius and features built-in environmental monitoring, orient-to-gravity functionality and construction in line with the rigorous IP54 certification standard.

  • CO2 Carbon Dioxide Probe

    HD320B2 - Delta OHM S.r.L.

    The probe measures the carbon dioxide concentration in air. It’s indicated for checking and monitoring the indoor air quality. Typical applications are the check of the air quality in all the buildings where there is a crowd of people (schools, hospitals, auditoria, canteens, etc.), in the working places to optimize the comfort. CO2 measurement is obtained with an infrared special sensor (NDIR technology: Non-Dispersive Infrared Technology) that, thanks to the use of a double filter and a special measurement technique, warranties precise, stable and long-term measurements. The air to check is spread inside the measurement chamber through the protection membrane placed at the top of the probe.

  • Meter Software Module

    Metra Mess- und Frequenztechnik in Radebeul e.K.

    *Level display as five digits number*Display selectable between acceleration, velocity and displacement*RMS, positive, negative and unsigned peak values, instantaneous value *Rotary speed measurement with Photoelectric Reflex Switch (only VM-METER+)*Main frequency (only VM-METER+)*Measurement at rotation speed or multiples (only VM-METER+)*Sound level meter (A and C weighted) and noise dose meter (only VM-METER+)*THD (distortion) measurement (only VM-METER+)*One VM-METER license can be operated simultaneously up to four times with different settings*Offline measurement

  • MP CI set

    Langer EMV-Technik GmbH

    The MP CI set up to measure coupling impedance is used to determine EMC characteristics of connectors and cables. The coupling inductivity defines the coupling inductance of external disturbance on the shield or on the ground with the desired signals. If the coupling inductivity is considered in the construction set-up and the pin or wire assignment of connectors or cables, then the connectors or cables will be more interference-resistant. The MP CI set-up for measuring coupling impedance can be used for following measurements at connectors or cables: 1. measurement of a single signal (common mode) 2. measurement of a symmetrical signal (common mode) 3. measurement of a symmetrical signal (differential mode)

  • High Stability Plane Mirror Interferometer

    10706B - Keysight Technologies

    The Keysight 10706B High Stability Plane Mirror Interferometer is a dual pass interferometer used for multiple axis applications such as X-Y stages where the measurement mirror may move perpendicular to the measurement axis. This thermally stable optic, an exact functional replacement for the 10706A Plane Mirror Interferometer, reduces thermal measurement drift to 1/12 the value typically achieved by conventional plane mirror interferometers. The unique contribution of the 10706B is its tolerance of angular misalignment of the plane mirror reflector. The 10706A can accept a range of measurement mirror angular alignment changes.

  • Automated Metrology System

    EVG®50 - EV Group

    High-throughput, high-resolution metrology for bonded stacks and single wafers. The EVG 50 (fully automated stand-alone tool) and the Inline Metrology Module (integrated in EVG''s high-volume manufacturing systems) offer highly accurate measurements at high speed, utilizing different measurement methods for a large number of applications. The tool''s application range covers multi-layer thickness measurements for determination of the total thickness variation (TTV) of an intermediate layer, the inspection of bond interfaces as well as resist thickness measurement, and meets the most demanding requirements of the yield-driven semiconductor industry.

  • WAFER MVM-SEM

    E3300 Family - Advantest Corp.

    The E3310 is a WAFER MVM-SEM* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.

  • Fluxmeter

    Model 2130 - Magnetic Instrumentation Inc.

    The Model 2130 Fluxmeter is a fully featured, high-end Fluxmeter based measurement system. It is a compact instrument with high accuracy, automatic drift correction, microprocessor control, and twelve measurement ranges to allow the operator to configure the meter for maximum resolution and accuracy. The Model 2130 is capable of measuring (DC), alternating (AC), or pulsed magnetic fields. Selecting primary measurement functions is quick and easy with dedicated front panel function keys. An easy to use menu allows access to user defined parameters such as upper and lower magnetic limits and relative magnetic measurements.

  • Combination Contact/Laser Photo Tachometer

    Extech RPM33 - Extech Instruments Corporation

    The RPM33 provides both contact (2 to 19,999 rpm) and non-contact (2 to 99,999 rpm) RPM measurements for enhanced versatility. Laser guided non-contact RPM measurements taken up to 1.6-foot (500mm) away for added safety. Readings are displayed on the large five-digit backlit LCD. Store/recall 10 data sets in memory with 4 parameters (measurement, max, min and average). Comes with contact wheel for linear surface speed (0.2 to 6560 feet/minute; 0 to 1999.9 meters/minute) or RPM measurements, 9-volt battery, reflective tape, carrying case, and user manual.

  • Computer-Based Instruments

    GT210PXIe - Guide Technology, Inc.

    With the GT210PXIe you can determine any frequency to 0.01 part per million (eight digits) in just 1 mS, and resolve each time measurement to 8pS. Couple that with 2300 measurements per second, one of the fastest rates available and you can acquire more data in a single second than a typical GPIB counter can in one minute! Faster measurements and higher resolution, along with built-in statistics functions give you a more thorough analysis of your signal. Standard deviation, peak to peak jitter, or a graph of the measurements are available at the push of a button.

  • Computer-Based Instruments

    GT210PCIe - Guide Technology, Inc.

    with the GT210PCIe you can determine any frequency to 0.01 part per million (eight digits) in just 1 mS, and resolve each time measurement to 8pS. Couple that with 2300 measurements per second, one of the fastest rates available and you can acquire more data in a single second than a typical GPIB counter can in one minute! Faster measurements and higher resolution, along with built-in statistics functions give you a more thorough analysis of your signal. Standard deviation, peak to peak jitter, or a graph of the measurements are available at the push of a button.

  • Computer-Based Instruments

    GT210PCI - Guide Technology, Inc.

    with the GT210PCI you can determine any frequency to 0.01 part per million (eight digits) in just 1 mS, and resolve each time measurement to 8pS. Couple that with 2300 measurements per second, one of the fastest rates available and you can acquire more data in a single second than a typical GPIB counter can in one minute! Faster measurements and higher resolution, along with built-in statistics functions give you a more thorough analysis of your signal. Standard deviation, peak to peak jitter, or a graph of the measurements are available at the push of a button.

  • LED Analytics

    colorCONTROL MFA - Micro-Epsilon Group

    The colorCONTROL MFA is used for measurement of color and intensity on LEDs, displays, and colored objects. An additional benefit is the flexible positioning of the small fibers to the targets. By utilizing the colorCONTROL MFA up to 495 measurement points can be monitored simultaniously.

  • Loudness + Audio Analyzer

    EDB GmbH

    Loudness Measurement and Monitoring according ITU-R BS.1770.3, EBU R-128 and ATSC A/85, incl. True Peak Measurement for all sub-channels incl. oversampling for enhanced accuracy, Loudness Range calculation and much more

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