Showing results: 6391 - 6405 of 10492 items found.
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DL10-HCM -
Teledyne LeCroy
60 V of common mode and 80 V differential input range with 1 GHz of bandwidth, make these probes ideal for lower voltage GaN power conversion measurements. The 60 V of common mode is well suited for handling any float of the battery and bulk/absorption voltage during charging, while the 80 V differential input range provide margin for any overshoot.
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Duma Optronics LTD
The alignment product line provides full solutions for applications such as: alignment of laser cavities, straightness measurement, machine alignment, wide-bed printers alignment and others. The AlignMeter system simultaneously measures incoming laser beam position (in µm) and angle (in µRad).It is a powerful compact device perfect for alignment monitoring, for testing the drift, centration and beam alignment relative to the outer housing or tube.
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ELVA-1
Elva’s SLHA series of standard gain horn lens antennas cover the frequency range of 18 to 220 GHz in ten waveguide bands. They can be issued with rectangular or circular waveguide. Lens technology significantly allows decreasing mechanical sizes of horns and correcting beam for the best performance. These horns are ideal solution for measurement gain of other antennas, short range radars and radiometers.
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ALARM -
Vaisala Oyj
Cloud-to-ground lightning activity shown in three ranges and in directional octants when used with a Vaisala TSS 928™ sensorCloud lightning counts when used with a Vaisala TSS 928™ sensorElectric field intensity measurements when used with up to seven Vaisala EFM II sensorsDisplays data within a 30-nautical mile (56-km) radius around the location
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72-7635 -
Tenma
*2 Analogue channels*800x480, 7" Widescreen LCD display*Print screen feature*24 Automatic and 2 advanced measurements*Unique waveform recording and replay function*6 Digital trigger frequency counter*6 Digital trigger frequency counter*USB drive system software upgrade*24 month limited warranty *view Terms & Conditions for details
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FilmTek 6000 PAR-SE -
Scientific Computing International
Production-proven metrology system for film thickness, refractive index and stress measurement for a broad range of film layers at the 1x nm design node and beyond. Accommodates 200 or 300 mm wafer metrology. Combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry with a wide spectral range to meet the challenging demands associated with multi-patterning and other leading-edge device fabrication techniques.
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IMPULSE V -
Onto Innovation
With tighter wafer-to-wafer and within-wafer uniformity tolerances, integrated metrology systems are in use across various semiconductor processing steps. Based on demonstrated high-resolution optical technology, the IMPULSE V system provides higher sensitivity to thin film residue measurements during the CMP process. The IMPULSE platform boasts the industry’s most reliable hardware with best-in-class reliability and productivity metrics.
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CP-4 -
Bruker Nano Surfaces
he new Bruker CP-4 CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes. Reproduces full-scale wafer polishing-process conditions. Provides unmatched measurement repeatability and detail. Performs tests on small coupons rather than whole wafers for substantial cost savings.
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MultiDimension Technology Co.,Ltd.
Geartooth Encoders of MultiDimension Technology (MDT) are non-contact incremental encoders for rotary speed and position measurement. Based on MDT’s unique Tunneling Magnetoresistance (TMR) sensor technology, they provide orthogonal differential square wave signals with high quality, along with an index signal and their inverse signals. The GE-T series are designed for 0.3~1.0-module gears with different teeth numbers. (Gear is the optional product).
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ElectroSensor™ -
Sonic Technology Inc.
This EMF detector is an unparalleled value that offers fast, reliable, and user-friendly measurements of electromagnetic pollution. Since man-made alternating current (AC) is different from naturally occurring EMF, some sources say that even extended exposure of as low as 2 milliGauss may be harmful. Fortunately, once EMF sources are identified with your ElectroSensor you can moderate your distance and exposure.
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LISST-200X -
Sequoia Scientific, Inc.
The LISST-200X is a submersible laser-diffraction based particle size analyzer designed to measure particle size and concentration in rivers, streams, ports, harbors, coasts and oceans, whether for biological, sediment transport, or environmental monitoring needs. Smaller, lighter, smarter, for starters, the LISST-200X combines the features of the original LISST-100X with new improvements to make a major advance in the technology of submersible particle size and concentrations measurements.
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Spectrometer 3091 -
TSI Inc.
The Fast Mobility Particle Sizer 3091 (FMPS™) spectrometer measures particles in the range from 5.6 to 560 nm, offering a total of 32 channels of resolution (16 channels per decade). It uses an electrical mobility measurement technique similar to that used in our SMPS. However, instead of a CPC, the FMPS spectrometer uses multiple, low-noise electrometers for particle detection
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Extech RF11 -
Extech Instruments Corporation
Refractometer measures the concentration of industrial fluids and sugar in fruit juice. Compact and easy to operate. Requires only 2 or 3 drops of solution and provides accurate and repeatable measurements on an easy to read scale. Prism and lens with a simple focus adjustment and Automatic Temperature Compensation from 10 to 30°C. Comes complete with case, calibration screwdriver, plastic pipette and calibration solution.
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Mensor Corp.
Mensor designs and produces engineered systems for customer applications requiring specifications that exceed the standard pressure control and measurement products, or that may require a complete turn-key design including multiple components in a rack, cart or bench. These special systems are designed in close cooperation with the specifying customer, and may include standard and/or custom instruments for pressure, temperature and electrical control and monitoring.
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CVX Series -
Keyence
he CVX Series is loaded with powerful features that support GLOBAL STANDARDS in machine vision inspection. State-of-the-art algorithms, that can be set by any user, ensure quick setup and long-term reliability. The best solution can be selected from a variety of options. No experience required to select lighing! - newly-developed, revolutionary Lumitrax function. 3D measurement. Ultra high-resolution 21 megapixel camera