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an acertained value.

See Also: Metrology, Instrumentation, Sensors, Meters, Stability


Showing results: 7321 - 7335 of 10608 items found.

  • The Nanoworkbench

    Klocke Nanotechnik

    In light microscopy it is natural to use toolsets like tweezers, knives, probes and several different measurement tools. Without this many present-day products and methods would not exist. The operators of SEM/FIB-Systems generally work without toolsets, although the wavelength limit of light is no physical boundary. It can be imagined how technology would be pushed when a SEM/FIB Workbench reaches the same degree of practicability and utilization as toolsets for light microscopes. The Nanoworkbench is the first system substituting the eye-hand coordination effectively with nm precision in a SEM/FIB-system. The Nanoworkbench features a set of applications including TEM lamella preparation, nano probing, nano cutting, nano cleaning, force distance measurement, particle sorting and material preparation. Every application supports automated processes so almost no user interaction is needed. Even complex processes can be done within seconds and even by untrained users. Applications can be combined to create new and more complex processes. Expanding the SEM/FIB to a material processing system and a nano-analytical workbench by utilizing the Klocke Nanoworkbench enables new applications in research and production of material research, live sciences, tribology, environmental & forensic research and semiconductor technology.

  • Solar Simulator

    Unisim Compact Solar Simulator - TS Space Systems

    The Unisim Compact is a low-cost close-match solar simulator that provides the world-leading spectral match of our award winning Unisim solar simulators in a compact, bench top unit complete with IV measurement system. As with all our Unisim solar simulators, they exceed the ASTM, IEC and JIS international standards for spectral match and temporal instability. The easy-maintenance enclosure houses a TS-Space Systems 2-zone Unisim solar simulator which combines metal halide and incandescent sources via a proprietary filter system to give an AM0 close-match spectrum (AM1.5 drop-in filter sets are available). The standard system includes an embedded source meter with complete IV measurement system (Computer, GPIB interface, IV software, MS Excel), relative irradiance indicator for monitoring lamp intensity and an electrical shutter. Product support is very important to us. Training is provided at our premises where customers can take advantage of one-on-one tuition with the solar simulator designers and learn how to operate and maintain their tools. Extensive support via phone and email for the full lifetime of the instrument is included with every TS-Space Systems product.

  • CT PT Tester

    HTCT-300 / 357 - Wuhan Huatian Electric Power Automation Co., Ltd.

    Measurement of current voltage transformer excitation characteristics, excitation parameters, turns ratio, polarity coil resistance, etc.

  • PXI Vector Component Analyzer, 100 kHz to 32 GHz

    M9816AS - Keysight Technologies

    The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.

  • PXI Vector Component Analyzer, 100 kHz to 44 GHz

    M9817AS - Keysight Technologies

    The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.

  • Test System for IVL Characterization

    S.E.A. Datentechnik GmbH

    The IVL Test Plattform is a test system for IVL measurements (current-voltage-luminance) to characterize active optical semiconductor components.

  • PXI Vector Component Analyzer, 100 kHz to 53 GHz

    M9818AS - Keysight Technologies

    The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.

  • Multifunction ISA DAQ Cards

    Advantech Co. Ltd.

    Multifunction cards provides analog input, analog output, digital input, digital output, and counter/timers for signal measurement.

  • 400A Dual Input AC/DC Clamp Meter + NCV + IR Thermometer

    Extech EX623 - Extech Instruments Corporation

    This TRMS AC/DC Clamp Meter has dual thermocouple inputs for T1, T2, T1-T2 Differential Temperature measurement plus a built-in Infrared Thermometer with laser pointer for locating hot spots and NCV Detector. Additional features include: DC micro-amp function for flame rod measurements, Diode open circuit voltage of 2.8 Volt, Data Hold plus fast Peak Hold for capturing current surges at motor startup, and capacitance measurement to 40mF. Comes complete with test leads, 9 Volt battery, two Type K bead wire Temperature probes and carrying case.

  • 10 MHz To 6 GHz LAN Wide Dynamic Range Average Power Sensor

    L2051XA - Keysight Technologies

    Frequency range of 10 MHz – 6 GHzLAN connectivity with a wide dynamic range of -70 to +26 dBm for small signal measurementsFast real-time measurement of 50,000 readings/secReal-time measurement with zero dead time to ensure every single continuous pulse is measuredAverage mode time-selectivity function allows full dynamic range for average and time selectivity average power measurementsInternal zero and automatic calibration saves time and reduces measurement uncertaintyA BenchVue software license (BV0007B) is now included with your instrument. BenchVue makes it simple to connect, control instruments, and automate test sequences

  • Digital Multimeters

    Tektronix, Inc.

    *5½-digit resolution to 8½-digit resolution DMMs*6ppm basic voltage measurement accuracy on the 8½-digit DMM for calibration laboratories*Fast, 1 Msample/s sampling speed to capture complex, low level current profiles from IoT devices or other wireless devices*Sensitivity of 1 µΩ and 1 pA to test low power devices for research, design, and manufacturing test*A wide range of measurement functions such as DC and AC volts, DC and AC current, two- and four-wire Ohms, continuity, frequency, period, RTD, thermistor, and thermocouple temperatures, diode test, and capacitance*Numerous interface options including LAN/LXI, USB-TMC, GPIB, and RS-232 for data acquisition and automated testing*Intelligence to execute tests and create customized measurements with minimal PC interaction*Measurement expansion up to ten channels

  • Bulk Current Monitoring Probe

    MP-50 - FRANKONIA GmbH

    The Current Monitoring probes may be used whenever RF current measurements are required. Current measurements are made by placing a current carrying conductor within the “sensing” window of the probe and measuring the probe’s output voltage with an RF detector. Calibration of the probe permits the conversion of the voltages measured to current. Current measurements can be made over the frequency range shown in the transfer impedance curve furnished with each probe. There is virtually no loading of the circuit and the technique permits normal operation of the device under test during measurements. The MP-50 can be used for the procedure for clamp injection when the common- mode impedance requirements cannot be met given in chapter 7.4 of IEC/EN 61000-4-6 „Immunity to conducted disturbances, induced by radio frequency fields”. The MP-50 can also be used as current monitor for BCI testing as per ISO11452-4, RTCA/DO-160 section 20, MIL-STD-461 and various automotive standards.

  • Fully Automatic Transformer Winding Resistance Tester

    Neutronics Manufacturing Co.

    Measure DC resistance of transformers windings etc. Introduction: The NMC ''TDR'' is a high precision, new generation, light weight large output current and micro-processor controlled tester. This replaces old DC wheat stone bridge and double arm bridge for measurement of DC resistance. ''TDR'' adopts new advanced test current power supply technology, four terminal measurement, digital display of resistance value and test current. ''TDR'' is powered by 220V AC mains single phase supply. The measurements are accurate as the test current is highly stable. High automation is achieved with automatic discharge warning.Principle: The constant current generated is fed to the resistance under test through the current terminals and the voltage drop across the resistance under test is measured and displayed in ohms. A true four terminal measurement is used to eliminate the need for lead resistance compensation.

  • IC/BGA Tester

    Focus-2005 - Kyoritsu Testsystem Co., Ltd.

    As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)Short/Open checker for semiconductor sensor device.It is possible to measure two kinds of measurements which are constant voltage biased current measurement and constant current biased voltage measurement. User can set the threshold of 10 ranks. (auto measurement)Only device can be measured. It is also possible to fabricate the test fixture.Various devices can be measured by replacing the socket board.It is no need to generate complex test programs as reference values are calculated from good device.It can be expanded by adding multiplexer boards which are 128pins per one board.(MAX 2048pins)

  • PXIe-5663E, 6.6 GHz PXI Vector Signal Analyzer

    781259-02 - NI

    6.6 GHz PXI Vector Signal Analyzer - The PXIe‑5663E offers wide instantaneous bandwidth and supports RF list mode, which increases multiband measurement speed with fast and deterministic changes in configuration. You can use a PXIe‑5663E as either a spectrum analyzer or vector signal analyzer, and you can use it with the Modulation Toolkit to analyze custom and standard modulation formats. The PXIe‑5663E can perform measurements for a broad range of communications standards such as GSM, EDGE, WCDMA, WiMAX, LTE, Bluetooth, WLAN, DVB‑C/H/T, ATSC, and MediaFLO. Because all measurements are software defined, you can reconfigure the measurements using standard-specific toolkits. With these toolkits, the PXIe‑5663E provides a low-cost solution to high-performance RF measurements.The PXIe-5663E comprises the following modules:• PXIe-5601 RF Signal Downconverter• PXIe-5622 IF Digitizer• PXIe-5652 RF Analog Signal GeneratorThere is no physical device named "PXIe-5663E".

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