Showing results: 4681 - 4695 of 7331 items found.
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4016(800Vp,20Arms/200Ap) -
PRODIGIT Electronics Co, Ltd.
To analyze AC/DC power source, it requires a lot of parameters. Such as voltage(V), current(A), power factor(PF), Total Harmonic Distortion(THD), Crest Factor(CF), Inrush current, etc. To meet power saving regulation, the standby power measurement must be done. In this video I will show you how to operate this Prodigit Power Analyzer 4016. Furthermore, I explain what the parameter's meaning.
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3282(280V,1875W / 3700VA ) -
PRODIGIT Electronics Co, Ltd.
3282 power Factor RLC Load built-in 16-bit A/D and DSP precision measurement circuit, provides accurate measurements, measurement items have Vrms, Arms, Watt, VA, CF, PF, THD, VTHD, ITHD, Ipeak, Amax, Amin, Vmax, and Vmin. In addition to these measurement functions, it also provides time measurement,products such as UPS, fuses and circuit breakers etc. trip or blow time and transfer time for Off-line UPS
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Metrix
Seismic vibration instrumentation is used to measure structural vibration on bearing housings, piping, machinery housings, and machine support structures. It is particularly suitable for machinery with rolling-element bearings. These types of bearings will generally transmit both shaft-and bearing-related vibration to the outside of the machine where it can be detected by seismic measurements.
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Nano-View Co. Ltd.
– Antireflective coating (ARC) on textured (poly-) crystalline silicon solar cellMeasurement– Thickness, Reflectivity, n&kWavelength– 420 – 950 nm (1.3-3.0 eV) : expandableAccuracy (thickness measurement on specular sample)– 104.5 nm for 104.8 nm SiO₂on c-Si* Accuracy can be dependent on the quality of filmThickness range– 10 nm ~ 20 mm (depend on sample)Data acquisition time– < 1 sBeam spot size– ~ 50 mmFocusing of beam– Manual (optional auto-focus)Sample stage– Manual X-Y stage (specify sample size and travel distance)(optional automatic X-Y stage for mapping)
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KRYTAR, Inc.
KRYTAR's 180 Degree Hybrid Couplers offer wide frequency coverage in single, compact packages which provide low insertion loss, high directivity and tight coupling. These hybrid couplers offer simple solutions in many applications within those frequency bands including electronic warfare (EW), commercial wireless, SATCOM, radar, signal monitoring and measurement, antenna beam forming, and EMC testing environments. For many space-restricted situations the compact size of these KRYTAR couplers are ideal. These couplers can be also be manufactured to meet military specifications.
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PicoTweezers -
Ionovation GmbH
Single or dual beam optical tweezers system based on an inverted microscope • 3D real-time video-based force measurements with sub-pN resolution • Huge free space above optical trap for all kinds of sample chambers and carriers • Manipulate and navigate trapped objects with nanometer precision • Easily extendable to fluorescence, STED, Raman spectroscopy, TIRF, or CLS.
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Omega Engineering, Inc
Shear/Torque Strain Gages are for measuring shear strain and torque, typical applications are for measurements on torsion bars and determining shear stresses in shear beam load cells.
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FISCHERSCOPE X-RAY/XUL -
Helmut Fischer AG
For coating thickness measurements in the electroplating industryFixed aperture and fixed primary filterX-ray tube with a slightly larger primary spot, well suited for applications with measurement spot sizes starting at about 1 mmLow-energy beam components are excited with lower effectiveness, however for standard applications measuring the thickness of typical electroplated coatings such as Cr, Ni, Cu, this poses little to no problemMeasuring direction from bottom to top, this allows for quick and easy sample positioningLarge measurement chamber with a cutout (C-slot) Standard X-ray tube, proportional counter tube
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Scientech Inc.
The Radiation Pressure Series is Scientech’s newest innovation, designed to accurately measure high power levels from lasers that would normally require expensive, large water-cooled calorimeters. These instruments measure the radiation force exerted by the laser beam on a mirror and significantly improve response time, size, and scalability. The mirrors are designed to reflect ≥99.999% of the laser energy and allow continuous measurement. Radiation Pressure Series instruments actually improve in accuracy as laser power increases.
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MEET International Ltd.
*Measuring distance : 0.05 to 30m*LCD display : 2 rows*Accuracy : ±1.5mm (±0.06in)*Unit conversion : m / in / ft*Laser classification : class 2*Laser type : 635nm <1mW*Laser beam*Dynamic measurement*Area, volume measurement*Pythagorean proposition measurement*Indirect measurement*Add / Subtract calculation*Maximum / Minimum measurement
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UVD-3200 -
Spectrophotometer.com
Spectro UV-Vis Double PC 8 Auto Cell is a high performance UV-Vis double beam automatic scanning spectrophotometer. Spectro UV-Vis Double has a brand new optical system design, microcomputer controlled. It is capable of processing data, from analytical and spectrum testing. Precise with high accuracy of measurement and stability are also provided by the powerful built in software and large LCD screen, which can display the screen menu and other functions.
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Beamage-M2 -
Gentec Electro Optics, Inc.
Large Apertures: The only M2 system on the market equipped with a complete set of 50mm optics. Also, the sensor is 11.3 x 11.3 mm. Simple Alignment: Two beam-steering mirrors are included for quick and easy alignment of your laser into the system. The internal mirrors are factory-aligned and the pre-set height also simplifies the alignment.Available Fall '17
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Lumetrics Inc.
Lumetrics has applied the ingenious Shack-Hartmann sensor to a range of wavefront measurement systems ideal for analyzing optics-related products and materials, from contact lenses to intraocular lenses to laser beam analysis, surface measurement, and phase parameters. While Shack-Hartmann technology may be widely adopted in the wavefront metrology industry, Lumetrics has applied the technology in unique ways and added industry-leading hardware and software features to our systems that offer you significant advantages over our competitors.
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Micro-Epsilon Group
The SHSLab wavefront sensor system is a powerful and comprehensive measurement solution for a multitude of optical applications, such as:*alignment of optical systems *measurement of imaging quality*surface shape measurement*laser beam characterization