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an acertained value.

See Also: Metrology, Instrumentation, Sensors, Meters, Stability


Showing results: 4771 - 4785 of 7331 items found.

  • Ultra Fast TCSPC Lifetime Fluorometer

    Ultima - HORIBA, Ltd.

    TCSPC lifetime system for the measurements of short lifetimes down to 5 psThe Ultima Series of TCSPC systems are optimized for the measurement of short lifetimes, even less than down to 5 ps. They feature the FluoroHub A+ electronics which offer the best electrical timing resolution available (<400fs/point) and ultra-low timing jitter of <3ps RMS.

  • Resistance System Kit

    PMK-151 - Prostat Corporation

    The PMK-151 Basic Measurement Kit has all the functionality of the PMK-152, but adds computer downloading capabilities. It contains all the instruments you need to take a variety of resistance measurements.The PMK-151 includes Prostat's PRS-801 Resistance Set with modified 5 pound conductive rubber electrodes, the PRS-801 wide range resistance meter, and Prostat PRS-801 Connectivity software for computer data downloading. You can take measurements at 10 and 100 volts with accuracy within ±5%.

  • 3D Optical Microscopy

    Bruker Nano Surfaces

    Bruker is the worldwide leader in 3D surface measurement and inspection, offering fast, non-contact analyses for samples ranging in size from microscopic MEMS to entire engine blocks. Our microscopes are the culmination of ten generations of proprietary Wyko® Technology advances that provide the high sensitivity and stability necessary for precision 3D surface measurements in applications and environments that are challenging for other metrology systems.

  • Benchtop Measurement Bundle With SMU

    NI

    The Benchtop Measurement Bundle provides a PXI Express- and Thunderbolt™-based measurement system that features a chassis with a high-bandwidth, all-hybrid backplane. With the SMU, you can make use of precise voltage or current sourcing and measurement capabilities for PXI systems. Additionally, you can use analog-to-digital converters to help you perform high-precision measurements.Thunderbolt is a trademark of Intel Corporation or its subsidiaries in the US and/or other countries.

  • 3D Wafer Metrology System

    7980 - Chroma ATE Inc.

    Chroma 7980 Wafer Metrology System applies White Light Interference Measurement Technique to perform nondestructive and rapid surface profile measurement and analysis.

  • Shaft Power Measurement Solutions

    Datum Electronics, Ltd.

    Our marine shaft power meter systems measure shaft torque, power, propulsion, rpm and thrust (if required), to ensure optimum performance is maintained throughout the lifecycle of a vessel. Using highly accurate & reliable strain gauge technology, combined with cutting-edge electronics, our system has an accuracy of 0.1%. It can be installed and commissioned within 1-2 days on a variety of shafts including intermediate shafts, thrusters, propellers and controllable pitch propellers. Our technology, along with our expertise in dynamic sampling of strain gauges, enable us to unlock a significant amount of information regarding the performance of the engine & propulsion shaft, along with the propeller.

  • Carbon Sensor Conductivity Meter (Low concentration type)

    HE-480C-GC - HORIBA, Ltd.

    The length of the sensor has been reduced by 50% as compared to existing systems to reduce space requirements. At the same time, the measurement range has been increased tenfold, enabling the system to measure even samples with comparatively high concentrations. Two different types of chemicalresistant glassy carbon sensors can be used, making the system ideal for chemical dilution/recovery management and pure water recycling as well.

  • Biaxial Inclinometers

    Columbia Research Laboratories

    Columbia's Biaxial Inclinometers use the same force balance accelerometer technology used in our single axis inclinometers. These Biaxial Inclinometers are used in applications where dual axis tilt measurements are required. The SI-702B series is intended for use in applications such as platform stabilization, surface mapping and measuring tilt angles in remote locations. The SI-701AI series, is designed with an output circuit configuration made for use in 4-20mA data transmission systems.

  • Applications

    VIEW Micro-Metrology

    No matter what the requirement for ultra high-precision measurement, VIEW has the ideal solution. VIEW non-contact measurement systems utilize sub-pixel image feature detection with either field-of-view (FOV) or point-to-point (PTP) configurations for exceptional accuracy and repeatability. From etch-dimensions on hard disk drive (HDD) heads to semiconductor overlay measurements, we provide the accuracy you need for quality manufacturing.

  • Automated Live Fish Measuring System

    ViTec Co. Ltd

    The system for measuring and identifying aquatic organisms is designed to measure the linear dimensions and volume of live fish on a conveyor. The conveyor speed can reach 2.5 m / s, that is, up to 5 fish can pass through the installation in one second.The measurement of the thickness and volume of fish is carried out using a specialized camera Sick Ranger D40, which works on the principle of laser triangulation.The camera operation is synchronized with the conveyor movement using the Sick DGS-60 encoder.The industrial color camera Basler Scout scA1300-32gc is used for measuring the linear dimensions of fish (length and width), as well as highlighting characteristic features of different types (color of scales and fins) and possible defects.

  • (AOI) Automated Optical Inspection Systems

    VisionX Inc.

    For automated defect detection and high-accuracy measurements. VisionGauge Online High-Speed AOI systems are perfect solutions for demanding high-throughput, high-resolution applications. These systems are perfect for a wide range of applications including MicroElectroMechanical systems (for MEMS inspection or MEMS measurement), semiconductor & discrete device inspection and measurement.

  • Advanced Packaging & TSV

    FilmTek 2000M TSV - Scientific Computing International

    Advanced semiconductor packaging metrology system providing an unmatched combination of speed, accuracy, and precision for high-throughput measurements of resist thickness, through silicon vias (TSVs), Cu-pillars, bumps, redistribution layer (RDL) and other packaging processes.

  • Automated Measurement System

    EVG®40NT - EV Group

    The EVG40 NT (stand-alone tool) and the AVM (HVM-integrated module) enable measurement of lithography relevant parameters like critical dimension, as well as bond alignment accuracy.Because of the high-measurement accuracy, it is possible to verify compliance to tight process specifications and instantly optimize integrated process parameters.

  • Burr Height Measurement Systems

    EP Series - FocalSpec

    The easy-to-use devices generate measurement reports, statistics and quality reports automatically. The profilers offer internal data storage as well as connection to the central data storage.

  • Aggregation Analysis System For Biopharmaceuticals

    Aggregates Sizer - Shimadzu Corp.

    The "Aggregates Sizer" aggregation analysis system enables the quantitative evaluation of particle amounts in the SVP range as a concentration (unit: μg/mL). Aggregations of biopharmaceuticals can be categorized into 3 ranges: IVP (In-visible Particle), SVP (Sub-visible Particle), and VP (Visible Particle), according to their particle size. Until now, no particle size analyzer could cover the SVP range with a single measurement. Therefore, multiple methods had to be used. Aggregates Sizer completely covers the SVP range.

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