Showing results: 6661 - 6675 of 7317 items found.
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Spanawave Corporation
Measure CW power from 10 MHz to 50 GHz at more than 17,500 readings per second over GPIB. Measure up to 90 dB with a single sensor, and select from a variety of high power sensors up to 50 W.
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8542C -
Spanawave Corporation
The Spanawave/Giga-tronics 8542C Dual Channel Universal Power Meter combines accuracy, speed, range and measurement capability.
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Spanawave Corporation
Directly measure the instantaneous peak power level of a pulse modulated signal. Use the "sample delay" function to set the desired measurement point on the waveform. And an external scope can be used to view the profile and see the exact measurement point on the pulse.
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Spanawave Corporation
Measure CW power from 10 MHz to 50 GHz. Modulated Average Power Measurement. Peak Power Measurement.
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8652A -
Spanawave Corporation
The Spanawave/Giga-tronics 8652A Dual Channel Universal Power Meter has the extensive measurement capabilities and features you need to test today's sophisticated communications systems faster, easier and more accurately.
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Inframet
There are three computer simulators offered by INFRAMET:*SIMTERM - computer simulator of thermal imagers,*VIRTEST - computer simulator of test proces thermal imagers ( MRTD measurement)*NIGHTMET - computer simulator of image intensifier tubes
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Inframet
IR FPA sensors are the most important modules of thermal imagers. Design of sensor electronics (camera core) is a crucial part of designing of new thermal imager. Knowledge of precise parameters of IR FPA sensor is needed by both professionals involved in both IR FPA technology/thermal imagers technology because parameters of IR FPA sensors determine performance limits of thermal imagers. Therefore test equipment that enable measurement of IR FPA sensors is a vital tool for development of both IR FPA technology/thermal imagers technology. It is commonly known that data sheets provided by manufacturers of IR FPA sensors (both cooled or non-cooled) provide too little details for electronics designers. Sometimes the provided data is not accurate enough and better sensor performance can be achieved using modified control signals. Therefore design teams loose sometimes years to develop electronic camera core optimized for a specific IR FPA sensor. When the type of the IR FPA sensor is changed the whole process is to be repeated. In this situation an universal, flexible camera core that would accept IR FPA sensors from different manufacturers and to carry out semi-automatic determination of optimal signal controls for a specific IR FPA sensor would be highly desirable.
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Inframet
The primary goal of a well designed optical table is to eliminate relative motion between components of test system located on the surface of the optical table because such motion can generate measurement errors.
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Staubli Group
This product range includes passive high-frequency test probes and accessories as well as touch-protected BNC plug connectors, insulated BNC panel-mount sockets, leads with RG58 or RG59 cable, adapters and converters. Our test probes are suitable for use in CAT III- and CAT IV environments (Measurement Categories), such as the analysis of house and building installations with mains analysis/mains monitoring devices. Our high-frequency accessories are designed with clearance and creepage distances in accordance with IEC/EN 61010-031.
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Staubli Group
High-quality connection solutions for precise measuring, testing and examination. Whether low or medium voltage range, whether precise test runs or preventive measuring and testing: With an extensive portfolio of specific components and cables, Stäubli always ensures perfect and reliable contact between the measuring instrument and the points, objects and systems to be tested. In addition, we are a proven partner of leading manufacturers of measuring instruments in this field, for example for equipping them with high-quality sockets. Every product meets all quality and safety standards.
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Beha-Amprobe
Is used for acoustic (sound that travels through air) measurements. It is commonly a hand-held instrument with a microphone.
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SR Series -
Angstrom Sun Technologies, Inc.
Spectroscopic reflectometer (SR) series are relative low cost and easy to use tools. To enusre accurate measurement on spectra, a long working distance and also adjustable working distance set up are professionaly desgined and considered. Since reflection spectra measurments require to use known reference to calibrate light intensity, it is hard to image user could get accurate spectra without optimizing signal step during such calibration because reference thickness is different from sample substrate's thickness in most of cases. Adjusting power output to lamp is our another consideration in ensuring a good measurement by reducing non-linearity effect of the detector
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Angstrom Sun Technologies, Inc.
Angstrom Sun Technologies Inc offers optical measurement and inspection systems for semiconductor and related industries. Its core products include wafer measurement systems, spectroscopic ellipsometers, thin film reflectometers, and microspectrophotometers.TFProbe wafer measurement systems, TFProbe WM series, measure wafer thickness, warp, bow, flatness, step/bump height, trench depth. TFProbe WM systems are based on confocal optical method with advantages of non-contact, non-destructive, long working distance, fast data acquisition, full mapping functions. Particularly, with integration with our thin film measurement technique, a total solution for thickness measurement covers from a few angstroms to several millimeters. Another key feature is that all our tools are upgradable in future.
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SE Series -
Angstrom Sun Technologies, Inc.
Spectroscopic Ellipsometer SE series are advanced models built by Angstrom Sun Technologies Inc. There are many more advantages over reflectometers due to its capability to acquire more set of polarization information at different incident angles spectroscopically. User can select two different data acquisition mode, scanning wavelength by wavelength detecting mode or array based fast detecting mode. Thanks for newly developed, mature array based detecting techniques, advanced data acquisition and processing algorithm, users are able to choose array based systems to have the same precision as scanning single element configurations. When a fast measurement is must, especially for real time in-situ measurement, mapping across big surface like wafers, array based configuration is always recommended. You are always welcome to discuss with us on your applications and we'll ensure the final configuration will meet your needs.
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4105A -
Kingrun Instrument Co., Ltd.
• Dust and drip proof.(designed to IEC 529 IP54)• In addition to the facility for precision measurement, test leads for simplified two wire easuring system also supplied as standard accessories.(unit can be hung from the neck for simplified measurement)• Designed to meet IEC 61010-1 safety standard.
