Showing results: 6721 - 6735 of 7317 items found.
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GTD-61A -
Kingrun Instrument Co., Ltd.
1. The GTD-61A Automatic Oil Tan Delta(OTD) & Oil dielectric loss tester is highly automated, allowing for the measurement of temperature rise, dielectric loss, and resistance in one go.
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KEW 4105DL -
Kingrun Instrument Co., Ltd.
• 3pole and 2pole Earth Resistance measurement (0.01Ω-2000Ω)• Waterproof design (IP67)• Led to monitor correct / non correct auxiliary earth spike resistance• Earth Voltage Measurement (AC/DC 0-300V)Product description: KEW 4105DL earth tester
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GTPD-92C -
Kingrun Instrument Co., Ltd.
GTPD-92C Patrol UHF PD tester uses ultra high frequency (UHF) measurement and ultrasonic (US) measurement methods to detect GIS faults. The instrument has multiple functions of PD analysis.
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JY44 -
Kingrun Instrument Co., Ltd.
1. Wide range of measurement with 0~20k.2. Max. output current 10A which is suitable for testing extreme low resistance of dry (air-immersed)transformer3. With third generation power supply techo
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2012R -
Kingrun Instrument Co., Ltd.
• Innovative Multimeters with current measurements up to 120A AC/DC• Unique Open Jaw technology for AC/DC current measurements• Very compact and as reliable as a tradictional full size multimeter
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GTPD-92B -
Kingrun Instrument Co., Ltd.
GTPD-92B Patrol TEV PD tester uses transient earth voltage (TEV) measurement and ultrasonic (US) measurement methods to detect switch cabinet faults.
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SR Series -
Angstrom Sun Technologies, Inc.
Spectroscopic reflectometer (SR) series are relative low cost and easy to use tools. To enusre accurate measurement on spectra, a long working distance and also adjustable working distance set up are professionaly desgined and considered. Since reflection spectra measurments require to use known reference to calibrate light intensity, it is hard to image user could get accurate spectra without optimizing signal step during such calibration because reference thickness is different from sample substrate's thickness in most of cases. Adjusting power output to lamp is our another consideration in ensuring a good measurement by reducing non-linearity effect of the detector
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Angstrom Sun Technologies, Inc.
Angstrom Sun Technologies Inc offers optical measurement and inspection systems for semiconductor and related industries. Its core products include wafer measurement systems, spectroscopic ellipsometers, thin film reflectometers, and microspectrophotometers.TFProbe wafer measurement systems, TFProbe WM series, measure wafer thickness, warp, bow, flatness, step/bump height, trench depth. TFProbe WM systems are based on confocal optical method with advantages of non-contact, non-destructive, long working distance, fast data acquisition, full mapping functions. Particularly, with integration with our thin film measurement technique, a total solution for thickness measurement covers from a few angstroms to several millimeters. Another key feature is that all our tools are upgradable in future.
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SE Series -
Angstrom Sun Technologies, Inc.
Spectroscopic Ellipsometer SE series are advanced models built by Angstrom Sun Technologies Inc. There are many more advantages over reflectometers due to its capability to acquire more set of polarization information at different incident angles spectroscopically. User can select two different data acquisition mode, scanning wavelength by wavelength detecting mode or array based fast detecting mode. Thanks for newly developed, mature array based detecting techniques, advanced data acquisition and processing algorithm, users are able to choose array based systems to have the same precision as scanning single element configurations. When a fast measurement is must, especially for real time in-situ measurement, mapping across big surface like wafers, array based configuration is always recommended. You are always welcome to discuss with us on your applications and we'll ensure the final configuration will meet your needs.
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NIT Laboratory
NITOS has developed a specic framework that provides users with the ability to gather online measurements from temperature and humidity sensors and moreover analyze oine measurements stored in NITOS database.
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Spectrum Instrumentation
SBench 6 is a powerful and intuitive interactive measurement software. Besides the possibility to commence the measuring task immediately, without programming, SBench 6 combines the setup of hardware, data display, oscilloscope, transient recorder, analyzing functions and export functions under one easy-to-use interface. All current Spectrum cards are supported.
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BT2155A -
Keysight Technologies
The Keysight BT2155A self-discharge analysis software, controlling the BT2152A or BT2152B self-discharge analyzer, measures and records Li-Ion cell self-discharge current and cell voltage. The software configures the analyzer’s channel settings, such as initial voltage and current matching, channel limits (OVP, OCP, UVP), measurement intervals, and test duration.
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BT2152B -
Keysight Technologies
The Self-Discharge Analyzer accurately measures cell self-discharge current and cell voltage. Depending on the characteristics of the cells, measurements are directly made in minutes or hours instead of taking days or weeks using open-circuit cell voltage measurements to indicate which cells are good vs. bad.
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Safran - Navigation & Timing
Safran manufactures inertial measurement units and sets a new standard for precision and performance by utilizing our proprietary inertial sensor technology. Our IMUs are engineered to excel in the Defense, Industrial, Aerospace, and Commercial sectors with the highest performing ITAR-free products commercially available.
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Process Sensing Technologies
Temperature measurement and monitoring is vital for the quality of temperature-sensitive products wherever they are studied, produced, stored or transported.