Showing results: 7156 - 7170 of 7317 items found.
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LEM
Current sensors have to be smaller, smarter, cheaper. LEM’s R&D is actively developing a range of ICS to reduce the footprint of the current sensing function and simplify the integration of current measurement in a wide range of applications in automotive, industrial, or residential.
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HMSR series -
LEM
*SOIC 16 compatible footprint*Great accuracy: Typical accuracy is 0.5% over temperature and the measurement range -Small hysteresis of <<0.5%*Strong immunity
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IN 1000-S -
LEM
For the electronic measurement of current: DC, AC, pulsed..., with galvanic separation between the primary and the secondary circuit. 1000 A nominal, 3 ppm linearity over the temp. range, Very low offset drift 19.5 ppm, low noise 34 ppm peak-peak, -40 to +85°C, one compact package.
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DCBM 100 -
LEM
*Voltage measurement 150 to 1000 V DC*Current range 80A*Bi-directional energy metering
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HDPM -
Hention Electrical Equipment Co., Ltd.
The dew point transmitter of HDPM with high performance of Finland Vaisala Company is adopted as the core measurement unit of the entire system, it integrates multiple up-to-date research achievement and proprietary technology in measurement of dew point, and it is equipped with precision sampling system for sample gas and intelligent digital processing display, and it is one of existing dew point measurement instruments with the most advanced technique and the most powerful function.
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McBain ZIII Micro Inspection System -
McBain Systems
The McBain ZIII Micro Inspection System is the industry standard for CD measurements and inspection, pre/post dicing inspection, pre/post probing inspection, mask inspection, image stitching and critical particle counting.
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DDR200/300 NIR -
McBain Systems
The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
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Metrix
Seismic vibration instrumentation is used to measure structural vibration on bearing housings, piping, machinery housings, and machine support structures. It is particularly suitable for machinery with rolling-element bearings. These types of bearings will generally transmit both shaft-and bearing-related vibration to the outside of the machine where it can be detected by seismic measurements.
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HDM Series -
Park Systems Corp.
The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry's lowest noise floor, and its unique True Non-Contact™ technology, it is the most accurate AFM for surface roughness measurement in the market.
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Park Systems Corp.
Atomic Force Microscopy (AFM) allows for sub nanometer resolution imaging of surface topography and is able to quantify surface roughness at the angstrom scale. Our team can give you highly accurate measurements such as surface topography, dopant distribution, magnetic domain features, and a wide variety of other sample properties to give you the information you need to do great work.Park can provide measurements in the following areas:● Topography (surface roughness, grain size, step height, etc.)● Mechanical Properties (stiffness, etc.)● Electrical properties (capacitance, conductivity, etc.)● Thermal properties ● Magnetic properties These properties can be measured in air or liquid, depending on your needs.
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NX10 -
Park Systems Corp.
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.
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3DM Serirs -
Park Systems Corp.
Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
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NX-Hivac -
Park Systems Corp.
Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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XE-PTR -
Park Systems Corp.
Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano scale accuracy, repeatability, and throughput, the PTR Series is the metrology tool of choice for Slider manufacturers to improve their overall production yield.
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Ectron Corporation
Ectron has a long tradition dating back to 1964 in being the industry leader in supplying super high precision, highly reliable and accurate Metrology, Simulators/Calibrators products.