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Laser Type Tachometer
DT-2857
MEASUREMENT RANGE:2.5～99,999r/min. ACCURACY:±(0.05%n+1d) . POWER SUPPLY:4X1.5V AA(UM-3)BATTERY
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Digital Thermometer
ST-4
Switch between Celsius and Fahrenheit In and out temperature measurement, fashionable appearance, small and exquisite, suitable for aquarium and refrigerator. Measurement range: -50℃∽+70℃ (-58℉∽+158℉)Distinguish: >-20℃ is 0.1℃ ≤-20℃ is 1.0℃Accuracy: ±1℃(±2℉) Power: DC1.5V, AG13 Product size: 63×45×13mm Screen size: 36×16mm
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Digital Thermometer
ST-2
In / out temperature measurement. Clock function display. Super-thin design. Measurement range: -50℃∽+70℃Distinguish: >-20℃ is 0.1℃ ≤-20℃ is 1.0℃Accuracy:±1℃ Power: DC1.5V, battery LR44Product size: 56.5×37.8×11.3mm Screen size: 46.7×21.2mm
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Grain Moisture Meter
Grain moisture application: used for fast and accurate measurement of moisture and temperature in the process of allotment, acquisition, storage, machining of packed grains, feedstuff, powder.
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Water Hardness Meters
Meter for measurement of water hardness by electrode measurement method, easy to use and accurate result.
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Digital Anemometer
AM-4832
MEASUREMENT RANGE： 0.4～30.0m/s 1.4～108.0km/h 80～5910ft/min 0.8～58.3knots.
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Digital Anemometer
AM-4812
MEASUREMENT RANGE： 0.4～30.0m/s 1.4～108.0km/h 80～5910ft/min 0.8～58.3knots. RESOLUTION:0.1/1
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Lux Meter
LX-9626
MEASUREMENT RANGE:0～ 50000LUX 0～5000FC. RESOLUTION: 1. DIMENSION:132X64X34mm
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Stroboscope
DT2350P
Measurement Range:A:50~12000FPM B:50~40000 FPM C:50~20000 FPM D:50~30000 FPM E:50~2000 FPM(fit for print and textile)
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Digital Anemometer
AM-4826
MEASUREMENT RANGE： 0.4～30.0m/s 1.4～108.0km/h 80～5910ft/min 0.8～58.3knots. POWER SUPPLY:9V 6F22 BATTERY
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Surface Profile Gauge
SRT-6223
Specially used to take accurate measurement of the peak to valley height of the surface profile of the surface profile of blast cleaned surfaces.specifications:display: 4 digits. LCDRange: 0um to 800um (0mils to 30mils)Accuracy: +5% or +5( whichever is the greater)resolution: 1um (0.1mils)Metric and Imperial switchablePC interface: RS232CMeasurement speed: >30readings per minuteweight: 280gdimensions: 162x65x28mm(6.4x2.6x1.1 inch)operating temperature: 0-50℃ , 80% RHCase: high impact ABSBatteries: 4x1.5v (AAA) Batterystandard accessories included:carrying case: 1 pcoperation manual 1 pcoptional accessory:cable and software for RS232C
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Spacecraft Power Bus Simulator
AMETEK Programmable Power, Inc.
*Provides enhanced measurement and data-logging of up to 40 channels.*Bus Power Monitoring Unit (BPMU) can be easily relocated to TVAC chamber to ease cabling complications*Data can be viewed either in spreadsheet or graphical format*Spacecraft (Payload) Protection Unit (SPU) provides 10 μsec reaction to out-of-tolerance conditions g
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Partial discharge measurement with remote wireless reading
PD-LT
The PD-LT allows online partial discharge detection on cable accessories such as cable head for safety and maintenance purposes.The PD-LT indicates the intensity of the partial discharges, converting the electrical charge units (pC) into decibels (dB). Thus the reading is kept as a simple intensity level indication, proportional to the probability of a fault's presence in the tested medium voltage accessory.The remote display gives a dB value of the probe's measurement. The dB value will vary along with the discharges indicators on the PD-LT probe. The measurement range is from 0 to 65dB and the display will show ''OL'' if the reading is over 65dB.
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Contact Resistance Measurement Kit
LRM-10
The LRM-10 is a 10A micro-ohmmeter kit designed to measure low resistance for electrical interconnections integrity testing. The LRM-10 has a range from 0.01µΩ to 200Ω. It comes with heavy duty four points probes and it is compatible with a great variety of optional accessories.
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Semi-Automatic Probe Sheet Resistance/Resistivity Measurement
CRESBOX
• Multi-points measurement and Mapping display- 2-D map / 3-D map graphic display- Multipoint pattern measurement is programmed (maximum 1225 points) and random pattern is programmable by operator.• Film thickness conversion function from sheet resistance• Measurement data base link with Excel via CSV format file• Software language can be switched in English /Japanese by operator
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Wafer Flatness Measurement System
FLA-200
*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Semi-auto 4 Point Probe System for Solar Cell Substrate
RG-100PV
*Measurement system for thin film on substrate samples for multi-points measurement*Even pitch and random pitch for Max.1,000 points*2-D/3-D square mapping software for even pitch
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Non-contact Ultra-High Range Sheet Resistance Measurement System
CRN-100
*Ultra-High range sheet resistance measurement for 10E+9 ~ 10E+15 ohm/sq without contacting*Mapping program software;*1. Arranged in a multipoint pattern measurement is programmed*2. 2-D & 3-D mapping software*Easy operation by Windows 7 system software*Measurement data base link with Excel via CSV format file*Unaffected by contact resistance
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Non-contact Sheet Resistance/resistivity Measurement Instrument With PC
NC-10 (NC-20)
*Easy operation and data processing by PC*No damage measurement by non-contact eddy current method*Replaceable probes by meas. range (*Second or more probe is for the option)*1 point measurement of center position*5 types of model for each measuring range*Temperature correction for silicon wafer function
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Non-contact Measurement Wafer Sorting System (Belt Drive Tranceportation)
NC-6800
*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Number of cassette station can be changed by customers request*Eddy current method for resistivity, Electric capacitance method for wafer thickness*Temperature correction for silicon wafer function
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Non-contact Measurement Wafer Sorting System (Robot Hand Tranceportation)
NC-3000R
*High accuracy measurement system for large diameter wafer*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Compact design of Two-stage by measuring area and transfer area*Number of cassette station can be changed by customers request Option : Add wafer flattness measurement system(FLA-200)
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Non-contact Inline Sheet Resistance Measurement Module For Conductive Layer On Substrate
NC-700
*Inline measurement module for moving substrates such as PET film, glass or paper*Continuous measurement(~24h) in Roll to Roll with OFF-SET FREE capability system*Various applications from the research and development to the production line
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Non-contact Inline Sheet Resistance Measurement Module For Flat Panel Display
NC-600
*Non-stop and non-contact sheet resistance measuring of thin film on glass runs through on conveyer*1 to 10 number of probe by sizes of glass is attachable*Glass collision prevention function*Continuous test data report to the host computer
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Non-contact Sheet Resistance Multi-points Measurement System With Wide Range
NC-80MAP
*Possible to measure wide range of sheet resistance by installing Max. 4 probes*Min. 7 mm position from edge can be measured*User programable measurement pattern & programmable measuring pattern
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Non-contact Sheet Resistance /resistivity Measurement Instrument
EC-80
*Easy operation and compact design*Auto-measurement start by inserting a wafer under the probe*Easy set up to measurement condition by JOG dial*5 types of model for each measuring range
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Non-Contact (Pulse-Voltage Excitation Method) Ultra-Low Sheet Resistance Measurement System
PVE-80
*No damage measurement by non-contact Pulse-Voltage excitation method*Easy to measure & carry around, Removable stage plate*Easy operation and data processing by PC with Software*Measurement result can shown by 3 types of measurement unit (Sheet resistance[Ohm/Sq], Electric conductivity[S/cm], Electrical conduction[S])*Pulse-Voltage excitation method : Pat. No.5386394 Joint development with Chiba Univ.
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Hand Held Probe Type Eddy Current Sheet Resistance/resistivity Measurement Instrument
EC-80P (Portable)
*Auto-measurement start by probe head contacting to sample*3 measurement modes for wafer resistivity, bulk resistivity and sheet resistance*Easy set up to measurement condition by JOG dial*5 types of model for each measuring range*Resistivity probe can be changed by sample’s resistivity range
