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High Voltage Test System
CKT1175-15
12.5 mV – 2000 VDCIR measurements to 5000 megohmsHipot testingDwell time prog. from 1 ms to 1000s in 1 ms steps
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250 MHz 60 V Common Mode Differential Probe
DL02-HCM
60 V of common mode and 80 V differential input range with 1 GHz of bandwidth, make these probes ideal for lower voltage GaN power conversion measurements. The 60 V of common mode is well suited for handling any float of the battery and bulk/absorption voltage during charging, while the 80 V differential input range provide margin for any overshoot.
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DL-HCM Series High-Temperature Solder-In Tip
DL-HCM-HiTemp
60 V of common mode and 80 V differential input range with 1 GHz of bandwidth, make these probes ideal for lower voltage GaN power conversion measurements. The 60 V of common mode is well suited for handling any float of the battery and bulk/absorption voltage during charging, while the 80 V differential input range provide margin for any overshoot.
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500 MHz 60 V Common Mode Differential Probe
DL05-HCM
60 V of common mode and 80 V differential input range with 1 GHz of bandwidth, make these probes ideal for lower voltage GaN power conversion measurements. The 60 V of common mode is well suited for handling any float of the battery and bulk/absorption voltage during charging, while the 80 V differential input range provide margin for any overshoot.
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1 GHz 60 V Common Mode Differential Probe
DL10-HCM
60 V of common mode and 80 V differential input range with 1 GHz of bandwidth, make these probes ideal for lower voltage GaN power conversion measurements. The 60 V of common mode is well suited for handling any float of the battery and bulk/absorption voltage during charging, while the 80 V differential input range provide margin for any overshoot.
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60 V Common Mode Differential Probes
The 60 V Common Mode Differential Probes are the ideal probes for lower voltage GaN power conversion measurement with the highest accuracy, best CMRR, and lowest noise.
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Deskew Calibration Source for CP030, CP030A, CP031, CP031A, AP015, CP150, CP500
DCS025
The DCS025 Deskew Calibration Source generates time-aligned voltage and current pulses for precise deskew of voltage and current probes.This is critical for measurements in which small propagation delay differences between probes can have a large impact on a calculated measurement, e.g., instantaneous power semiconductor device loss measurements.
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6kV High Voltage Passive Probe, 500 MHz
PPE6KV-A
High voltage single-ended passive probes are suitable for a wide range of applications where ground-referenced high-voltage measurements must be made safely and accurately. There is also a sense pin to automatically configure the oscilloscope for use with the probe.
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400 MHz High Voltage Passive Probe
HVP120
High voltage single-ended passive probes are suitable for a wide range of applications where ground-referenced high-voltage measurements must be made safely and accurately. There is also a sense pin to automatically configure the oscilloscope for use with the probe.
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Laser Power Measurement
Since 1968, Scientech has been an industry pioneer in the development and manufacture of award-winning laser power and energy measurement instruments. Scientech provides quality, American-made, precision laser power measurement equipment to laboratory, industrial, academic, medical, government and other unique laser applications worldwide. Our power detectors cover a wide range, from microwatts to megawatts. Choose from our: Radiation Pressure Series Astral Series Calorimeters Vector Series Pyroelectric or Calorimeter Detectors Custom Laser Power Measurement Instruments and Accessories
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Laser Power Measurement Accessories
Scientech offers a wide selection of accessories for our detectors and power/energy meters to support or enhance your laser measurement. Fiber optic holders and adapters are available to allow direct fiber optic cable attachment to Astral and Vector 25mm calorimeters as well as Vector pyroelectric detectors (except the SP and HR models). Contact us if you have other fiber optic connector needs. For measuring at low power or energy (<30 mW or 30 mJ), Scientech recommends application of our Isoperibol™ enclosure to minimize environmental thermal interference. Isoperibol™ model 360203A is designed for use with 25mm aperture detectors, except slim profile models. Isoperibol™ model 360203F is designed for use with our PN 12420 adapter that attaches fiber holders to our 25mm detectors. A high-speed photodiode designed to attach to 25 mm Astral or Vector calorimeter apertures provides a temporal profile of the laser pulse when viewed on an oscilloscope. A wide variety of detector mounting assemblies are available for mounting the detector to an optical bench. Posts are available in 1/2" and 3/4" diameter and from 2 to 6 inches in length that attach to a selection of mounting bases.
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Portable Digital Storage Oscilloscope
PDS5022
Xiamen Lilliput Technology Co., Ltd
PDS series portable digital storage oscilloscopes embody completely the perfect combination of capability, speed and analysis. With 40-100M bandwidth, 250M S/s realtime sample rate on each and dual channels storage, PDS series would be the ideal instrument for design, maintenance and detection. 250M realtime sample rate for each channelManual Cursor Measurement; 5 automatic measurements; High-speed screen update, Saving 4 Waveforms & setup parameters; plenty of Manual Cursor Measurement, Long memory max 6KBytes/CH,Convenient inserting interface card for RS-232C, Hardcopy and USB; 400V (DC+AV peak) maximum input power; Multilanguage offered for user's convenience Specification
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Portable Digital Storage Oscilloscope
PDS6042
Xiamen Lilliput Technology Co., Ltd
PDS series portable digital storage oscilloscopes embody completely the perfect combination of capability, speed and analysis. With 40-100M bandwidth, 250M S/s realtime sample rate on each and dual channels storage, PDS series would be the ideal instrument for design, maintenance and detection. 250M realtime sample rate for each channelManual Cursor Measurement; 5 automatic measurements; High-speed screen update, Saving 4 Waveforms & setup parameters;
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PXIe Controllers
VTI is the first choice for mission critical applications or applications where the cost of test is high and failure is not an option. Applications include missile system testing and solid rocket motor testing. This is because our products are recognized in the industry for their reliability and are designed with built-in capabilities to maximize measurement confidence. Simply put, if you need equipment that is going to give you the results you need, contact us to get started.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Profilometer
MicroCam™
MicroCam™ fiber-based optical non-contact 3D profilometers deliver: High-Speed Non-Contact Surface and Cross-Sectional Inspection 3D Online Measurements, GD&T and Imaging Long Stroke Profilometry with Sub-Micron Resolution Thickness, Roughness and Vibration Measurements Fiber-based Probes which reach into Bores, Tubes, and Crevices
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Roughness Measurement CMM Stylus
ZEISS ROTOS
ZEISS ROTOS offers optimum precision and maximum flexibility when performing roughness measurements thanks to its modular design and rotation in three axes: easy-to-change stylus arms further expand the range of possible applications.
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Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Spectroscopic Ellisopmeter for Simple Thin Film Measurement
Auto SE
The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation.Sample analysis takes only a few seconds and provides a complete report that fully describes the thin film stack – including film thicknesses, optical constants, surface roughness, and film inhomogeneities.
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Optical Profilers
Finally, measurements of surface roughness and topography can be made for a price that's less than that of a stylus profilometer. The Profilm3D has sub-nanometer vertical resolution, which surpasses optical profilometers that cost 3x as much. It does so by using the same state-of-the-art measurement technologies as the most sensitive optical profilers available: vertical-scanning interferometry (VSI) and phase-shifting interferometry (PSI).
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Areal Confocal 3D Measurement
µsurf
The measuring system of the µsurf-product line enable automated 3D surface measurements of roughness, topography, layer thickness and volume. µsurf-measuring systems are available in different designs: from compact mobile systems and laboratory solutions up to multisensor setups on granite portal for use near production lines.
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Contour And Surface Measuring Machines
The contour and surface measuring machines from ZEISS offer different, sometimes combinable sensors for roughness measurements, contour measurements or both. The contact-free linear drive makes these machines highly efficient and low-maintenance.
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Wafer Thickness Measurement System
MPT1000
Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
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Coordinate Measuring Machines
VideoCheck® HA
Fixed bridge CMM for highest precision and flexibilityIntegrated Werth Zoom® provides advanced capabilities for automatic measurement even for workpieces with minimal contrastIntegration of additional sensor units to a multisensor system guarantees higher flexibility and measuring speedModular structure guarantees customized solutions for individual applicationsOptional integration of a high precision air bearing rotary / rotary tilt axis
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Vibration Testers
Application for vibration tester: used for measuring periodic motion, to check the imbalance and deflecting of moving machinery.Is pecifically designed for present measuring various mechanical vibration. So as to provide the data for the quality control, run time and equipment upkeep.use the high-performance acceleration meter, realize the repetitiveness and accurate measurement. it has the function of testing axle bearing situation
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Vibration Measuring System
SmartVibro
There are many functions to express characteristics of vibration. However it is necessary for the conventional vibrometers that the same point is measured plural times switching objective functions one by one. SmartVibro which has a simultaneous measurement function can measure Acceleration, Velocity and Displacement simultaneously by just pressing the measurement start key one time. It can reduce the operating time and prevent miss-measurements. By switching the screen, VM-4424S・VM4424H can confirm Acceleration Envelope for bearing condition which enables small scars to be found easily.
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Low Capacity (in-lb) General Purpose Reaction Torque Sensor
TRT SERIES
The TRT Series reaction torque sensors offer long term reliability due to non moving parts and state of the art bonded foil strain gages. Whenever possible, the best approach for precision torque measurements is via reaction torque sensing, eliminating high maintenanceand high cost of slip rings, bearings and brushes.
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Coordinate Measuring Machines
StentCheck®
High performance multisensor CMM with Integrated Werth Zoom® optic with magnification 0.7x – 6.8xRotary/Tilt Axis with high speed air bearing rotary axisRotary OnTheFly for fast measurementsContour image processing for fully automatic measurements of complex geometrical elements with sub-micron repeatabilityIntegrated goniometer (tilting axis) allows for the measurement of non-cylindrical geometriesUnique lighting design optimized for measurement of stentsTemperature compensation included
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Drawing Die And Wire Measurement
DGMS – Die Geometry Measuring System
Optik Elektronik Gerätetechnik GmbH
Measuring system for diameter, roundness, reduction angle and bearing length of wire drawing dies.
